首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   414867篇
  免费   25370篇
  国内免费   13236篇
电工技术   19009篇
技术理论   56篇
综合类   21790篇
化学工业   67817篇
金属工艺   23195篇
机械仪表   24196篇
建筑科学   28211篇
矿业工程   11592篇
能源动力   10914篇
轻工业   22585篇
水利工程   6615篇
石油天然气   23575篇
武器工业   2652篇
无线电   45488篇
一般工业技术   55163篇
冶金工业   20997篇
原子能技术   3534篇
自动化技术   66084篇
  2024年   1325篇
  2023年   5285篇
  2022年   9122篇
  2021年   12846篇
  2020年   10053篇
  2019年   8176篇
  2018年   22213篇
  2017年   22508篇
  2016年   18451篇
  2015年   13066篇
  2014年   16376篇
  2013年   19717篇
  2012年   23447篇
  2011年   31513篇
  2010年   27142篇
  2009年   23668篇
  2008年   24556篇
  2007年   24941篇
  2006年   18666篇
  2005年   17500篇
  2004年   11588篇
  2003年   10379篇
  2002年   8802篇
  2001年   7665篇
  2000年   8317篇
  1999年   9842篇
  1998年   8306篇
  1997年   6871篇
  1996年   6482篇
  1995年   5402篇
  1994年   4421篇
  1993年   3125篇
  1992年   2527篇
  1991年   2006篇
  1990年   1519篇
  1989年   1243篇
  1988年   1039篇
  1987年   685篇
  1986年   542篇
  1985年   342篇
  1984年   245篇
  1983年   205篇
  1982年   197篇
  1981年   129篇
  1980年   134篇
  1979年   67篇
  1976年   55篇
  1965年   49篇
  1955年   63篇
  1954年   68篇
排序方式: 共有10000条查询结果,搜索用时 15 毫秒
101.
102.
103.
Two new methods are proposed to implement the exclusive-OR and exclusive-NOR functions on the transistor level. The first method uses non-complementary signal inputs and the least number of transistors. The other one improves the performance of the prior method but two more transistors are utilized. Both of them have been fully simulated by HSPICE on a SUN SPARC 2 workstation  相似文献   
104.
A two-dimensional numerical simulation including a new interface state generation model has been developed to study the performance variation of a LDD MOSFET after a dc voltage stress. The spatial distribution of hot carrier induced interface states is calculated with a breaking silicon-hydrogen bond model. Mobility degradation and reduction of conduction charge due to interface traps are considered. A 0.6 μm LDD MOSFET was fabricated. The drain current degradation and the substrate current variation after a stress were characterized to compare the simulation. A reduction of the substrate current at Vg ≃0.5 Vd in a stressed device was observed from both the measurement and the simulation. Our study reveals that the reduction is attributed to a distance between a maximum channel electric field and generated interface states  相似文献   
105.
Motivated by field data which showed a large number of link changeovers and incidences of link oscillations between in-service and out-of-service states in common channel signalling (CCS) networks, a number of analyses of the link error monitoring procedures in the SS7 protocol were performed by the authors. This paper summarizes the results obtained thus far and include the following: (a) results of an exact analysis of the performance of the error monitoring procedures under both random and bursty errors; (b) a demonstration that there exists a range of error rates within which the error monitoring procedures of SS7 may induce frequent changeovers and changebacks; (c) an analysis of the performance of the SS7 level-2 transmission protocol to determine the tolerable error rates within which the delay requirements can be met; (d) a demonstration that the tolerable error rate depends strongly on various link and traffic characteristics, thereby implying that a single set of error monitor parameters will not work well in all situations; and (e) some recommendations on a customizable/adaptable scheme of error monitoring with a discussion on their implementability. These issues may be particularly relevant in the presence of anticipated increases in SS7 traffic due to widespread deployment of advanced intelligent network (AIN) and personal communications service (PCS) as well as for developing procedures for high-speed SS7 links currently under consideration by standards bodies  相似文献   
106.
The current-voltage characteristics of the P-N double quantum well resonant interband tunneling (RIT) diodes in InAlAs-InGaAs system have been improved in this letter. The peak-to-valley current ratio (PVCR) is as high as 144 at room temperature. As we know, this is the highest room temperature PVCR ever reported in any tunneling devices. Moreover, the influence of the central barrier thickness varying from 10 Å to 30 Å on the device characteristics is also studied  相似文献   
107.
The performance of trellis coded-8PSK in the presence of cochannel interference is analyzed and compared with the performance of uncoded QPSK. The analytical expressions are derived and supported by simulating the bit error rate performance of different TC-8PSK systems. The analytical and simulation results show that TC-8PSK is slightly more robust to cochannel interference than uncoded QPSK  相似文献   
108.
In this paper, the CdxHg1-xTe (x=1-0.7) doped silica glass was prepared through two step sol-gel process and in-situ growth technique from tetraethoxysilane (TEOS), cadmium acetate, mercury acetate and telluric acid. The influence of various factors on the glass was studied. The structure of the microcrystals was investigated by XRD. The absorption and transmittance spectrum of the composite showed that the shift of absorption edge was in conformity with the quantum size effect. The third-order nonlinear optical susceptibility χ(3) was measured by the degenerate four wave mixing (DFWM). The values of χ(3) was in the range of 10-11-10-12 MO esu at wavelength of 1.06 μm.  相似文献   
109.
The minimum-norm least-squares (MNLS) inverse for magnetic field measurements is applied to a representation of a sulcus of the human brain, where one or both walls have regions of neuronal activity. Simulations indicate that the magnetic source image (MSI) is largely confined to the appropriate wall of the sulcus, even for a depth of 4 cm where the distance between walls is only 3 mm. Two nearly oppositely oriented dipoles located 3 mm apart are found to be distinguished. Influences on the quality of the MSI by measurement noise and inaccuracy in determining the image surface are discussed in detail  相似文献   
110.
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号