逆向工程技术在机械领域的应用

逆向工程技术已成为联系新产品开发过程中各种先进技术的纽带,并成为实现新产品快速开发的重要技术手段.介绍了逆向工程的概念、技术流程、测量系统、常用软件以及实际应用.     

Perfect Blind-Channel Shortening for Multicarrier Systems

In multicarrier systems, when the order of a channel impulse response is larger than the length of the cyclic prefix (CP), there is a significant performance degradation due to interblock interference (IBI). This paper proposes a blind-channel shortening method in which the equalizer parameter vector is formed by the noise subspace of the received signal correlation matrix so that the output power is maximized. The proposed method can not only shorten the effective channel impulse response to within the CP length but also maximize the output signal-to-interference-and-noise ratio while eliminating the IBI. We point out that the performance depends on the choice of a decision delay and propose a simple method for determining the appropriate delay. We propose both a batch algorithm and an adaptive algorithm and show by simulation that they are superior to the conventional algorithms.     

Studies on the microstructure of the black-glazed bowl sherds excavated from the Jian kiln site of ancient China

The Jian kiln, located in present-day Jianyang county of Fujian province, mainly produced black-glazed tea bowls. Jian tea bowl was used as a utensil for tea tasting and was greatly appreciated by emperor Huizong of the Northern Song dynasty. The black glaze of Jian bowl was sometimes marked with streaks or spots, usually called “hare's fur” or “oil spot”, which are the crystalline markings of iron oxide precipitated during firing in the dragon kiln. In this study, black-glazed Jian bowl sherds excavated from the late Northern Song strata of Luhuaping and Daluhoumen Jian kiln sites were adopted as test samples. Based on the physico-chemical foundation for the formation of glaze microstructure, the correlation among composition, microstructure, and visual appearance has been investigated by means of energy-dispersive X-ray fluorescence, X-ray diffraction, and field emission electron microscopy. For the first time, the study provides realizing proofs for two kinds of microstructural forming mechanics.     

An order-specific clustering algorithm for the determination of representative demand curves

Data clustering consists of a group of procedures used to collect similar entries or data points within a set into clusters. No existing clustering technique considers entries sequentially in time. In some cases, it is desirable to generate clusters that represent a segment of a time-ordered data set. For these purposes, an order-specific clustering algorithm is proposed. The proposed algorithm employs representative load curves to describe the clusters it generates. The capabilities of the order-specific clustering algorithm are demonstrated on a case study using electricity demand data for the province of Ontario, Canada. Two different applications of the clustering algorithm on this data set are given to demonstrate the effect of error threshold values on the formation of clusters. An analysis of the error for each of these clustering applications is presented.     

Sp3/sp2 character of the carbon and hydrogen configuration in micro- and nanocrystalline diamond

Hot filament and microwave plasma CVD micro- nanocrystalline diamond films are analysed by visible and ultra-violet excitation source Raman spectroscopy. The sample grain size varies from 20 nm to 2 μm. The hydrogen concentration in samples is measured by SIMS and compared to the grain size, and to the ratio of sp² carbon bonds determined by Raman spectroscopy from the 1332 cm^− 1 diamond peak and the sp² 1550 cm^− 1 G band. Hydrogen concentration appears to be proportional to the sp² bonds ratio. The 3000 cm^− 1 CH_x stretching mode band intensity observed on the Raman spectra is decreasing with the G band intensity. Thermal annealing modifies the sp² phase structure and concentration, as hydrogen outdiffuses.     

Integrated carbon nanotube field emission differential amplifier: Modeling and measurement of the common-mode rejection ratio

A novel integrated vacuum field emission (VFE) differential amplifier (diff-amp) utilizing carbon nanotube (CNT) emitters has been developed. A dual-mask microfabrication process was employed to achieve a VFE diff-amp by integrating identical CNT VFE transistors with built-in split gates and integrated anodes. The identical pair of triode amplifiers was well-matched in their device characteristics. The measured ac small-signal characteristics of the diff-amp showed a common-mode-rejection ratio (CMRR) of ~ 320 (~ 50 dB). The proposed analytical model of the CMRR was verified to be in good agreement with the experimental data. The successful implementation of the CNT diff-amp demonstrates a new way to achieve temperature and radiation tolerant VFE integrated microelectronics.     

Local residence time,residence revolution,and residence volume distributions in twin‐screw extruders

This work was aimed at studying the overall, partial, and local residence time distributions (RTD); overall, partial and local residence revolution distributions (RRD) and overall, partial and local residence volume distributions (RVD) in a co‐rotating twin screw extruder, on the one hand; and establishing the relationships among them, on the other hand. Emphasis was placed on the effects of the type and geometry of mixing elements (a gear block and various types of kneading elements differing in staggering angle) and process parameters on the RTD, RRD and RVD. The overall and partial RTD were directly measured in‐line during the extrusion process and the local ones were calculated by deconvolution based on a statistical theory. The local RTD allowed comparing the mixing performance of mixing elements. Also it was confirmed both experimentally and theoretically that specific throughput, defined as a ratio of throughput (Q) over screw speed (N), controlled all the above three types of residence distributions, be they local, partial or overall. The RRD and RVD do not provide more information on an extrusion process than the corresponding RTD. Rather they are different ways of representing the same phenomena. POLYM. ENG. SCI., 48:19–28, 2008. © 2007 Society of Plastics Engineers