Structure observations by high-resolution electron microscopy of Ni-B melt-spun alloys (B<30 at%)

The microstructure of a series of Ni-B alloys (15 at%3B phase (a=0.44 nm,b=0.52 nm,c=0.66 nm) is expected. High-resolution electron microscopy images of Ni-25 at% B rapidly quenched indicate that a two-phase structure is observed. A metastable phase is observed with a periodicity of 1.0 nm. HREM images and EELS analyses led us to propose the structure of this metastable phase. This phase (Ni₅B₂) is correlated with the monoclinic Hägg carbide Fe₅C₂. Depending on the velocity of the substrate and on the boron concentration, a variety of microstructures has been observed from a faulted to a semi-amorphous structure. The structures are related to the solidification behaviour and the heat flow in the undercooled melt. Particular attention was paid to the eutectic Ni-Ni₃B composition.     

Interfacial strength and chemistry of additive-free silicon nitride ceramics brazed with aluminium

Two kinds of additive-free silicon nitride ceramics were brazed with aluminium; one was with as-ground faying surfaces and the other was with faying surfaces heat-treated at 1073K for 1.8 ksec in air. The heat-treatment of the silicon nitride ceramics formed a silicon oxynitride layer on the faying surfaces and increased the brazing strength of the joints. A silica-alumina non-crystalline layer and a β′-sialon layer were formed successively from the aluminium side at the interface of the joints. The heat-treatment which made the former layer thicker is a necessary process in making reliable, strong brazed joints.     

Transparent monolithic zirconia gels: effects of acetylacetone content on gelation

Transparent yttria-stabilized zirconia monolithic gels were synthesized under controlled conditions for hydrolysis and chemical polymerization. The influence of acetylacetone on the previous chemical reactions was explored, and a plausible explanation was proposed concerning the outstanding role of this additive during the gelation process. Small-angle X-ray scattering was used to estimate the size of the polymeric species and to investigate the influence of acetylacetone on the structure of the gels prepared.     

Grain boundary resistivity in Y-TZP materials as a function of thermal history

Grain-boundary resistivity in yttria-containing tetragonal zirconia polycrystalline (Y-TZP) materials dominates the total resistivity. Impedance measurements combined with microstructural studies suggest that post-sintering heat treatments (in particular the cooling rate) influence the location of the grain-boundary phase which, in turn, has a significant effect on the grain-boundary resistivity. Higher cooling rates from the sintering temperature lead to reduction in the grain-boundary resistivity. In both alumina-containing and relatively pure tetragonal zirconia polycrystals, post-sintering heat treatments have a less conspicuous effect. The activation energy associated with the grain-boundary resistivity was independent of the post-sintering heat treatments but was 25 to 30 kJ mol^–1 higher than that for the oxygen-ion conduction within the grains at low temperatures.     

Calibrating high-vacuum gauges

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 19–20, June, 1989.     

Influence of initial growth layer and Ti underlayer on magneticproperties and recording characteristics of very thin films ofevaporated Co-Cr media

A Co-Cr film deposited directly on a substrate has an initial growth layer with low coercivity. However, the existence of a Ti underlayer prevents the formation of such a layer. As a result, Co-Cr film deposited on a Ti underlayer has high perpendicular anisotropy and coercivity even in cases of extremely thin film thickness (200 Å). As for the read-write characteristics of Co-Cr thin-film media, the existence of such an initial growth layer greatly improves the reproduced output level. The cause for this is considered to be that the free charges which appear on the back surface of the perpendicular recording layer are reduced and the demagnetization field acting on the recorded magnetization subsequently decreases due to the existence of the initial growth layer