Semantics of roundoff error propagation in finite precision calculations

We introduce a concrete semantics for floating-point operations which describes the propagation of roundoff errors throughout a calculation. This semantics is used to assert the correctness of a static analysis which can be straightforwardly derived from it. In our model, every elementary operation introduces a new first order error term, which is later propagated and combined with other error terms, yielding higher order error terms. The semantics is parameterized by the maximal order of error to be examined and verifies whether higher order errors actually are negligible. We consider also coarser semantics computing the contribution, to the final error, of the errors due to some intermediate computations. As a result, we obtain a family of semantics and we show that the less precise ones are abstractions of the more precise ones.     

Multi-scale roughness transfer in cold metal rolling

We report on a comparative Atomic Force Microscope (AFM) multi-scale roughness analysis of cold rolled Al alloy and steel roll, in order to characterize the roughness transfer from the steel roll to the workpiece in cold strip rolling processes. More than three orders of length-scale magnitudes were investigated from 100 microns to 50 nanometers on both types of surfaces. The analysis reveals that both types of surfaces are anisotropic self-affine surfaces. Transverse and longitudinal height profiles exhibit a different roughness exponent (Hurst exponent) ζ=0.93±0.03 and ζ=0.5±0.05 Different length-scale cut-offs are obtained in each direction l^sup=50μm, l^sup>100μm. Height and slope distributions are also computed to complement this study. The above mentionned self-affine characteresitics are found to be very similar for the roll and the strip surfaces, which suggest that roughness transfer takes place from the macroscopic (100 μm) to the very small scale (50 nm).     

Registration and real-time visualization of transcranial magnetic stimulation with 3-D MR images

This paper describes a method for registering and visualizing in real-time the results of transcranial magnetic stimulations (TMS) in physical space on the corresponding anatomical locations in MR images of the brain. The method proceeds in three main steps. First, the patient scalp is digitized in physical space with a magnetic-field digitizer, following a specific digitization pattern. Second, a registration process minimizes the mean square distance between those points and a segmented scalp surface extracted from the magnetic resonance image. Following this registration, the physician can follow the change in coil position in real-time through the visualization interface and adjust the coil position to the desired anatomical location. Third, amplitude of motor evoked potentials can be projected onto the segmented brain in order to create functional brain maps. The registration has subpixel accuracy in a study with simulated data, while we obtain a point to surface root-mean-square error of 1.17+/-0.38 mm in a 24 subject study.     

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC

This paper presents a new method of passivation control by electroluminescence (EL) in 0.15 μm AlGaN/GaN HEMT. The electroluminescence signature in one finger HEMTs (W = 1 × 100 μm), and eight fingers ones (W = 8 × 125 μm), is modified by defects located at the passivation/semiconductor interface and is characterized by a light emission along the drain contact. This abnormal emission reveals some modification of the electric field distribution in the gate-drain space probably induced by traps located at the passivation/semiconductor interface. These traps contribute to the creation of a virtual gate in the gate-drain space.     

CMOS inverters based positive type second generation current conveyor

A new versatile class AB low-voltage second generation current conveyor based on CMOS inverters operating in transconductance mode is presented in this letter. Against traditional design based on CCII+, the circuit is able to operate at low supply voltages and offers numerous advantages like class AB operation, large voltage and current swing, synthesis from digital inverters. Simulation results from a typical 0.35 μm CMOS process had demonstrated the circuit capability to operate at high frequency over wide voltage and wide current swings. The proposed circuit operation has been acted from measurements with the HEF4069UBP from Philips semiconductors [1].     

Multi-level analysis of an interaction network between individuals in a mailing-list

It is well known now that most real-world complex networks have some properties which make them very different from random networks. In the case of interactions between authors of messages in a mailing-list, however, a multi-level structure may be responsible for some of these properties. We propose here a rigorous but simple formalism to investigate this question, and we apply it to an archive of the Debian user mailing-list. This leads to the identification of some properties which may indeed be explained this way, and of some properties which need deeper analysis.     

Optimising end-of-life system dismantling strategy

The management of end-of-life systems is becoming a major concern for systems manufacturers, as the negative impact of these systems on the environment is a matter of increasing public awareness, and their appropriate treatment offers economic opportunities. In this context, the disassembly of these systems in order to recycle their components is a possible and sound option that can make it possible to sustain economical progress while respecting environment requirements. The work undertaken in this paper considers modelling and optimising issues of such disassembly activities. An integrated approach is proposed to model and optimise the selection of valuable components of end-of-life systems, their recycling options and the way to obtain them. Because the framework of such problems is highly uncertain, we propose the use of Bayesian networks and their extension in terms of influence diagrams as mathematical tools for structuring and managing uncertainties. With this approach, one can take into account uncertainties rising from different sources on one hand and as a support for optimisation on the other hand.     

Depth and depth–color coding using shape-adaptive wavelets

We present a novel depth and depth–color codec aimed at free-viewpoint 3D-TV. The proposed codec uses a shape-adaptive wavelet transform and an explicit encoding of the locations of major depth edges. Unlike the standard wavelet transform, the shape-adaptive transform generates small wavelet coefficients along depth edges, which greatly reduces the bits required to represent the data. The wavelet transform is implemented by shape-adaptive lifting, which enables fast computations and perfect reconstruction. We derive a simple extension of typical boundary extrapolation methods for lifting schemes to obtain as many vanishing moments near boundaries as away from them. We also develop a novel rate-constrained edge detection algorithm, which integrates the idea of significance bitplanes into the Canny edge detector. Together with a simple chain code, it provides an efficient way to extract and encode edges. Experimental results on synthetic and real data confirm the effectiveness of the proposed codec, with PSNR gains of more than 5 dB for depth images and significantly better visual quality for synthesized novel view images.     

Contribution to the environmental performance of the dry-vibratory drilling technology

The self-vibratory drilling (SVD) is an innovative technology that allows increasing the productivity, without coolant. The aim of this paper is to prove that the environmental impacts of SVD are significantly less than those of traditional drilling (TD) and to quantify them. The study is based on a life cycle analysis of both processes. The major contributor to the environmental impacts in TD is the coolant. The new major contributors in SVD are the twist drills. A model that links the lifespan of the twist drills and the environmental impacts of SVD has been developed to support decisions for R&D.     

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

We report on the reliability of InP HBT technology which has applications in very high-speed ICs. This work presents the storage accelerated aging tests results performed on InP/InGaAs HBT at stress temperatures of 180, 210 and 240 °C up to 3000 h. We have performed aging tests for two generations of InP HBT which differ from the collector doping level and from material used for planarization. From the Gummel plots, we note that the major degradation mechanism is located at the base–emitter junction periphery. Investigations on the physical origin of the observed failure mechanism has been performed using TCAD simulations.