镍氢电池负极用低成本储氢合金的研究

研究了ABS型储氢合金在低Co含量条件下，随B组元替代元素Co，Al，Si等含量的变化对合金电化学性能的影响规律，同时研究了A组元中不同La／Ce比对合金电化学性能的影响情况。结果表明，随合金中Co含量的降低，合金的活化性能和放电容量得以改善，但合金的循环寿命下降也比较明显；在试验范围内，随Al元素的加入，合金的循环寿命得以改善，但材料的放电容量和活化性能均有所下降；随合金La／Ce比的降低，合金的放电容量略有下降，但其循环寿命和放电电压平台有较大提高。     

分置式牛津型斯特林制冷机的数值分析与实验验证

对分置式牛津型斯特林制冷机进行了数值计算 ,介绍了计算模型考虑到的众多不可逆因素。通过对计算结果与实验结果的对比 ,验证了本文数值计算的准确性 ,说明本文计算模型与数值处理方法是切实可行的     

基于DSP的电力数据采集平台的设计与研究

介绍了一种用于电力系统的数据采集系统.该系统采用数字信号处理器(DSP)和复杂可编程逻辑器件(CPLD)作为核心芯片,给出了主要部分的电路及其原理、功能,系统中使用CPLD实现基本逻辑,使系统有足够的冗余和灵活性,具有可靠性高、可升级等优点.     

Toughening mechanism for a rubber-toughened epoxy resin with rubber/matrix interfacial modification

For a rubber-toughened piperidine-DGEBA epoxy resin, the interface between the rubber particle and the epoxy resin matrix was modified by an epoxide end-capped carboxyl terminated butadiene and acrylonitrile random copolymer (CTBN). The end-capping epoxides used were a rigid diglycidyl ether of bisphenol-A (Epon 828), a short-chain flexible diglycidyl ether of propylene glycol (DER 736), and a long-chain flexible diglycidyl ether of propylene glycol (DER 732). The microstructures and the fracture behaviour of these rubber-modified epoxy resins were studied by transmission electron microscopy and scanning electron microscopy. Their thermal and mechanical properties were also investigated. In the rubber-modified epoxy resins, if the added CTBNs were end-capped by a flexible diglycidyl ether of propylene glycol (DER 732 or DER 736) before curing, the interfacial zone of the undeformed rubber particle, the degree of cavitation of the cavitated rubber particle on the fracture surface and the fracture energy of the toughened epoxy resin were all significantly increased. The toughening mechanism based on cavitation and localized shear yielding was considered and a mechanism for the interaction between cavitation and localized shear yielding that accounts for all the observed characteristics is proposed.     

化学还原法制备纳米铜粉的研究

本文采用KBH4在液相中化学还原CuSO4,并加入KOH和络合剂EDTA ,制得了纳米级的纯净的铜粉 ,通过调整反应物的浓度 ,可以消除Cu2 O等杂质。制备的纳米铜粉还存在一定程度的团聚 ,需试验加入分散剂来改善。     

Ozonation of CI Reactive Black 5 using rotating packed bed and stirred tank reactor

This study investigates the ozonation of CI Reactive Black 5 (RB5) by using the rotating packed bed (RPB) and completely stirred tank reactor (CSTR) as ozone contactors. The RPB, which provides high gravitational force by adjusting the rotational speed, was employed as a novel ozone contactor. The same ozone dosage was separately introduced into either the RPB or the CSTR for the investigation, while the experimental solution was continuously circulated within the apparatus consisting of the RPB and CSTR. The decolorization and mineralization efficiencies of RB5 in the course of ozonation are compared for these two methods. Moreover, the dissolved and off‐gas ozone concentrations were simultaneously monitored for the further analysis. As a result, the ozone mass transfer rate per unit volume of the RPB was significantly higher because of its higher mass transfer coefficient and gas–liquid concentration driving force. Furthermore, ozonation kinetics was found to be independent of the gravitational magnitude of an ozone gas–liquid contactor. Therefore, the results suggest employing RPBs as ozone‐contacting devices with the advantage of volume reduction. The experimental results, which can be used for further modeling of the ozonation process in the RPB, also show the requirement of correct design for the RPB. Consequently, the present study is useful for the understanding of practical application of RPBs. Copyright © 2004 Society of Chemical Industry     

用保形样条方法求解非定常对流扩散方程

在欧拉-拉格朗日分裂方法的基础上,本文发展了一种固定网格上的欧拉-拉格朗日分裂方法.保形样条方法(SPSM)被用来解决倒特征线插值问题.通过求解几个有精确解的例子,说明SPSM方法的解是单调无振荡的,并且数值耗散也是比较小的.     

反应离化团束（RICB）法生长CN硬质薄膜

用反应离化团束（ＲＩＣＢ）法，以低分子量聚乙烯为蒸发材料，氨气为反应气体，在ＮａＣｌ（１００）和Ｓｉ（１００）衬底上淀积Ｃ－Ｎ薄膜，透射电子衍射（ＴＥＭ）分析表明薄膜中含有β－Ｃ３Ｎ４晶粒，Ｘ射线光电子谱（ＸＰＳ）和红外吸收谱（ＩＲ）表明存在Ｃ，Ｎ原子的化学键合。     

以CGA卡为基础的智能显示系统

本文介绍了以微处理器与ＩＢＭ－ＰＣ上的彩色／图形适配器相结合构成的一种智能显示系统。本系统主要解决数控系统中主ＣＰＵ与６８４５ＣＲＴＣ争夺显示缓存的矛盾。保证了６８４５ＣＲＴＣ对显示缓存操作的时间要求；并且保证了数控系统中主ＣＰＵ对显示缓存操作的随意性。     

薄Si膜对基底表面粗糙度的影响

利用ＺＹＧＯ光学干涉测量仪，散射积分测量法观测了光学元件表面均方根粗糙度．详细分析了薄Ｓｉ膜对基底均方根粗糙度的影响，由此认为薄膜并不总是复制基底表面的粗糙度，结果出现了薄膜降低表面粗糙度的现象．提出了一定厚度范围的薄Ｓｉ膜的表面粗糙度存在着一个稳定值的新设想．