Genetic algorithm to solve optimum TDMA transmission schedule in broadcast packet radio networks

The problem of finding an optimum conflict-free transmission schedule for a broadcast packet radio network (PRNET) is NP-complete. In addition to a host of heuristic algorithms, recently, neural network and simulated annealing approaches to solve this problem were reported. We show that the standard genetic algorithm, though able to solve small problems, performed poorly for large networks. This is because classical crossover and mutation operations create invalid members, which flood the whole population, hindering the progress of the search for valid solutions. In this paper, special crossover and mutation operations are defined, such that the members of the population always remain valid solutions of the problem. Excellent results were obtained in a few generations, even for very large networks with 400 nodes. The results were compared with recently reported neural network and mean field annealing approaches.     

Improving path delay testability of sequential circuits

We analyze the causes of low path delay fault coverage in synchronous sequential circuits and propose a method to improve testability. The three main reasons for low path delay fault coverage are found to be: (A) combinationally false (nonactivatable) paths; (B) sequentially nonactivatable paths; and (C) unobservable fault effects. Accordingly, we classify undetected faults in Groups A, B, and C. Combinationally false paths ran be made testable by modifying the circuit or resynthesizing the combinational logic as discussed by other researchers. A majority of the untestable faults are, however found in Group B, where a signal transition cannot be functionally propagated through a combinational path. A test requires two successive states necessary to create a signal transition and propagate it through the target path embedded in the sequential circuit. We study a partial scan technique in which flip-flops are scanned to break cycles and shun that a substantial increase in the coverage of path delay faults is possible     

Reliability bounds and other inequalities for discrete life distributions

In this paper we give sharp bounds on the reliability of discrete IFR, IFRA, NBU, DFR, DFRA and NWU classes, based on one known moment. Subsequently the discrete analogues of several continuous-time results related to maintained systems are also presented.     

Studies on dielectric relaxation and defect generation for reliability assessments in ultrathin high-k gate dielectrics on Ge

In this work, we present the results of dielectric relaxation and defect generation kinetics towards reliability assessments for Zr-based high-k gate dielectrics on p-Ge (1 0 0). Zirconium tetratert butoxide (ZTB) was used as an organometallic source for the deposition of ultra thin (∼14 nm) ZrO₂ films on p-Ge (1 0 0) substrates. It is observed that the presence of an ultra thin lossy GeO_x interfacial layer between the deposited high-k film and the substrate, results in frequency dependent capacitance-voltage (C-V) characteristics and a high interface state density (∼10¹² cm⁻² eV⁻¹). Use of nitrogen engineering to convert the lossy GeO_x interfacial layer to its oxynitride is found to improve the electrical properties. Magnetic resonance studies have been performed to study the chemical nature of electrically active defects responsible for trapping and reliability concerns in high-k/Ge systems. The effect of transient response and dielectric relaxation in nitridation processes has been investigated under high voltage pulse stressing. The stress-induced trap charge density and its spatial distribution are reported. Charge trapping/detrapping of stacked layers under dynamic current stresses was studied under different fluences (−10 mA cm⁻² to −50 mA cm⁻²). Charge trapping characteristics of MIS structures (Al/ZrO₂/GeO_x/Ge and Al/ZrO₂/GeO_xN_y/Ge) have been investigated by applying pulsed unipolar (peak value - 10 V) stress having 50% duty-cycle square voltage wave (1 Hz-10 kHz) to the gate electrode.     

Selective greedy routing: exploring the path diversity in backbone mesh networks

This paper proposes a new routing protocol for IEEE 802.11s wireless mesh network to overcome the problems associated with the conventional proactive and reactive routing approaches. The proposed ‘Selective Greedy’ (SelG) routing protocol operates in two phases. In the first phase it exploits the proactive mode of Hybrid Wireless Mesh Protocol, the standard routing protocol for IEEE 802.11s mesh, and constructs a set of potential forwarders for every mesh point, that can act as the next-hop relay. In the second phase, during the actual data communication, a candidate is selected from the set of potential forwarders based on a local optimization. The optimization procedure considers the statistical effect of local link quality fluctuation and interference over the global routing path selection. This way the SelG protocol reduces the control packet flooding in the network (a major drawback for reactive protocols). At the same time, the optimization procedure captures the network dynamics, and thus avoids the possibility of routing based on stale information (a drawback for proactive protocols). The routing properties and the correctness of the SelG protocol is established theoretically, and the performance of the protocol is analyzed through simulation results. The proposed protocol is implemented in an indoor wireless mesh testbed, and the performance is evaluated and compared with other traditional approaches.     

Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB?

A manufacturing defect is a finite chip area with electrically malfunctioning circuitry caused by fabrication errors. The fraction of defective chips that escapes to the customer is called the defect level, also known as defective parts per million (DPPM, or simply PPM) when normalized to one million units. This paper demonstrates a technique used to correlate coverage goals to DPPM based on test fallout data using a MATLAB^?-based error function minimization approach. This analysis is explained using regression models for DPPM yield versus fault/defect coverage. This approach is beneficial to semiconductor companies for calibrating their fault coverage goals to meet DPPM requirements from automotive or other customers that have very aggressive (i.e., ultra-low) DPPM demands.     

Scanning of sector and cosecant beams generated by a circular aperture

A method of scanning a one-dimensional shaped pattern generated by a circular aperture is presented. It is shown that the desired beam shape can be retained in the desired scan plane by superposing on the nonlinear phase distribution applied along and parallel to the meridian plane, a linear phase progression along the perpendicular direction. Analysis carried out using the stationary phase method of evaluating the integral reveals that the gradient of the linear phase progression is a function of position along the meridian plane of the aperture. Expressions for the phase functions are derived. Computed results on the phase distribution and the radiation pattern are presented.     

Low complexity hybrid layered tabu-likelihood ascent search for large MIMO detection with perfect and estimated channel state information

In this work, we proposed a low-complexity hybrid layered tabu-likelihood ascent search (LTLAS) algorithm for large multiple-input multiple-output (MIMO) system. The conventional layered tabu search (LTS) approach involves many partial reactive tabu searches (RTSs), and each RTS requires an initialization and searching phase. In the proposed algorithm, we restricted the upper limit of the number of RTS operations. Once RTS operations exceed the limit, RTS will be replaced by low-complexity likelihood ascent search (LAS) operations. The block-based detection approach is considered to maintain a higher signal-to-noise ratio (SNR) detection performance. An efficient precomputation technique is derived, which can suppress redundant computations. The simulation results show that the bit error rate (BER) performance of the proposed detection method is close to the conventional LTS method. The complexity analysis shows that the proposed method has significantly lower computational complexity than conventional methods. Also, the proposed method can reduce almost 50% of real operations to achieve a BER of 10⁻³.