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11.
Controlling material properties at the nanoscale is a critical enabler of high performance electronic and photonic devices. A prototypical material example is VO2, where a structural phase transition in correlation with dramatic changes in resistivity, optical response, and thermal properties demonstrates particular technological importance. While the phase transition in VO2 can be controlled at macroscopic scales, reliable and reversible nanoscale control of the material phases has remained elusive. Here, reconfigurable nanoscale manipulations of VO2 from the pristine monoclinic semiconducting phase to either a stable monoclinic metallic phase, a metastable rutile metallic phase, or a layered insulating phase using an atomic force microscope is demonstrated at room temperature. The capability to directly write and erase arbitrary 2D patterns of different material phases with distinct optical and electrical properties builds a solid foundation for future reprogrammable multifunctional device engineering.  相似文献   
12.
Electron backscatter diffraction (EBSD) and electron channeling contrast imaging (ECCI) were employed to investigate epitaxial SiC growth on 4H-SiC mesa structures. SiC polytypes were identified by indexing Kikuchi maps recorded from various points on the mesa surfaces. Orientation contrast was observed between different polytype surfaces using ECCI by forescattered electron detection. Extended defects in 3C-SiC were imaged directly by ECCI. Additionally, the ECCI technique was utilized to correlate dislocations with atomic step morphologies for various mesa surfaces. Evidence of vertical growth enhancement in the form of additional faceting was attributed to the presence of threading screw dislocations at mesa surfaces. Atomic steps were observed very near the edges of some mesa surfaces free of dislocations.  相似文献   
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