Properties of titanium-containing sol-gel films modified with copper and vanadium oxides

Translated from Steklo i Keramika, No. 1, pp. 4–6, January, 1994.     

The effect of Gaussian error in object recognition

In model based recognition, the goal is to locate an instance of one or more known objects in an image. The problem is compounded in real images by the presence of clutter, occlusion, and sensor error, which can lead to “false negatives”, failures to recognize the presence of the object, and “false positives”, in which the algorithm incorrectly identifies an occurrence of the object. The probability of either event is affected by parameters within the recognition algorithm, which are almost always chosen in an ad-hoc fashion. The effect of the parameter values on the likelihood that the recognition algorithm will make a mistake are usually not understood explicitly. To address the problem, we explicitly model the noise that occurs in the image. In a typical recognition algorithm, hypotheses about the position of the object are tested against the evidence in the image, and an overall score is assigned to each hypothesis. We use a statistical model to determine what score a correct or incorrect hypothesis is likely to have, and use standard binary hypothesis testing techniques to distinguish correct from incorrect hypotheses. Using this approach, we can compare algorithms and noise models, and automatically choose values for internal system thresholds to minimize the probability of making a mistake     

Electrical measurement of the junction temperature of an RF powertransistor

An enhanced electrical method is presented for measuring the average junction temperature of an RF bipolar transistor. A two-step procedure, previously developed for DC operation, is extended to include the junction temperature measurement for an RF power transistor in a tuned amplifier circuit. The measurement technique is convenient, since it can be used with normal, packaged devices, and does not require a complex heat flow model or ambient temperature measurements     

IEA joint trials: New lessons from old plantations

Two international trials of potential biomass species families and clones planted in 1985 have been analyzed to determine changing patterns in growth, diseases, and insects. In the Swedish trial, with close spacing and short rotations, Salix viminalis clones gave the best average yield of 17.4 Mg/Ha/yr on the first coppice rotation. In the Minnesota, USA trial, with wider spacings and a longer rotation Populus alba hybrid clones gave the best average yields of 5.5 Mg/Ha/yr. The most important disease and insect problems encountered were Septoria musiva stem cankers on some Populus clones; frost die back in some Salix clones; and the leaf blotch miner, Fenusa dohrnii, on most Alnus families. Recommendations for future international cooperation in field trials are presented.     

A storage heat pump using an ‘ozone-friendly’ refrigerant

The paper describes the integration of a chemical and a vapour-compression heat pump for energy storage applications. The vapour-compression system is designed to operate using the UK cheap rate ‘Economy 7’ electricity tariff. The system is characterized thermodynamically using various refrigerant/absorbent pairs in the chemical storage circuit and an ozone-friendly refrigerant, R134a, in the vapour-compression circuit. Results indicate that the H₂O/Na₂S pair provides a high energy storage density and is the most suitable for use in this system. The paper also describes the design features of a domestic-sized version of this heat pump system. Air in the sunspace (conservatory) of a house was used as a heat source for the heat pump.     

A method to estimate local deposition conditions using film profiles in features

A method to estimate the local partial pressures and temperature during low pressure chemical vapor deposition (LPCVD) proceses using film profile data is demonstrated using the chemistry of blanket tungsten deposition by the hydrogen reduction of tungsten hexafluoride. EVREST, the computer program which performs the estimates, uses EVOLVE, a physically based process simulator for ballistic transport and heterogeneous reactions in features on patterned wafers, to compute film profiles for a given set of deposition conditions. In order to validate the estimation method and to demonstrate EVREST, test calculations are performed using film profiles generated by EVOLVE instead of experimental scanning electron microscopy cross-sections. Calculated films profiles are compared with the generated film profiles (the data) and the simulated deposition conditions are adjusted using an algorithm based on Marquardt's method to minimize the sum of squared differences between points on the calculated and generated profiles. Test calculations confirm that film profiles in more than one feature can be used to improve the reliability of the partial pressure and temperature estimates.