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991.
Ju Han Lee You Min Chang Young-Geun Han Sang-Hyuck Kim Haeyang Chung Sang Bae Lee 《Photonics Technology Letters, IEEE》2005,17(1):34-36
We experimentally demonstrate a simple and novel scheme for tunable real-repetition-rate multiplication, based on the combined use of fractional Talbot effect in a linearly tunable chirped fiber Bragg grating (FBG) and cross-phase modulation (XPM) effect in a nonlinear optical loop mirror (NOLM). By tuning the group-velocity dispersion of the chirped FBG fabricated with the S-bending method using a uniform FBG, we obtain high quality pulses at pseudorepetition rates of 20/spl sim/50 GHz from an original 8.5-ps 10-GHz soliton pulse train. We subsequently convert this pseudorate multiplication into a real-rate multiplication using XPM effect in an NOLM. A wavelength tuning is also achieved over a /spl sim/15-nm range. 相似文献
992.
993.
提出了一种新的全耗尽SOI MOSFETs阈值电压二维解析模型.通过求解二维泊松方程得到器件有源层的二维电势分布函数,氧化层-硅界面处的电势最小值用于监测SOI MOSFETs的阈值电压.通过对不同栅长、栅氧厚度、硅膜厚度和沟道掺杂浓度的SOI MOSFETs的MEDICI模拟结果的比较,验证了该模型,并取得了很好的一致性. 相似文献
994.
995.
H. Tsukamoto T.D. Boone J. Han J.M. Woodall 《Photonics Technology Letters, IEEE》2005,17(7):1411-1413
We present a novel optical switching technique utilizing emission packet positioning of semiconductor heterostructure. A modulation-doped p-AlGaAs-GaAs heterostructure is employed to control spontaneous emission packet positioning with electric fields. Emission packets generated by optical input signals are brought over 150 /spl mu/m with electric fields, so the output fibers can detect the emission intensity as signals. The first-order analysis indicates that the drift velocity of minority electrons in GaAs limits the detectable maximum data rate and nanoseconds timescale signal routing operation at 20 Gb/s is possible at an electron drift velocity of 2/spl times/10/sup 7/ cm/s. 相似文献
996.
Seungwan Ryu Sei Kwon Park Donsung Oh Gyungchul Sihn Kichul Han Seungku Hwang 《Communications Magazine, IEEE》2005,43(9):122-131
In this article we present a perspective on next-generation mobile communications and services. As a preliminary research work on next-generation mobile communications, we exploit what next-generation mobile services will be (S. Ryu et al., May 2003). We define next-generation mobile services as a hierarchy of services consisting of three different service levels: the service areas, the service functionalities, and the service technologies. We derive these service levels by means of scenario-based analysis. Next we propose conceptual reference network architecture, focusing on the realization of the service technologies. We divide the network into four different parts: a user equipments and access part, a network service provisioning layer part, a network control layer part, and non-mobile network operator service pan, according to characteristics of information and service flows within a network. In this reference network architecture, service elements such as servers, processors, and gateways are placed in each network part to support the derived next-generation mobile services. Finally, we give a brief introduction of research and development activities for next-generation mobile communication systems and services in Korea. 相似文献
997.
Proposed is multimode basis selection in which the active bases are selected at the receiver from the common unitary basis set known at both receiving and transmitting ends, conveyed to the transmitter using limited feedback, and assembled into a precoding matrix at the transmitter. It is shown that the proposed multimode basis selection scheme outperforms both multimode antenna selection and Grassmannian multimode precoding in capacity in correlated fading channels without additional complexity and feedback. 相似文献
998.
J.-P. Han S.M. Koo E.M. Vogel E.P. Gusev C. DEmic C.A. Richter J.S. Suehle 《Microelectronics Reliability》2005,45(5-6):783
Anomalous threshold voltage roll-up behavior, commonly referred as reverse short channel effect (RSCE), has been observed in high-k (HfO2 on SiON buffer, Al2O3 on SiON buffer) gated submicron nMOSFETs, while the SiO2 or SiON control samples show normal short channel effect (SCE) behavior. The possible causes such as inhomogeneous channel doping profile and gate oxide thickness variation near S/D ends have been ruled out. The results indicate that interface trap density that dependents on channel length is the main cause of the RSCE observed here. In addition, oxide charge also plays a role. 相似文献
999.
1000.