Glass Passivation Parts (GPP) wafer texture defects are one of the most important factors affecting the accuracy of wafer defect detection. Template matching has local errors and low efficiency, and deep learning requires many training samples. In the early stage, defect training sample sets cannot be provided. This paper discusses the design of an effective GPP wafer grain region texture defect detection algorithm using a sub-region one-to-one mapping. A set of standard wafer datum is selected as the reference of grain region segmentation detection, and then the standard wafer images and test GPP wafer images are automatically calibrated and segmented, respectively. Then, a series of pre-processes were performed to equalize the sizes of the two grain-region images. Then the grain region was divided into an equal number of rectangular sub-regions of the same size according to the measurement precision requirement. The correlation degree of each test sub-region is judged by the designed three-channel RGB gray-scale similarity decision functions. Experiments show that the algorithm successfully achieved the necessary calibration and segmentation for the grain region. Compared with the template and histogram matching algorithms, the proposed method does not require a training set, the detection accuracy is significantly improved and the detection efficiency is up to 29.74 times better on average using the proposed algorithm.
In this paper, an adaptive sliding mode neural network(NN) control method is investigated for input delay tractor-trailer system with two degrees of freedom. An uncertain camera-object kinematic tracking error model of a tractor car with n trailers with input delay is proposed. Radial basis function neural networks(RBFNNs) are applied to approximate the unknown functions in the error model. A sliding mode surface with variable structure control is designed by using backstepping method. Then, an adaptive NN sliding mode control method is thus obtained by combining Lyapunov-Krasovskii functionals. The controller realizes the global asymptotic trajectories tracking of the kinematics system. The stability of the closed-loop system is strictly proved by the Lyapunov theory. Matlab simulation results demonstrate the feasibility of the proposed method.
In the environment of space radiation, the high-energy charged particles or high-energy photons acting on a spacecraft can cause either temporary device degradation or permanent failure. The traditional probability model is difficult to obtain reliable estimation of unit radiation resistance performance with small samples. Considering that different products will change differently after high-energy particle radiation, we construct a model based on the gamma degradation process. This model can efficiently describe the law of unit radiation resistance variation with the total radiation dose levels under the effect of the total dose and displacement damage. Finally, the proposed model is used to assess the anti-radiation performance of the N-channel power MOSFET device STRH60N20FSY3 produced by STM to obtain average unit radiation resistance, survival probability, survival function, etc. 相似文献