首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   593648篇
  免费   7938篇
  国内免费   1058篇
电工技术   10689篇
综合类   583篇
化学工业   96705篇
金属工艺   23779篇
机械仪表   19040篇
建筑科学   13449篇
矿业工程   4387篇
能源动力   15107篇
轻工业   51393篇
水利工程   7195篇
石油天然气   15146篇
武器工业   41篇
无线电   61483篇
一般工业技术   120115篇
冶金工业   99424篇
原子能技术   14765篇
自动化技术   49343篇
  2022年   4439篇
  2021年   6574篇
  2020年   4756篇
  2019年   6061篇
  2018年   10353篇
  2017年   10543篇
  2016年   11044篇
  2015年   6941篇
  2014年   11406篇
  2013年   28371篇
  2012年   17599篇
  2011年   22833篇
  2010年   18320篇
  2009年   20051篇
  2008年   20240篇
  2007年   19776篇
  2006年   17072篇
  2005年   15364篇
  2004年   14557篇
  2003年   14262篇
  2002年   13683篇
  2001年   13169篇
  2000年   12580篇
  1999年   12308篇
  1998年   28967篇
  1997年   20914篇
  1996年   16200篇
  1995年   12340篇
  1994年   11126篇
  1993年   10860篇
  1992年   8426篇
  1991年   8173篇
  1990年   8048篇
  1989年   7836篇
  1988年   7559篇
  1987年   6823篇
  1986年   6590篇
  1985年   7448篇
  1984年   6757篇
  1983年   6478篇
  1982年   5815篇
  1981年   5959篇
  1980年   5690篇
  1979年   5761篇
  1978年   5694篇
  1977年   6267篇
  1976年   7845篇
  1975年   5140篇
  1974年   4928篇
  1973年   5015篇
排序方式: 共有10000条查询结果,搜索用时 15 毫秒
61.
Impact ionization is a major limiting factor to the maximum operating voltage of InGaAs-based, high-speed transistors. In this work, data on the positive temperature dependence of the electron impact ionization coefficient αn in In0.53Ga0.47As at medium-low electric fields are reported for the first time. The increase of αn with temperature is opposite to the behavior normally observed in most semiconductors. This anomalous behavior implies the onset of a positive feedback between power dissipation and avalanche generation which may adversely affect the power handling capability of In0.53Ga 0.47As-based devices, and which should be taken into account in device thermal modeling. In the experimental procedure, based on the measurement of the multiplication factor M-1 in npn In0.53Ga 0.47As/InP Heterojunction Bipolar Transistors (HBT), particular care has been taken in order to rule out possible spurious, temperature-dependent contributions to the measured multiplication current  相似文献   
62.
The physical widths of reference features incorporated into electrical linewidth test structures patterned in films of monocrystalline silicon have been determined from Kelvin voltage measurements. The films in which the test structures are patterned are electrically insulated from the bulk-silicon substrate by a layer of silicon dioxide provided by SIMOX (Separation by the IMplantation of OXygen) processing. The motivation is to facilitate the development of linewidth reference materials for critical-dimension (CD) metrology-instrument calibration. The selection of the (110) orientation of the starting silicon and the orientation of the structures' features relative to the crystal lattice enable a lattice-plane-selective etch to generate reference-feature properties of rectangular cross section and atomically planar sidewalls. These properties are highly desirable for CD applications in which feature widths are certified with nanometer-level uncertainty for use by a diverse range of CD instruments. End applications include the development and calibration of new generations of CD instruments directed at controlling processes for manufacturing devices having sub-quarter-micrometer features  相似文献   
63.
A new commercially available diode model is described. This unified model is capable of simulating the widest range of diode technologies of any presently available. The emphasis of this paper is on describing the model's extensive features and flexibility in the different domains of operation and is of particular interest in power applications  相似文献   
64.
The capacitive idling converters derived from the Cuk, SEPIC, Zeta, and flyback topologies allow soft commutation of power switches without the need for additional circuitry, making it possible to increase the switching frequency while maintaining high efficiency  相似文献   
65.
Pipelining and bypassing in a VLIW processor   总被引:1,自引:0,他引:1  
This short note describes issues involved in the bypassing mechanism for a very long instruction word (VLIW) processor and its relation to the pipeline structure of the processor. The authors first describe the pipeline structure of their processor and analyze its performance and compare it to typical RISC-style pipeline structures given the context of a processor with multiple functional units. Next they study the performance effects of various bypassing schemes in terms of their effectiveness in resolving pipeline data hazards and their effect on the processor cycle time  相似文献   
66.
67.
Translated from Kibernetika i Sistemnyi Analiz, No. 2, pp. 95–112, March–April, 1994.  相似文献   
68.
69.
The process of combustion of homogeneous and heterogeneous nongasifying and slightly gasifying systems over the range of a number of parameters characterizing the reactive composition and the conditions for the arrangement of the combustion process is studied by using thermocouple and optical methods. The regions of the implementation of different combustion regimes, namely, steady, pulsating, multiple-point, and spin, are determined experimentally.Institute of Structural Macrokinetics, Russian Academy of Sciences, Chernogolovka. Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 65, No. 4, pp. 407–411, October, 1993.  相似文献   
70.
An extended logistic model with a varying asymptotic upper bound for long-range peak demand forecasting is described. The model has been applied to a typical fast growing system, the Saudi Consolidated Electric Company. The forecasts are compared with actual demands and with those obtained from classical forecasting methods. The model gave relatively accurate peak demand forecasts compared with other classical methods. The model with a single load observation is capable of producing several peak demand forecasts corresponding to different levels of maximum temperature and various levels of social activity. The forecasts produced by the model were also stable irrespective of the length of the ex-post simulation period  相似文献   
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号