Monitoring the Ratio of Two Normal Variables Using EWMA Type Control Charts

In many fields, there is the need to monitor quality characteristics defined as the ratio of two random variables. The design and implementation of control charts directly monitoring the ratio stability is required for the continuous surveillance of these quality characteristics. In this paper, we propose two one‐sided exponentially weighted moving average (EWMA) charts with subgroups having sample size n > 1 to monitor the ratio of two normal random variables. The optimal EWMA smoothing constants, control limits, and ARLs have been computed for different values of the in‐control ratio and correlation between the variables and are shown in several figures and tables to discuss the statistical performance of the proposed one‐sided EWMA charts. Both deterministic and random shift sizes have been considered to test the two one‐sided EWMA charts' sensitivity. The obtained results show that the proposed one‐sided EWMA control charts are more sensitive to process shifts than other charts already proposed in the literature. The practical application of the proposed control schemes is discussed with an illustrative example. Copyright © 2015 John Wiley & Sons, Ltd.     

Minimum Setup Minimum Aberration Two‐level Split‐plot Type Designs for Physical Prototype Testing

Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited resources and system constraints to obtain useful information. It is common that prototypes are composed of several parts, with some parts more difficult to assemble than others. And, usually, there is only one piece available of each part type and a large number of different setups. Under these conditions, designs with randomization restrictions become attractive approaches. Considering this scenario, a new and additional criterion, minimum setup, to construct split‐plot type designs is presented. Designs with the minimum number of setups of the more difficult parts, which are especially useful for screening purposes in physical prototype testing, are discussed. The use of the proposed criterion combined with minimum aberration for selecting a regular design is shown through a real application in testing car prototypes. As a tool to practitioners, catalogs of selected 32‐run minimum setup minimum aberration split‐split‐plot and split‐split‐split‐plot designs are presented. More complete catalogs are available as Supporting information. Copyright © 2015 John Wiley & Sons, Ltd.     

Smart Utilization of Carbon Dots in Semiconductor Photocatalysis

Efficient capture of solar energy will be critical to meeting the energy needs of the future. Semiconductor photocatalysis is expected to make an important contribution in this regard, delivering both energy carriers (especially H₂) and valuable chemical feedstocks under direct sunlight. Over the past few years, carbon dots (CDs) have emerged as a promising new class of metal‐free photocatalyst, displaying semiconductor‐like photoelectric properties and showing excellent performance in a wide variety of photoelectrochemical and photocatalytic applications owing to their ease of synthesis, unique structure, adjustable composition, ease of surface functionalization, outstanding electron‐transfer efficiency and tunable light‐harvesting range (from deep UV to the near‐infrared). Here, recent advances in the rational design of CDs‐based photocatalysts are highlighted and their applications in photocatalytic environmental remediation, water splitting into hydrogen, CO₂ reduction, and organic synthesis are discussed.