Analysis of a two-dimensional symmetric problem on extension of an Al-polyimide-Cu layered structure with a model crack

To increase the efficiency of designing systems intended for monitoring surface cracks in aluminum structures during their working life, we have analyzed a two-dimensional symmetric problem on uniaxial extension of an Al-polyimide-Cu layered structure with ideal adhesion between layers and a model crack in the aluminum base. The problem has been first solved for a sample with the crack modeled by a zero-thickness notch using the ANSYS engineering simulation program package. It is shown that this setting of the problem can lead to inadequate results as manifested, in particular, by significantly overstated mechanical stresses in aluminum in the region of crack emergence on the surface. In order to eliminate this difficulty, we propose to use the structure with a model defect in the form of a notch of nonzero thickness in the initial unstressed state of the structure. Recommendations for selecting the thickness of a notch used in the model structure are given.

     

THz Direct Detector and Heterodyne Receiver Arrays in Silicon Nanoscale Technologies

Journal of Infrared, Millimeter, and Terahertz Waves - The main scope of this paper is to address various implementation aspects of THz detector arrays in the nanoscale silicon technologies...