Selection of Technological Bases in Manufacturing

The role of the following factors in the selection of technological bases for manufacturing is considered: the accessibility of the machined surfaces; their parameters and dimensional relationships; their position relative to the forces acting; and the uniformity of the margin distribution.     

Development of a new ion-imprinted polymer (IIP) with Cd2+ ions based on divinylbenzene copolymers containing amidoxime groups

Polymer Bulletin - In this study, we synthesized a new ion-imprinted polymer (IIP) based on introduction of amidoxime groups in acrylonitrile, complexation with Cd2+ ions and polymerization with...     

Heuristic Solution to the Diffraction Problem on a Superconducting Half-Plane

Journal of Communications Technology and Electronics - Abstract—The article presents a rigorous numerical solution, using the Wiener–Hopf method, to the problem of plane wave...     

A generalization of the octonion Fourier transform to 3-D octonion-valued signals: properties and possible applications to 3-D LTI partial differential systems

Multidimensional Systems and Signal Processing - The paper is devoted to the development of the octonion Fourier transform (OFT) theory initiated in 2011 in articles by Hahn and Snopek. It is also...     

Anomaly-Based Intrusion Detection System in RPL by Applying Stochastic and Evolutionary Game Models over IoT Environment

Wireless Personal Communications - The rapid development of Information and Communication Technology and the growing number of devices connected to the Internet make the Internet of Things (IoT) as...     

Structure–phase state of the surface layers in rails subjected to differential hardening

A layer-by-layer analysis of the structures, the phase compositions, and the defect substructures of differentially hardened rails has been carried by optical and transmission electron microscopy. It is found that the material volume of the rail head fillet is cooled faster than the volume located along the central axis.