The effects of plasma etching induced gate oxide degradation onMOSFET's 1/f noise

The effects of the plasma etching process induced gate oxide damages on device's low frequency noise behavior are investigated on MOSFET's fabricated with different field plate perimeter to gate area ratio antennas. Abnormal 1/f noise spectrum with a shoulder centered in the frequency range of 100 and to 1 kHz was frequently observed in small geometry devices, and it is attributable to a nonuniform distribution of oxide traps induced by plasma etching process     

铯原子激光共振电离

用Ｎｄ：ＹＡＧ及其泵浦的染料激光进行铯原子三步共振电离。求解了非饱和共振过程速率方程，计算出基态和激发态共振吸收截面，给出电离效率分别与激发电离速率以及作用时间的变化关系，得到饱和激发电离的流量条件和通量条件。     

乙烯基三甲基硅烷等离子体聚合反应历程

应用色谱—质谱(GC-MS)及裂解色谱-质谱(PGC-MS)测定了乙烯基三甲基硅烷等离子体聚合反应中的气体冷凝物及聚合物,研究推导了等离子体聚合反应历程。单体在气相中被电子撞击,然后扩散到基底,在基底发生链增长和链终止反应。     

FEATURE SOLID MODELING TOOL SYSTEM:FSMTS

In conformity with the principle of Design for Manufacture,feature-based design strate-(?)es have been developed.As the“feature”is relevant to the“macro process plan”and“macro NCprograms”,obviously,“feature”is beyond the power of conventional solid modellers.Neverthe-less,substantial breakthrough has not been made in the solid modeling field,except“feature at-taching”or“feature recognizing”methods have been taken on.In this paper,the theory,concepts,system architecture,and algorithm principles of solid modeling tool system have beenrepresented.The practice of Feature Solid Modeling Tool System (FSMTS) developed atHuazhong University has proved that the tool may be a new foundation of Feature-Based Design.     

叠后地震剖面的线性化波阻抗反演

本文提出了由井旁道出发逐道进行的叠后地震剖面的线性化波阻抗反演方法。每一道反演采用逐次线性化对波阻抗进行修正，反演的纵向分辨率为一个采样时间间隔，并以合成记录道与实际地震道的相似系数作为迭代收敛准则，已处理的地震道波阻抗作为下一道反演初始值。实际资料处理表明，该方法具有较高的分辨率和运算速度快的优点。     

Measurement-based network monitoring and inference: scalability andmissing information

Using measurements collected at network monitors to infer network conditions is a promising approach for network-centric monitoring. In this context, an important question arises: given the number and locations of network monitors, how much network management resources (e.g., the number of measurements) are needed to obtain an accurate estimate of network states? We define the scalability of measurement-based network monitoring as the growth rate of the number of measurements required for accurate network monitoring/inference with respect to the size of a network. We develop a framework for investigating the scalability in the context of multicast inference with the monitors at the edges of a network. In such a framework, network monitoring/inference can be formulated as probability density estimation of network states. The growth rate is characterized through the sample complexity, which is the number of measurements needed to accurately estimate the density. The missing data framework is introduced to estimate the growth rate, where the missing data reflect unavailable measurements at the unobservable nodes without resident monitors, and the underlying nodal packet losses. We show that when the missing information is mainly due to the number of unobservable nodes, the number of measurements needed grows linearly with the size of the network, and the measurement-based inference approach is, thus, scalable. When the missing information is mainly due to the underlying nodal packet losses, the number of measurements needed grows faster than linear with the size of the network, and the measurement-based inference approach is, thus, not scalable. Our results provide guidelines for accessing feasibility of the measurement-based inference approach, and the number of probes required. We give numerical examples to illustrate some of our results     

拉伸速率对PP/GB复合材料力学性能的影响

应用Instron材料试验机考察了室温下拉伸速率对玻璃微珠填充聚丙烯复合材料的弹性模量和屈服强度的影响，结果表明，随着微珠含量的增加，试样的弹性模量（Ec）增大，且与拉伸应变速率呈近乎幂律函数关系，而屈服强度（бyc）则随着微珠体积分数（Φf）的增加呈线性函数形式下降，并随着拉伸应变速率的增加呈幂律函数形式提高，此外，讨论了Ec、Φf与бyc三者之间的关系。     

纳米ZnO薄膜制备及液态源掺杂

用真空蒸发法在玻璃和单晶硅片 (10 0 )上制备Zn薄膜 ,然后对Zn薄膜进行氧化、热处理获得纳米ZnO薄膜。对在硅片上制备的Zn薄膜一次性进行高温掺杂、氧化获得纳米ZnO∶P和ZnO∶B薄膜。研究不同氧化、掺杂温度和时间对薄膜结构、电学性能的影响。结果表明 :氧化温度和时间对ZnO薄膜结构影响较大 ,液态源掺P可明显改善纳米ZnO薄膜的导电性能、结构特性和化学组分