Enabling Coarse X-ray Fluorescence Imaging Scans with Enlarged Synchrotron Beam by Means of Mosaic Crystal Defocusing Optics

Trace elements, functionalized nanoparticles and labeled entities can be localized with sub-mm spatial resolution by X-ray fluorescence imaging (XFI). Here, small animals are raster scanned with a pencil-like synchrotron beam of high energy and low divergence and the X-ray fluorescence is recorded with an energy-dispersive detector. The ability to first perform coarse scans to identify regions of interest, followed by a close-up with a sub-mm X-ray beam is desirable, because overall measurement time and X-ray dose absorbed by the (biological) specimen can thus be minimized. However, the size of X-ray beams at synchrotron beamlines is usually strongly dependent on the actual beamline setup and can only be adapted within specific pre-defined limits. Especially, large synchrotron beams are non-trivial to generate. Here, we present the concept of graphite-based, convex reflection optics for the one-dimensional enlargement of a 1 mm wide synchrotron beam by a factor of 5 to 10 within a 1 m distance. Four different optics are tested and characterized and their reflection properties compared to ray tracing simulations. The general shape and size of the measured reflection profiles agree with expectations. Enhancements with respect to homogeneity and efficiency can be expected with improved optics manufacturing. A mouse phantom is used for a proof-of-principle XFI experiment demonstrating the applicability of coarse and fine scans with the suggested optics design.     

Eine einfache Synthese des Cyclohexanon-2-carbonsäure-amids sowie dessen Reaktionen

A Simple Synthesis of Cyclohexanone-2-carboxamide and its Reactions By reaction of urea with cyclohexanone and subsequent acid hydrolysis cyclohexanone-2-carboxamide 2 is formed. 2 is C-alkylated by alkyl halides yielding compounds 6a—g . With amines, the enamines 10a and 10b , and with hydrazines the tetrahydroindazolones 8a and 8b are formed. 2 reacts with aqueous alkali to give pimelic acid. Cyclopentanone-2-carboxamide 3 and cycloheptanone-2-carboxamide 4 are formed in an analogous way.     

Referenzprozessabläufe für Telekommunikationsunternehmen

The telecommunication market is experiencing substantial changes. New business models, innovative services, and technologies require reengineering, transformation, and process standardization. Enterprise Architecture Frameworks support the transformation by specifying methods, procedures, and reference models. With the Enhanced Telecom Operation Map (eTOM), the TM Forum offers an international de facto reference process framework, based on specific features and requirements of the telecommunication industry. However, this reference framework only offers a hierarchical collection of processes on different levels of abstraction; a control view in terms of a sequential ordering of tasks and hence a real process flow as well as an end-to-end view on the customer are missing. In this paper, we extend the eTOM reference model by reference process flows, in which we abstract and generalize the knowledge about processes in telecommunication companies. With reference process flows, we aim to assist companies in achieving a structured and transparent re-structuring and re-design of their processes. We demonstrate the applicability and usefulness of our reference process flows in two case studies, and evaluate them by means of criteria for reference model evaluation. Our reference process flows have been accepted as a standard by the TM Forum and published as part of eTOM version 9. We further elaborate on those components of our approach which can be applied outside the telecommunication industry.     

Capillary self-alignment of polygonal chips: a generalization for the shift-restoring force

Capillary-driven self-alignment using droplets is currently extensively investigated for self-assembly and microassembly technology. In this technique, surface tension forces associated to capillary pinning create restoring forces and torques that tend to bring the moving part into the alignment. So far, most studies have addressed the problem of square chip alignment on a dedicated patch of a wafer, aiming to achieve 3D microelectronics. In this study, we investigate the shift-restoring forces for more complex moving parts such as regular—convex and non-convex—polygons and regular polygons with regular polygonal cavities. A closed-form approximate expression is derived for each of these polygonal geometries; this expression agrees with the numerical results obtained with the Surface Evolver software. For small shifts, it is found that the restoring force does not depend on the shift direction or on the polygonal shape. In order to tackle the problem of microsystem packaging, an extension of the theory is done for polygonal shapes pierced with connection vias (channels), and a closed form of the shift-restoring force is derived for these geometries and again checked against the numerical model. In this case, the restoring force depends on the shift direction. Finally, a non-dimensional number, the shift number, is proposed that indicates the isotropic or anisotropic behavior of the chip according to the shift direction.     

Structure,homogeneity ranges,magnetic, and electrical properties of the ordered Laves phases RENi4Mg with MgCu4Sn type structure

New ordered Laves phases RENi₄Mg (RE = Sc, Sm, Tb–Lu) were synthesized from the elements in sealed tantalum ampoules in an induction furnace. Six of the structures were refined on the basis of X-ray single crystal data. The diffraction experiments gave hint for small homogeneity ranges RE_1+xNi₄Mg_1?x. Magnetic susceptibility measurements show Curie–Weiss behavior for RE = Gd, Dy, Ho, Tm, Yb and the resulting effective magnetic moments suggest both stable trivalent states for all RE and a non-magnetic state for Ni. Gd_1+xNi₄Mg_1?x (x ≈ 0.12) orders antiferromagnetically at a Néel temperature of T_N = 4.6(5) K. Resistivity measurements reflect the metallic nature of these compounds.     

Soft information and the stewardship value of accounting disclosure

In light of IASB??s statement to drop stewardship as a separate objective of financial accounting and the ongoing debate about increasing the disclosure of soft information, we investigate the economic consequences of publicly reported soft information from a stewardship perspective. In an LEN model we include market price as a performance measure and investigate whether the principal benefits from disclosing additional information. While the principal can only use contractible performance measures in the contract with the agent, capital market participants can only use disclosed information when pricing firm value. We find that the disclosure of information can decrease the principal??s expected net profit. This result follows from either a noisier or a less congruent market price as a consequence of disclosing additional information. Thus, we present a rationale for partial disclosure in the absence of proprietary costs or the uncertainty of information endowment.     

Subsampling weakly dependent time series and application to extremes

This paper provides extensions of the work on subsampling by Bertail et al. in J. Econ. 120:295–326 (2004) for strongly mixing case to weakly dependent case by application of the results of Doukhan and Louhichi in Stoch. Proc. Appl. 84:313–342 (1999). We investigate properties of smooth and rough subsampling estimators for sampling distributions of converging and extreme statistics when the underlying time series is η- or λ-weakly dependent.     

Manufacturer-independent mechatronic information model for control systems

Modular system-based engineering is the key to a quick, customized machine and plant configuration. This approach is seen as the best method to implement different functional requirements with a minimum amount of resources. The interdisciplinary configuration of control systems to automate machines has previously not been supported by engineering tools. This is partially due to the lack of standardized mechatronic information models. The machine manufacturer is required to create the necessary mechatronic information models uniquely for each control system independently. Thus, he does not comply with any modeling specifications. As a result, the mechatronic information models are not applicable for other control system architectures. The conventionally used mechatronic information models as well as the manufacturer-specific engineering tools define the control hardware components and their configurations. An abstraction of the logical and functional layers does not take place. Consequently, a mechatronic control architecture model is required. This architecture can serve as a modeling basis in modular system-based interdisciplinary engineering tools. Therefore, an approach to a manufacturer independent, mechatronic information model for control systems is the subject of this article.