Comparison of Protein Extraction Solutions for Rice Starch Isolation and Effects of Residual Protein Content on Starch Pasting Properties

Protein extraction solutions such as aqueous solutions of sodium hydroxide (0.1 and 0.2 %), sodium lauryl sulfate (SLS, 1.2 %) containing sodium sulfite (0.12 %), and dodecylbenzene sulfonate (DoBS, 1.2 %) containing sodium sulfite (0.12 %) were compared in their protein removal efficiencies during isolation of starch from a rice flour (Ilpumbyo, a nonwaxy Korean rice variety). In addition, the pasting properties of the isolated starch was compared. More than 80 % of the flour protein was extracted in 1 h by stirring the dispersion (1:3, w/v) at room temperature. Repeating the extractions (1 or 2 h for each step) with fresh solution significantly increased the protein removal efficiency. When the extraction in 0.2 % NaOH was repeated four times (1 h for each step) at 25°C, the residual protein content in the isolated rice starch was 0.9 % (DB), equivalent to 86 % removal of the rice protein. Raising the extraction temperature slightly increased the protein solubility, but starch loss also became significant. Among the solutions, DoBS was most effective in removing rice protein whereas SLS was least. The residual protein content had a critical role in determining the pasting characteristics of the isolated starch, showing a negative correlation to the peak viscosity of the starch paste, but a positive correlation to the pasting temperature.     

Non-destructive evaluation of residual stresses in thin films via x-ray diffraction topography methods

Quantitative x-ray diffraction topography techniques have been used to measure the residual strain magnitude and uniformity of deposition for Mo and W sputtered films on Si(100) substrates. High sensitivity rocking curve measurements were able to determine differential strains for films as thin as 2.5 nm; while Bragg angle contour mapping had similar sensitivity and was also able to assess coating uniformity and stress distribution over areas covering a whole wafer. Measurements of strain versus film thickness over a range of 2.5 nm to 80 nm showed that a critical thickness exists for maximum residual strain. Growth beyond this range produces stress relaxation. This non-destructive type of analysis could be employed on a wide range of film-substrate combinations.     

Electrical isolation design rule for GaAs integrated circuitsfabricated on semi-insulating substrates

The characteristics of n-semi-insulating-n (n-si-n) structures that dictate the design rules for electrical isolation between active devices of GaAs integrated circuits fabricated on semi-insulating substrates are studied by one-dimensional and two-dimensional numerical simulations. It is found that the I-V characteristics of these structures are characterized by sharp current-rising regions which result from a potential barrier lowering effect caused by the punchthrough phenomenon. Simplified expressions are derived for quick evaluation of the punchthrough voltages for both one-dimensional and two-dimensional analyses. For a given operating voltage, the one-dimensional calculation gives a larger spacing between n regions in a n-si-n structure for onset of large current flow than does the two-dimensional analysis. Therefore, the spacing obtained from one-dimensional results can be used as a conservative design criterion for device isolation. For more aggressive electrical isolation design, two-dimensional simulation is necessary since it provides more accurate results     

Linewidth, tunability, and VHF-millimeter wave frequency synthesis of vertical-cavity GaAs quantum-well surface-emitting laser diode arrays

The authors report the measurement of the laser linewidth, wavelength tunability, and generation of microwave frequencies between individually addressable elements of a vertical-cavity GaAs quantum-well surface-emitting laser diode array (lasing in the wavelength range 850-865 nm). Using heterodyne techniques, the authors obtain a deconvolved 65 MHz laser linewidth from the 109 MHz beat signal. The laser linewidth corresponds to a semiconductor laser linewidth enhancement factor alpha =5.7, which is in excellent agreement with that obtained independently from optical gain measurements and corresponding calculated refractive index changes. The authors measured heterodyne beat frequencies of 2-20 GHz. The bandwidth was limited by the microwave amplifiers. A simple calculation shows that a tuning range of 65 MHz to 3 THz can be achieved.<>     

On surface recombination velocity and output intensity limit of pulsed semiconductor lasers

Relationships obtained by F. Kappeler et al. (1982) are utilized to assess the effect of facet passivation on the output intensity limit in terms of surface recombination velocity. The results show a trend that the output intensity limit increases in an exponential manner with decreasing recombination velocity once the velocity is reduced by a factor of 2 from that for an unpassivated laser. They also indicate that the output intensity is not likely to be limited by nonradiative recombination at the facet when the recombination velocity is reduced by a factor of 4.<>     

Spectral characteristics of vertical-cavity surface-emitting lasers with external optical feedback

The measurement of the effects of external optical feedback on the spectra of VCSELs (vertical-cavity surface-emitting lasers) is reported. It is surprising that VCSELs have a sensitivity to optical feedback comparable to that of conventional edge-emitting lasers such as DFBs despite their significantly different structures. This is because the extremely short cavity length of VCSELs negates the effects of their highly reflective output mirrors. As in edge-emitting lasers, VCSELs exhibit well-defined regimes of feedback effects in their spectra. Since optical isolators cannot be easily applied to VCSELs due to their array structure, these lasers may be most useful in applications which are not sensitive to the spectral qualities of the light source.<>     

Construction of Time-Relaxed c-Broadcast Networks

C-broadcasting is an information dissemination task where a message, originated at any node in a network, is transmitted to all other nodes with the restriction that each node having the message can transmit it to almost c neighbors simultaneously. If the transmission time of the message is set to be one time unit, a minimal c-broadcast network (c-MBN) is a communication network in which c-broadcasting from any node can be accomplished in log _c+1 n time units, where n is the number of nodes and log _c+1 n is the fastest possible broadcast time. If networks are sparse, additional time units may be required to perform c-broadcasting. A time-relaxed c-broadcast network, denoted as (t,c)-RBN, is a network where c-broadcasting from any node can be completed in log _c+1 n+t time units. In this paper, a network compounding algorithm is proposed to construct large sparse (t,c)-RBNs by linking multiple copies of a time-relaxed network of small size using the structure of another time-relaxed network. Computational results are presented to show the effectiveness of the proposed algorithm.     

Charging effect of Si nanocrystals in gate oxide near gate on MOS capacitance

MOS structure with Si nanocrystals embedded in the gate oxide close to the gate has a much larger capacitance compared to a similar MOS structure without the nanocrystals. However, charge trapping in the nanocrystals reduces the capacitance dramatically, and after most of the nanocrystals are charged up the capacitance is much smaller than that of the MOS structure without nanocrystals. An equivalent-capacitance model is proposed to explain the phenomena observed.     

Two-phase boosted voltage generator for low-voltage DRAMs

A two-phase boosted voltage (V/sub PP/) generator circuit was proposed for use in gigabit DRAMs. It reduced the maximum gate-oxide voltage of pass transistor and the lower limit of supply voltage to V/sub PP/ and V/sub TN/, respectively, while those for the conventional charge-pump circuit are V/sub PP/+V/sub DD/ and 1.5 V/sub TN/ respectively. Also, the pumping current was increased in the new circuit. The newly proposed two-phase V/sub PP/ charge-pump circuit worked successfully at V/sub DD/ down to 0.8 V by eliminating the threshold voltage loss of the control pulse generator and was tested successfully in a 0.16-/spl mu/m test chip using triple-well CMOS technology.     

A time-domain approach to simulation and characterization of RF HBT two-tone intermodulation distortion

In this paper, we evaluate the two-tone intermodulation distortion for heterojunction bipolar transistors (HBTs) operated at RF. We directly solve the nonlinear differential equations of the HBT large-signal model in time domain by employing the waveform-relaxation and monotone-iterative methods. Based on time-domain results, sinusoidal waveform outputs are transformed into the frequency domain with the fast Fourier transform. Furthermore, the output third-order intercept-point values of the HBT are computed with the spectra. Results for a fabricated InGaP HBT under different testing conditions are reported and compared among the HSPICE results, the results with harmonic balance methodology, and the measured data. Comparisons among these results show that our method demonstrates its superiority over the conventional approaches. This characterization alternative has allowed us to study RF device properties, perform thermal consumption and sensitivity analysis, and extract model parameters.