New method for analysis of electromagnetic coupling to an angled two-strip transmission line

The electromagnetic coupling to an angled two-strip transmission line is analysed to constructing an angled two-plate transmission line equivalent to the original geometry, and then solving the cylindrical transmission line equations of the original source analytically. The results agree with the numerical values of the circuit-concept approach.<>     

A clock feedthrough reduction circuit for switched-current systems

A clock feedthrough reduction circuit useful for switched-current systems is proposed. This circuit adopts the concept of current cancellation. It is a signal-dependent clock feedthrough reduction circuit. To verify the usefulness of the proposed circuit, a test pattern was fabricated using 1.2 μm CMOS process. The simulation and the experimental results of the proposed circuit reveal a reduction of clock feedthrough errors in comparison with conventional circuits. The circuit based on this concept also permits a decrease in area of about 20%     

Scale and rotation invariant pattern recognition using complex-log mapping and augmented second order neural network

A scale and rotation invariant pattern recognition system using complex-log mapping (CLM) and an augmented second order neural network (SONN) is proposed. CLM is very useful for extracting the scale and rotation invariant features. The results are, however, given in a wrap-around translated form. This problem is solved with an augmented SONN. Experimental results show that the proposed system has improved recognition performance.<>     

Tapered, both in dimension and in index, velocity coupler: theoryand experiment

The authors consider a tapered velocity coupler (TVC) that meets the adiabatic invariance condition with sufficiently strong coupling between the fundamental modes of individual guides in the middle region of the coupler while permitting individual excitation at the input end and sorting of the modes at the output end. This approach helps reduce the device length considerably by permitting much higher taper angle. A TVC consisting of one tapered and another straight, graded index waveguide is modeled using the normal modes of the entire, composite TVC structure. The analytical results are in excellent agreement with experimental results for a TVC fabricated in Ti:LiNbO₃. It is shown that the representation of the local normal modes as the superposition of the modes of the uncoupled guides leads to erroneous results     

A simple yet effective technique for partitioning

Partitioning is an important step in the top-down design of large complicated integrated circuits. In this paper, a simple yet effective partitioning technique is described. It is based on the clustering of “closely” connected cells and the gradual enforcement of size-constraints. At the beginning, clusters are formed in the bottom-up fashion to reduce the problem size. Then the clusters are partitioned using several different parameters to find a good starting point. The best result achieved during the cluster partitioning is used as the initial solution for the lower level partitioning. The gradual constraint enforcement technique is used to cope with the local minimum problems. It allows cells or clusters to move with more freedom among the subsets during earlier iterations and thus may effectively find a near optimum solution. Several experimental results show that the new partitioning technique produces favorable results. In particular, the method outperforms the F&M method by more than 60% in the number of crossing nets on average     

Performance Analysis of the Clutter Map CFAR Detector with Noncoherent Integration

Nitzberg has analyzed the detection performance of the clutter map constant false alarm rate (CFAR) detector using single pulse. In this paper, we extend the detection analysis to the clutter map CFAR detector that employs M-pulse noncoherent integration. Detection and false alarm probabilities for Swerling target models are derived. The analytical results show that the larger the number of integrated pulses M, the higher the detection probability. On the other hand, the analytical results for Swerling target models show that the detection performance of the completely decorrelated target signal is better than that of the completely correlated target.     

Research Joint Venture and Open Economy

The consumer surplus under the open economy is greater than that under the closed economy from the viewpoint of social welfare. This indication has been proved when only the product market is considered. This article is to show how this result is changed if the R&D market as well as the product market is considered. We find the possibility that the closed economy is preferred to the open economy in case of the (international) R&D joint venture.     

Preparation of (Pb0.88La0.12)TiO3 thin films for dynamic random access memory by low pressure-metalorganic chemical vapor deposition

La-modified lead titanate (PLT) thin films were prepared by hot-wall type low pressure-metalorganic chemical vapor deposition method. Pb(dpm)₂, La(dpm)₃, and titanium tetraisopropoxide were used as source materials. The films were deposited at 500°C under the low pressure of 1000 mTorr and then annealed at 650°C for 10 min in oxygen ambient. Sputter-deposited platinum electrodes and 180 nm thick PLT thin films were employed to form MIM capacitors with the best combination of high charge storage density (26.7 μC/cm² at 3V) and low leakage current density (1.5 × 10^-7 A/cm² at 3V). The measured dielectric constant and dielectric loss were 1000∼1200 and 0.06∼0.07 at zero bias and 100 kHz, respectively.     

Thermal stability of sputter-deposited ZnO thin films

This paper describes our investigation on the thermal stability of sputterdeposited, piezoelectric, ZnO thin films, using x-ray photoelectron spectroscopy (XPS), capacitance-voltage (C-V) measurements of metal-insulator-semiconductor structures, and electron microprobe. We focus on out-diffusion of Zn from ZnO thin films at a high temperature (450°C) and the composition change of zinc and oxygen after high temperature annealing (up to 700°C), since these factors are related to reliability and integrated circuits-process-compatibility of the ZnO films which are being used increasingly more in microtransducers and acoustic devices. Our experiments with electron microprobe show that ZnO thin films sputter-deposited from a ZnO target in a reactive environment (i.e., with O₂) are thermally stable (up to 700°C). Additionally, the out-diffusion of zinc atoms from the ZnO films at a high temperature (450°C) is verified to be negligible using the XPS and C-V measurement techniques. The usage of a compound ZnO target, reactive environment with O₂ and optimized deposition parameters (including gas ratio and pressure, substrate temperature, target-substrate distance and rf power, etc.) is critical to deposit thermally stable, high quality ZnO films.     

Partial scan flip-flop selection by use of empirical testability

Partial serial scan as a design for testability technique permits automatic generation of high fault coverage tests for sequential circuits with less hardware overhead and less performance degradation than full serial scan. The objective of the partial scan flip-flop selection method proposed here is to obtain maximum fault coverage for the number of scan flip-flops selected. Empirical Testability Difference (ETD), a measure of potential improvement in the testability of the circuit, is used to successively select one or more flip-flops for addition or deletion of scan logic. ETD is calculated by using testability measures based on empirical evaluation of the circuit with the acutal automatic test pattern generation (ATPG) system. In addition, once such faults are known, ETD focuses on the hard-to-detect faults rather than all faults and uses heuristics to permit effective selection of multiple flip-flops without global optimization. Two ETD algorithms have been extensively tested by using FASTEST ATPG [1, 2] on fourteen of the ISCAS89 [3] sequential circuits. The results of these tests indicate that ETD yields, on average, 35% fewer uncovered detectable faults for the same number of scanned flip-flops or 27% fewer scanned flip-flops for comparable fault coverage relative to cycle-breaking methods.This work was performed while the author was with the University of Wisconsin-Madison.