Quantification of the layer dispersion degree in polymer layered silicate nanocomposites by transmission electron microscopy

As the performance of polymer layered silicate nanocomposites strongly depends on their interior layer dispersion, quantification of the layer dispersion degree is needed. In this work, a new methodology was developed to determine the dispersion parameter D_0.1, based on the measurement of the free-path spacing distance between the single clay sheets from the transmission electron microscopy (TEM) images. Several examples of exfoliated, intercalated, and immiscible composites were studied. It was found that the exfoliated composites had D_0.1 over 8%, while that of intercalated composites were between 4 and 8%. In the case of intercalation, a high frequency peak appeared at a short spacing distance in the histogram, which was a characteristic of the intercalation, distinct from the exfoliation. The main utility of this TEM methodology is for the quantification of exfoliated or intercalated samples with small number of layers with stacks. The dispersion parameter D_0.1 below 4% was suggested to classify as immiscible. A unique advantage of the TEM measurement is that the dispersion degree of different fillers can be counted individually.     

建筑陶瓷企业实施精益生产研究

分析了建筑陶瓷企业实施精益生产的条件和当前推行精益生产的主要障碍，对应用中存在的问题进行了分析并提出了相关建议。     

化学镀Ni—P镀层的X射线衍射研究

根据X射线衍射分析结果,对化学镀高P(含P>11wt％或19at％)Ni-P镀层加热时效时,镀层成分和加热温度对结构转变的影响作了研究,结果表明,高P共晶、过共晶(含P>11wt％或19at％)合金的结构转变有如下特征:(1)相同加热时效条件下,Ni-P合金的结构转变与成分有密切关系:(2)对同一成分的过共晶合金,Ni-P合金的结构转变与时效温度密切相关;(3)过共晶合金在290～360℃温度范围内时效处理,出现Ni_xP_y介稳相,X射线衍射分析认为Ni_xP_y为Ni_(12)P_5。     

3^n阶矩阵乘法的分块算法

针对３＾ｎ阶矩阵的乘法运行，给出了一种分块算法，其乘法运行量比常规的矩阵乘法计算方法和补零的基－２算法都有所减少。     

FAST MEASUREMENT OF ASH CONTENT IN COAL WASHING PLANT

The coal filter cake is a product of fine coal after floatation which has an ash content of 7-13%, water content of 30±2%, and a particle size of less than 1 mm. The ash content was measured by the intensity of the single backscattered gamma-ray, and its accuracy is mainly dependent on the energy of the gamma-ray. The 238Pu low energy photon source is selected in this work. The energy of its gamma-ray is 15 keV, which can result not only in the best sensitivity, but also in the lowest contribution to the environment radiation. The root mean square deviation of the ash measurement is±0.33% (±1σ).     

Testing the robustness of CIECAM02

CIE TC8‐01 has adopted a new color appearance model: CIECAM02¹ replaces the CIECAM97s.² The new model consists of a number of refinements and simplifications of the CIECAM97s color appearance model. This article describes further tests to the robustness of the forward and reverse modes. © 2005 Wiley Periodicals, Inc. Col Res Appl, 30, 99–106, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/col.20087     

广义汉明重量下限函数Lr（j,d）的新证明

通过几个引理，对广义汉明重量下限函数Ｌｒ（ｊ，ｄ）的有限和表达式给出了一个思路简单的证明方法。给出了取整数函数［ｘ］，［ｘ］的一些运算性质。     

Effects of Sc2O3 and MgO passivation layerson the output power of AlGaN/GaN HEMTs

The low temperature (100°C) deposition of Sc₂O₃ or MgO layers is found to significantly increase the output power of AlGaN/GaN HEMTs. At 4 GHz, there was a better than 3 dB increase in output power of 0.5×100 μm² HEMTs for both types of oxide passivation layers. Both Sc₂ O₃ and MgO produced larger output power increases at 4 GHz than conventional plasma-enhanced chemical vapor deposited (PECVD) SiN_x passivation which typically showed ⩽2 dB increase on the same types of devices. The HEMT gain also in general remained linear over a wider input power range with the Sc₂O₃ or MgO passivation. These films appear promising for reducing the effects of surface states on the DC and RF performance of AlGaN/GaN HEMTs