生产过程质量不合格品系统(IQS)方案建模及优化

针对不合格品的高效处置、数据的有效分析对企业质量控制具有深远的意义,其是装备制造领域质量管理研究的重点。文章以SAP接口二次开发、IQS流程建模、数据库建立、系统实用价值等方面展开详细论述,确保质量信息可追溯分析。     

基于滑模的运载器主动段俯仰通道姿控系统设计

与传统比例-积分-微分（PID）控制方法相比，滑模控制（SMC）方法可以比较容易地将不确定性纳入控制器设计中，从而增强系统的鲁棒性。探索了SMC技术在运载器主动段姿态控制中的工程应用，首先通过分析基于趋近律的SMC系统，提出了降低不连续切换项系数的需求，然后研究了基于干扰上界的SMC方法。三通道小偏差仿真结果验证了两种方法的控制效果，表明第2种控制器的鲁棒性更好，稳态误差小，同时发动机喷管摆角需求较小。     

Principled analytic classifier for positive-unlabeled learning via weighted integral probability metric

Machine Learning - We consider the problem of learning a binary classifier from only positive and unlabeled observations (called PU learning). Recent studies in PU learning have shown superior...     

倾斜摄影测量技术在古建筑测绘中的运用研究——以郴州市汝城县朱氏宗祠建筑测绘为例

为测试倾斜摄影测量技术路线,并通过实际项目的应用,解决传统古建筑建模过程中存在的时间成本高、难以还原复杂场景等问题。按照倾斜摄影技术的技术路线,进行朱氏宗祠建筑测绘试验,并通过基于altizure软件建立三维模型来展现倾斜摄影测量技术流程。验证无人机倾斜摄影应用于古建筑三维建模的可行性和可操作性。     

Minimization of mixed-color image noise caused by shape error of polygonal mirror in color-laser printing system

Microsystem Technologies - A color-laser printing system consisting of a tandem laser scanning unit uses four laser diodes and a single polygonal mirror (PM) to expose light onto four...     

Precise Extraction of Charge Carrier Mobility for Organic Transistors

Unreliable mobility values, and particularly greatly overestimated values and severely distorted temperature dependences, have recently hampered the development of the organic transistor field. Given that organic field‐effect transistors (OFETs) have been routinely used to evaluate mobility, precise parameter extraction using the electrical properties of OFETs is thus of primary importance. This review examines the origins of the various mobilities that must be determined for OFET applications, the relevant extraction methods, and the data selection limitations, which help in avoiding conceptual errors during mobility extraction. For increased precision, the review also discusses device fabrication considerations, calibration of both the specific gate‐dielectric capacitance and the threshold voltage, the contact effects, and the bias and temperature dependences, which must actually be handled with great care but have mostly been overlooked to date. This review serves as a systematic overview of the OFET mobility extraction process to ensure high precision and will also aid in improving future research.