A modern hardware setup for real-time turbulence measurements in two-phase flows

A modern concept of cost-effective digital signal processing hardware for measuring and analysing data from experiments investigating turbulent two-phase flows is presented. Using an array processor together with an appropriate analog-to-digital converter, conventional turbulence characteristics such as turbulence spectra, correlation functions, turbulence intensities and — scales can be evaluated in real time.     

Electron traps created in gate oxides by Fowler–Nordheim injections

Two types of electron traps, donor-like and acceptor-like, are created in the gate oxide of metal-oxide-semiconductor capacitors by Fowler–Nordheim electron injections. Electrical properties (areal density, capture cross-section, centroid) of each type of trap are determined by using the avalanche electron injection method and by combining capacitance–voltage and current–voltage measurements. These properties are measured with regard to the Fowler–Nordheim fluence up to breakdown and for both injection modes (electrons injected either from the gate or from the substrate of capacitors).     

Simplified characterization of uniaxial and biaxial nonlinearoptical crystals: a plea for standardization of nomenclature andconventions

Standards which eliminate ambiguity in reporting nonlinear phenomena, especially in the increasingly complex realm of biaxial crystals, are proposed. In order to restore uniformity to the designation of crystallographic axes and crystal tensor properties, adoption of IEEE/ANSI Std. 176, with a small but much needed modification for crystal class mm2, is recommended. For the reporting of nonlinear interaction characteristics, other frames are proposed which result in simpler rules than heretofore given for categorizing phase-matching loci, and for characterizing eigenmode polarizations, double refraction, effective nonlinear coupling, and first- and second-order acceptance bandwidths (angular, spectral, thermal) along these loci. Similarities as well as differences between biaxial and uniaxial crystals are emphasized     

Alloy structures and phase equilibrium diagram of the Hf-Ru-Ir system III. Solidus surface and 1350°C isothermal section of the state diagram in the Hf-HfRu-HfIr region

Translated from Poroshkovaya Metallurgiya, No. 3, pp. 61–67, March, 1992.     

Depth resolution calculations for heavy-ion microbeam RBS analysis

A detailed study has been made on the use of MeV heavy ions (Z₁ = 6–8) for microbeam Rutherford backscattering (RBS) analysis, to improve the depth resolution of this technique. The algorithm for determination of the depth resolution was created and applied to the Zagreb microbeam facility. Theoretical estimates of depth resolution for C and O ion RBS analysis of thin oxide films and semiconductors, using annular silicon surface barrier detector (SSBD), are compared to those for proton backscattering analysis. Depth resolution in certain cases may be improved by increasing the heavy-ion energy. Therefore, by the proper choice of the heavy ion and the heavy-ion energy, the depth resolution may be improved, maintaining the efficiency of the RBS method.     

Production and properties of the aging powdered alloy Cu-0.8% Cr. II. Production of electric contacts of aging alloy Cu-0.8% Cr for welding machines by extrusion

Translated from Poroshkovaya Metallurgiya, No. 11(359), pp. 71–73, November, 1992.