声表面波32位MSK抽头延迟线

介绍了扩频通信有效的ＭＳＫ信号特点及声表面波ＭＳＫ抽头延迟线构成方式，给出了声表面波３２位ＭＳＫ抽头延迟线的实验结果。     

VHDL逻辑综合及FPGA实现

运用ＶＨＤＬ语言描述了一个１２×１２位的高速补码阵列乘法器。重点是运用ＶＨＤＬ逻辑综合优化该乘法器，并进行了乘法器的ＸｉｌｉｎｘＦＰＧＡ实现、功能仿真和时序仿真。经选用ＸＣ４００５ＰＣ－８４－４芯片进行验证，证明了其正确性     

表面稳定模式铁电液晶的电光特性测试

采用一种改进的高分子膜摩擦定向法成功地实现了表面稳定模式铁电液晶的光学双稳态，对比度大于１４０，响应时间达１００微秒。     

弹药内弹道性能检验新方法数学模型的建立

本文对弹药内弹道性能检验的传统方法存在的问题进行了分析,提出了一种新的检验方法,重点对新的检验方法的数学模型的建立过程进行了论述。并对数学模型的精度进行了分析、检验和验证。     

InAs／InP_（0．7）Sb_（0．3）热电子晶体管的f_T及f_（max）

用电荷控制及热电子弹道运动模型计算ＩｎＡｓ／ＩｎＰ０．７Ｓｂ０．３热电子晶体管的截止频率ｆＴ及最高振荡频率ｆｍａｘ。结果表明，ｆＴ、ｆｍａｘ分别达到２８０ＧＨｚ及６００ＧＨｚ。并指出，通过生长ＧａＳｂ中间层，ＩｎＡｓ／ＩｎＰ０．７Ｓｂ０．３ＨＥＴ可在ＧａＡｓ衬底上实现单片集成。     

Dynamic oxide voltage relaxation spectroscopy

A new method for trap characterization of oxidized silicon is described. The Dynamic Oxide Voltage Relaxation Spectroscopy (DOVRS) is an improved version of the formerly proposed Oxide Voltage Relaxation Spectroscopy (OVRS) technique which applies a periodic long duration constant current for tunneling injection. It has been demonstrated that the new technique can be used not only to separate and identify the oxide trap from interface trap, but also to separate and determine the centroid from the oxide trap density generated in the MOS system by the tunneling current stress. In the pulse constant current mode, the OVRS measurement can be completed instead of using the double current-voltage technique. Thus the new method results in more accurate and quicker measurements of the oxide trap centroid. Analytical expressions for computing the paramaters of the interface and oxide traps are derived. The effect of the channel carrier mobility on the spectroscopy is also considered. Two types of oxide and two types of interface traps were observed at a pulse constant Fowler-Nordheim current stress by the new method of DOVRS     

A three-dimensional non-epitaxial atomistic growth model for thin-film deposition: effect of surface mobility

The effect of the atomic mobility on a film surface has been studied by using a three-dimensional atomistic thin-film deposition model which simulates three-dimensional thin-film images, surface profiles and cross-sectional area pictures. In addition, quantitative results of surface RMS roughness, average film thickness, atomic coordination number and its distribution, and solid fraction of the deposited thin films, were obtained from the simulations. When the film surface mobility increased from 0.3 to 3.0, RMS roughness decreased from 6.5 to 1.1, solid fraction increased from 0.27 to 0.56 and average film thickness decreased from 40 to 28, due to the reduction of the voids within the film. The full-width half magnitude of the atomic coordination distribution became narrower indicating the increased degree of crystallization. With increase in surface mobility crossing the boundary to 1.5, the film evolved from a porous or loose columnar structure with voids, to a densely packed fibrous grain structure which can be categorized by the zone structure models.     

双臂协调约束系统动力学问题探讨

本文讨论了双臂协调约束系统的动力学问题．文中系统地描述了该系统的适应于计算机程序化的建模方法；推导了系统的动力学方程，并给出了用约束矩阵的正交补矩阵处理系统所受协调约束的方法；编制了相应的计算机辅助分析程序ＤＲＣＲＣＳ，并用该程序对算例进行了动力学的数值分析。