生产过程质量不合格品系统(IQS)方案建模及优化

针对不合格品的高效处置、数据的有效分析对企业质量控制具有深远的意义,其是装备制造领域质量管理研究的重点。文章以SAP接口二次开发、IQS流程建模、数据库建立、系统实用价值等方面展开详细论述,确保质量信息可追溯分析。     

Principled analytic classifier for positive-unlabeled learning via weighted integral probability metric

Machine Learning - We consider the problem of learning a binary classifier from only positive and unlabeled observations (called PU learning). Recent studies in PU learning have shown superior...     

Minimization of mixed-color image noise caused by shape error of polygonal mirror in color-laser printing system

Microsystem Technologies - A color-laser printing system consisting of a tandem laser scanning unit uses four laser diodes and a single polygonal mirror (PM) to expose light onto four...     

Precise Extraction of Charge Carrier Mobility for Organic Transistors

Unreliable mobility values, and particularly greatly overestimated values and severely distorted temperature dependences, have recently hampered the development of the organic transistor field. Given that organic field‐effect transistors (OFETs) have been routinely used to evaluate mobility, precise parameter extraction using the electrical properties of OFETs is thus of primary importance. This review examines the origins of the various mobilities that must be determined for OFET applications, the relevant extraction methods, and the data selection limitations, which help in avoiding conceptual errors during mobility extraction. For increased precision, the review also discusses device fabrication considerations, calibration of both the specific gate‐dielectric capacitance and the threshold voltage, the contact effects, and the bias and temperature dependences, which must actually be handled with great care but have mostly been overlooked to date. This review serves as a systematic overview of the OFET mobility extraction process to ensure high precision and will also aid in improving future research.