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Jelmakas E. Kadys A. Dmukauskas M. Grinys T. Tomašiūnas R. Dobrovolskas D. Gervinskas G. Juodkazis S. Talaikis M. Niaura G. 《Journal of Materials Science: Materials in Electronics》2021,32(11):14532-14541
Journal of Materials Science: Materials in Electronics - A systematic study of the GaN epitaxial lateral overgrowth (ELO) of the focused ion beam (FIB) patterned sapphire substrate is presented.... 相似文献
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