The diamagnetic current limit in the steady state MIGMA

The diamagnetic field produced by the ions circulating in the MIGMA fusion reactor has been discussed for the case of a ring magnet. An expression for the diamagnetic current and its distribution in the magnet gap has been derived in terms of the basic MIGMA parameters. It is shown, with the magnet code POISSON, that the diamagnetic field can be substantially reduced and the usable central ion density can be exceeded by one order of magnitude with the aid of correction coils which carry opposite currents and are located in the magnet gap close to the region where the diamagnetic currents are flowing.     

Area and power delay product efficient level restored hybrid full adder (LR-HFA)

Analog Integrated Circuits and Signal Processing - Full adder circuit is a ubiquitous building block in VLSI systems and application specific integrated circuits. This article presents an area and...     

Finite Element Modeling of Magnetic Flux Leakage from Metal Loss Defects in Steel Pipeline

Journal of Failure Analysis and Prevention - Magnetic flux leakage is a nondestructive method for inspection of steel pipelines carrying petroleum products, and is most widely used technique. The...     

Erratum to: Finite Element Modeling of Magnetic Flux Leakage from Metal Loss Defects in Steel Pipeline

Journal of Failure Analysis and Prevention -     

Middleware benchmarking: approaches,results, experiences

The report summarizes the results of the Workshop on Middleware Benchmarking held during OOPSLA 2003. The goal of the workshop was to help advance the current practice of gathering performance characteristics of middleware implementations through benchmarking. The participants of the workshop have focused on identifying requirements of and obstacles to middleware benchmarking and forming a position on the related issues. Selected requirements and obstacles are presented, together with guidelines to adhere to when benchmarking, open issues of current practice, and perspectives on further research. Copyright © 2005 John Wiley & Sons, Ltd.