A note on the time travel approach for handling time windows in vehicle routing problems

In this paper, we identify two cases in which the proposition for calculating time window penalties presented in Nagata, Y., Bräysy, O. and Dullaert, W. A penalty-based edge assembly memetic algorithm for the vehicle routing problem with time windows, Computers & Operations Research 2010;37(4): 724–37 yields incorrect results. We derive the corrected proposition and use numerical studies to show that a significant proportion of the evaluations performed by a Tabu Search for VRPTW falls under the two incorrect cases. Moreover, we demonstrate that the incorrect time window handling has a significant negative impact on the solution quality of the Tabu Search.     

RS与STBC级联编码的可见光MIMO系统

针对采用空时分组编码(Space-Time Block Coding, STBC)的多输入多输出(Multiple-Input Multiple-Output, MIMO)可见光通信(Visible Light Communications, VLC)系统复杂度和天线数难以平衡的问题,为了在一定天线数的条件下获得更多的编码增益,结合正交设计的思路,设计了适合于多阵列协同信息传输的STBC编解码方案,并将RS(Reed-Solomon)码作为外码,STBC编码作为内码,设计了RS-STBC串行级联编码的VLC-MIMO通信系统。仿真和分析表明,该级联系统在天线数较小的条件下能够弥补STBC编码在编码增益上的损失,系统的误码率性能得到了进一步提升,且系统具有较高的可靠性。     

Energy yield prediction errors and uncertainties of different photovoltaic models

Mathematical, empirical, and electrical models have long been implemented and used to predict the energy yield of many photovoltaic (PV) technologies. The purpose of this paper is to compare the annual DC energy yield prediction errors of four models namely the single‐point efficiency, single‐point efficiency with temperature correction, the Photovoltaic for Utility‐Scale Applications (PVUSA), and the one‐diode model, against outdoor measurements for different grid‐connected PV systems in Cyprus over a 4‐year evaluation period. The different models showed a wide variation of prediction errors, demonstrating a strong dependence between model performance and the different technologies. In particular, it was clearly shown that the application of temperature loss correction based on the manufacturer's temperature coefficients of power at maximum power point assisted in improving the energy yield prediction significantly especially for the crystalline silicon (c‐Si) technologies. In most cases, the best agreement between the modeled results and outdoor‐measured annual DC energy yield for mono‐crystalline silicon (mono‐c‐Si) and multi‐crystalline silicon (multi‐c‐Si) technologies was obtained using the one‐diode model. The energy yield for the thin‐film technologies was more accurately predicted using the PVUSA model with the exception of the copper‐indium‐gallium‐diselenide (CIGS) technology, which was best predicted using the single‐point efficiency with temperature correction and one‐diode models, thus demonstrating similar physical properties to c‐Si technologies. The paper further quantifies the combined uncertainties associated with the predicted energy yield as a function of the input parameters for the single‐point efficiency, single‐point efficiency with temperature correction, and the PVUSA models. Copyright © 2011 John Wiley & Sons, Ltd.     

Seven matched bolometers for millimeter wave observations

We have fabricated a millimeter wave observation system using an array of bolometric detectors. The performance of the system depends largely on obtaining identical performance from each bolometer. We achieved a variance in the responsivity of less than 4% except for one of the seven elements. The bolometers had an electrical NEP of 1.3×10^?16 W/√Hz under radiation background loading of 30pW. We used an AC bridge readout circuit to significantly improve the stability of the array and showed that observations can be done without a mechanical beam switch. The bolometer array is now in use on the Nobeyama 45-m telescope for 150GHz observations.     

Modeling and estimation of single evoked brain potential components

Presents a novel approach to solving the single-trial evoked-potential estimation problem. Recognizing that different components of an evoked potential complex may originate from different functional brain sites and can be distinguished according to their respective latencies and amplitudes, the authors propose an estimation approach based on identification of evoked potential components on a single-trial basis. The estimation process is performed in 2 stages: first, an average evoked potential is calculated and decomposed into a set of components, with each component serving as a subtemplate for the next stage; then, the single measurement is parametrically modeled by a superposition of an emulated ongoing electroencephalographic activity and a linear combination of latency and amplitude-corrected component templates. Once optimized, the model provides the 2 assumed signal contributions, namely the ongoing brain activity and the single evoked brain response. The estimator's performance is analyzed analytically and via simulation, verifying its capability to extract single components at low signal-to-noise ratios typical of evoked potential data. Finally, 2 applications are presented, demonstrating the improved analysis capabilities gained by using the proposed approach. The first application deals with movement related brain potentials, where a change of the single evoked response due to external loading is detected. The second application involves cognitive event-related brain potentials, where a dynamic change of 2 overlapping components throughout the experimental session is detected and tracked     

Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate the pre-charge and equalization at a certain voltage level, in general Vdd, of all the couples of bit lines of the memory array. This action is essential in order to ensure correct read operations. We have analyzed the impact of resistive-opens placed in different locations of these circuits. Each defect studied in this paper disturbs the pre-charge circuit in a different way and for different resistive ranges, but the produced effect on the normal memory action is always the perturbation of the read operations. This faulty behavior can be modeled by Un-Restored Write Faults (URWFs) and Un-Restored Read Faults (URRFs), because there is an incorrect pre-charge/equalization of the bit lines after a write or read operation that disturbs the following read operation. In the last part of the paper, we demonstrate that the test of URWFs is more effective in terms of resistive defect detection than that of URRFs and we list the necessary test conditions to detect them.

Method for Processing Metal-Reinforced Ceramic Composites

A new process is developed to form a ceramic containing a three-dimensional network of metal reinforcement. The process involves four steps: (1) forming a powder compact containing a continuous network of either organic or carbon material by pressure filtration, (2) pyrolyzing the network to form channels within the powder compact, (3) densifying the powder while retaining the channel network, and (4) intruding metal into the channel network by squeeze casting. Pressure filtration is used to form the powder compact containing the pyrolyzable network either by mixing slurries of powder with chopped fiber or by packing powder within pyrolyzable preforms. When pressure is removed after filtration, the differential strain recovery of the powder matrix relative to the organic material can cause damage. Such damage is prevalent for a powder matrix formed from flocced slurries. However, this problem is avoided by using dispersed slurries which produce consolidated bodies that alleviate stresses arising from differential strain recovery by viscous flow. Metal-reinforced ceramic composites with different reinforcement architectures, volume fractions, and sizes can be produced with this technique.     

Autonomously Self‐Reporting Hard Coatings: Tracking the Temporal Oxidation Behavior of TiN by In Situ Sheet Resistance Measurements

Monitoring the structural health and integrity of coated components is of vital importance to increase their lifetime and the overall sustainability of the targeted applications. Here, the temporal oxidation behavior of TiN thin films is tracked using in situ sheet resistance measurements. Based on correlative film morphology, structure, and local composition data, it is evident that observed resistance changes are caused by oxidation of TiN. Thickness measurements of the remaining TiN under the oxide layer are in very good agreement with thicknesses deduced from in situ sheet resistance measurements. Hence, the in situ measured sheet resistance is an autonomous self‐reporting property useful for tracking the temporal oxidation behavior of TiN coatings.     

Overcoming selective ensemble averaging: unsupervised identification of event-related brain potentials

We present a novel approach to the problem of event-related potential (ERP) identification, based on a competitive artificial neural network (ANN) structure. Our method uses ensembled electroencephalogram (EEG) data just as used in conventional averaging, however without the need for a priori data subgrouping into distinct categories (e.g., stimulus- or event-related), and thus avoids conventional assumptions on response invariability. The competitive ANN, often described as a winner takes all neural structure, is based on dynamic competition among the net neurons where learning takes place only with the winning neuron. Using a simple single-layered structure, the proposed scheme results in convergence of the actual neural weights to the embedded ERP patterns. The method is applied to real event-related potential data recorded during a common odd-ball type paradigm. For the first time, within-session variable signal patterns are automatically identified, dismissing the strong and limiting requirement of a priori stimulus-related selective grouping of the recorded data. The results present new possibilities in ERP research.