Pd-Ge contact to n-GaAs with the TiW diffusion barrier

Pd-Ge based ohmic contact to n-GaAs with a TiW diffusion barrier was investigated. Electrical analysis as well as Auger electron spectroscopy and the scanning electron microscopy were used to study the contact after it was subjected to different furnace and rapid thermal annealing and different aging steps. All analyses show that TiW can act as a good barrier metal for the Au/Ge/Pd/n-GaAs contact system. A value of 1.45 × 10⁻⁶ Ω-cm² for the specific contact resistance was obtained for the Au/TiW/Ge/Pd/n-GaAs contact after it was rapid thermally annealed at 425°C for 90 s. It can withstand a thermal aging at 350°C for 40 h with its ρ_c increasing to 2.94 × 10⁻⁶Ω-cm² and for an aging at 410°C for 40 h with its ρ_c increasing to 1.38 × 10⁻⁵ Ω-cm².     

Evaluation of absorption and emission cross sections of Er-dopedLiNbO3 for application to integrated optic amplifiers

The polarization-dependent absorption and emission spectra of the ⁴I_13/2-⁴I_15/2 transition (λ~1.5 μm) in single crystal bulk Er:LiNbO₃ have been measured. Low-temperature (10 K) measurements of the Stark split energy levels of these two manifolds indicate at least two Er³⁺ sites. McCumber theory is applied to determine the Er:LiNbO₃ absorption and emission cross sections. These values are used to calculate the gain characteristics of Er:LiNbO₃ channel waveguides. Calculations indicate that a gain of 10 dB is achievable in a waveguide of several centimeters using ~20-mW pump power     

我国压铸行业及压铸机制造业的情况介绍

压力铸造（简称压铸）是金属成型技术中的一种。由于压铸生产技术的生产效率高、产品质量好、经济效益好，因此，用压铸方法生产出的零件（即压铸件）得到广泛的应用，遍及各个工业领域。其中，汽车和摩托车等交通工具作为支柱产业成为压铸零件的最大用户。航空、航天、兵器、电子等工业都是压铸零件的重要用户；还有五金、灯具、玩具、家电、电动及风动工具等行业也都大量地加以采用。     

An efficient BIST method for non-traditional faults of embedded memory arrays

In this work, a built-in self-testing (BIST) method is proposed to detect nontraditional faults of embedded memory arrays for a system-on-chip (SoC) design. The nontraditional faults include single-cell read-sensitive faults and read coupling faults. The BIST method can efficiently deal with embedded memory arrays spatially distributed on the entire SoC chip. The concept of redundant read-write operations is applied to detect all embedded memory arrays with different sizes simultaneously. The redundant operations do not affect the fault coverage of all nontraditional faults discussed in this paper. The method has the advantages of low hardware overhead, short test time, and high fault coverage for nontraditional memory defects.     

精馏塔静态仿真：Ⅰ.静动态混合数学模型的应用

本文为了克服精馏塔静态仿真不易收敛和初值难以给定等难题，巧妙地利用隐含数值积分方法的特点，将稳态与动态数学模型耦合起来，用以求解高难度的非理想精馏塔静态仿真问题。所得静动态混俣模型大大提高了精馏塔静态仿真的鲁棒性，对于高度非理想精馏塔的仿真尤为有效。通过对某丙烯腈萃取精馏塔的静态仿真，充分证明了这种混合模型化方法的可行性。     

Purification and renaturation of recombinant human lymphotoxin (tumour necrosis factor beta) expressed in Escherichia coli as inclusion bodies

High level expression of recombinant human tumour necrosis factor β (rh TNF-β) in Escherichia coli results in the formation of two portions of protein, namely soluble active protein and insoluble protein which is inactive and aggregates in the form of inclusion bodies (IBs). In this study, a procedure for purification and renaturation of rh TNF-β from inclusion bodies has been designed and verified experimentally with a product purity of more than 90% and a recovery of about 30%. The procedure includes washing of IBs with specific wash buffer (Triton X-100/EDTA/lysozyme/PMSF), their solubilization with 8 mol dm^?3 alkaline urea, purification with ion-exchange columns, refolding with renaturation buffer and finally concentration and desalination with an ultrafiltration membrane. The characteristics of the renatured protein were identical with those of purified protein from the soluble fraction as demonstrated by (1) SDS-PAGE, (2) cytotoxic activity on mouse L929 cells, (3) N-terminal amino acid sequence, and (4) gel filtration chromatography.     

TEM method for rapid and precise evaluation of continuous recrystallization

With the aid of a double-tilt holder in a transmission electron microscope, a new method for a rapid and precise determination of the misorientations of a large number of subgrain or grain boundaries is given in this article. By use of the method, the continuous recrystallization can be rapidly and precisely evaluated when compared to the other conventional methods.