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排序方式: 共有9611条查询结果,搜索用时 8 毫秒
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Joseph Berry Tonio Buonassisi David A. Egger Gary Hodes Leeor Kronik Yueh‐Lin Loo Igor Lubomirsky Seth R. Marder Yitzhak Mastai Joel S. Miller David B. Mitzi Yaron Paz Andrew M. Rappe Ilan Riess Boris Rybtchinski Oscar Stafsudd Vladan Stevanovic Michael F. Toney David Zitoun Antoine Kahn David Ginley David Cahen 《Advanced materials (Deerfield Beach, Fla.)》2015,27(35):5102-5112
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Jason K. Freels Joseph J. Pignatiello Richard L. Warr Raymond R. Hill 《Quality and Reliability Engineering International》2015,31(5):789-800
Test planners have long sought the ability to incorporate the results of highly accelerated life testing (HALT) into an early estimate of system reliability. While case studies attest to the effectiveness of HALT in producing reliable products, the capability to translate the test's limited failure data into a meaningful measure of reliability improvement remains elusive. Further, a review of quality and reliability literature indicates that confusion exists over what defines a HALT and how HALT differs from quantitative accelerated life testing methods. Despite many authors making a clear distinction between qualitative and quantitative accelerated life tests, an explanation as to why this delineation exists cannot be found. In this paper, we consider an exemplary HALT composed of a single stressor to show that the HALT philosophy precludes the estimation of a system's hazard rate function parameters because of the test's fix implementation strategy. Four common accelerated failure data analysis methods are highlighted to show their limitations with respect to estimating reliability from HALT data. Finally, a modified accelerated reliability growth test is proposed as a way forward for future research in HALT scenarios to characterize the risk of attaining a reliability requirement and improve parameter estimation. Copyright © 2014 John Wiley & Sons, Ltd. 相似文献
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Metal–Organic Frameworks: Biomimetic Replication of Microscopic Metal–Organic Framework Patterns Using Printed Protein Patterns (Adv. Mater. 45/2015) 下载免费PDF全文
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Joseph Buch 《Architectural Theory Review》2013,18(2):127-128
Francis Strauven. Aldo van Eyck: The Shape of Relativity, Amsterdam: Architecture & Natura, 1998. Vincent Ligtelijn. Aldo van Eyck, Works (trans. Gregory Ball), Boston: Birkhauser, Verlag, 1999. 相似文献
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Akshay V. Joshi Christoph Dettke Joseph Steingraeber 《Journal of Coatings Technology and Research》2016,13(2):375-383
Gravure is a high throughput printing process, normally associated with speed, quality, and long print runs. It is widely used for printing on shrink films and other substrates. The shrink films, in particular, polyvinyl chloride (PVC) and glycol-modified polyethylene terephthalate (PET-G), are two dominant substrates widely consumed and printed by gravure process. The PVC and PET-G offer different properties which greatly influence the printability. The surface energy of the substrate determines the adhesion and wettability of ink, while electrical properties such as surface and volume resistivity impact electrostatic assist (ESA) performance. The introduction of ESA in gravure further improved the print quality by eliminating dot skips with reduced impression pressure. However, print defects such as print mottle is inevitable. Print mottle occurs due to a discrepancy between substrate, ink, and process parameters which degrade the print quality. These complexities need to be addressed to deliver higher productivity with less print waste. Therefore, the study investigates the effect of process parameters, i.e., substrate type, line screen, air gap (distance between charge bar and impression roller), viscosity, voltage, and speed, and aims to quantify their effect numerically on defect minimization. The Design of Experiments (DOE) was generated for the above-mentioned parameters and analyzed to extract the best combination of process parameters. The optimized setting showed a reduction in solid mottle by 54% and 57% for PET-G and PVC, respectively. 相似文献
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