DZX-2B型电子学综合实验装置常见故障与分析

介绍DZX-2B综合实验装置的组成、常见故障，及如何快速、准确的判断并排除故障的方法。     

Hot rolling of precision ring forgings

Translated from Khimicheskoe i Neftyanoe Mashinostroenie, No. 11, pp. 33–35, November, 1992.     

Efficiency improvement of near-ultraviolet InGaN LEDs using patterned sapphire substrates

The use of conventional and patterned sapphire substrates (PSSs) to fabricate InGaN-based near-ultraviolet (410 nm) light-emitting diodes (LEDs) was demonstrated. The PSS was prepared using a periodic hole pattern (diameter: 3 /spl mu/m; spacing: 3 /spl mu/m) on the (0001) sapphire with different etching depths. From transmission-electron-microscopy and etch-pit-density studies, the PSS with an optimum pattern depth (D/sub h/=1.5 /spl mu/m) was confirmed to be an efficient way to reduce the thread dislocations in the GaN microstructure. It was found that the output power increased from 8.6 to 10.4 mW, corresponding to about 29% increases in the external quantum efficiency. However, the internal quantum efficiency (@ 20 mA) was about 36% and 38% for the conventional and PSS LEDs, respectively. The achieved improvement of the output power is not only due to the improvement of the internal quantum efficiency upon decreasing the dislocation density, but also due to the enhancement of the extraction efficiency using the PSS. Finally, better long-time reliability of the PSS LED performance was observed.     

中小企业创业资源的形成机制研究

创业资源是创业的基础,创业过程的规律性和市场配置资源的基础作用影响和决定中小企业创业资源的内在功能和形成方式。对中小企业资源的形成机制进行了分析探讨,并分析了它们之间的内在关系。     

虚拟仪器在教学中的应用

主要介绍了Multisim2001中虚拟仪器库中函数发生器、示波器的使用方法及功能；并在Multisim2001环境中仿真单管放大电路、桥式整流滤波电路。由调试结果，分析了其在教学中应用的可行性。     

巧点火锅鸳鸯谱

北风起．火锅热。户外寒气逼人，屋内热气腾腾．鲜红的肉片。翠生生的青菜．在或红或白滚烫的锅中上下飞舞，仅是这灵动的姿态就让人禁受不住媚惑，抬手、举箸．一番狼吞虎咽，于是热气从心底缓缓升起，寒冷顿时一扫而空。[编者按]     

MOS RF reliability subject to dynamic voltage stress-modeling and analysis

Dynamic stress on MOSFETs with 900-MHz inverter-like waveforms as well as static (or dc) stress were evaluated experimentally. It showed that the degradation due to dynamic stress is less than that of dc stress for our test transistors. A compact model is used to evaluate the degradation in radio frequency performances, such as transconductance, cutoff frequency, linearity, and noise figure. A class-AB power amplifier is presented as an example to demonstrate the effect of dynamic stress on RF circuit performance.