全文获取类型
收费全文 | 120573篇 |
免费 | 9604篇 |
国内免费 | 4894篇 |
专业分类
电工技术 | 6603篇 |
技术理论 | 15篇 |
综合类 | 7433篇 |
化学工业 | 20499篇 |
金属工艺 | 6677篇 |
机械仪表 | 7022篇 |
建筑科学 | 9090篇 |
矿业工程 | 3518篇 |
能源动力 | 3531篇 |
轻工业 | 8914篇 |
水利工程 | 2127篇 |
石油天然气 | 7321篇 |
武器工业 | 908篇 |
无线电 | 13806篇 |
一般工业技术 | 14621篇 |
冶金工业 | 6348篇 |
原子能技术 | 1333篇 |
自动化技术 | 15305篇 |
出版年
2024年 | 536篇 |
2023年 | 2011篇 |
2022年 | 3620篇 |
2021年 | 5070篇 |
2020年 | 3835篇 |
2019年 | 3172篇 |
2018年 | 3631篇 |
2017年 | 3845篇 |
2016年 | 3611篇 |
2015年 | 4699篇 |
2014年 | 5936篇 |
2013年 | 6899篇 |
2012年 | 7472篇 |
2011年 | 8180篇 |
2010年 | 6989篇 |
2009年 | 6498篇 |
2008年 | 6393篇 |
2007年 | 6081篇 |
2006年 | 6093篇 |
2005年 | 5285篇 |
2004年 | 3635篇 |
2003年 | 3187篇 |
2002年 | 2966篇 |
2001年 | 2523篇 |
2000年 | 2855篇 |
1999年 | 3435篇 |
1998年 | 2856篇 |
1997年 | 2384篇 |
1996年 | 2349篇 |
1995年 | 2004篇 |
1994年 | 1674篇 |
1993年 | 1146篇 |
1992年 | 899篇 |
1991年 | 683篇 |
1990年 | 573篇 |
1989年 | 500篇 |
1988年 | 391篇 |
1987年 | 262篇 |
1986年 | 203篇 |
1985年 | 144篇 |
1984年 | 115篇 |
1983年 | 80篇 |
1982年 | 82篇 |
1981年 | 62篇 |
1980年 | 51篇 |
1979年 | 19篇 |
1978年 | 13篇 |
1977年 | 19篇 |
1976年 | 27篇 |
1974年 | 13篇 |
排序方式: 共有10000条查询结果,搜索用时 15 毫秒
31.
The effect of the atomic mobility on a film surface has been studied by using a three-dimensional atomistic thin-film deposition model which simulates three-dimensional thin-film images, surface profiles and cross-sectional area pictures. In addition, quantitative results of surface RMS roughness, average film thickness, atomic coordination number and its distribution, and solid fraction of the deposited thin films, were obtained from the simulations. When the film surface mobility increased from 0.3 to 3.0, RMS roughness decreased from 6.5 to 1.1, solid fraction increased from 0.27 to 0.56 and average film thickness decreased from 40 to 28, due to the reduction of the voids within the film. The full-width half magnitude of the atomic coordination distribution became narrower indicating the increased degree of crystallization. With increase in surface mobility crossing the boundary to 1.5, the film evolved from a porous or loose columnar structure with voids, to a densely packed fibrous grain structure which can be categorized by the zone structure models. 相似文献
32.
33.
本文讨论了用辉光放电法制备氮化硅薄膜时衬底温度、射频功率和气体流量比对薄膜的电导率、介电常数和击穿强度的影响。通过优化生长条件,制备了优质非晶氮化硅薄膜,其介电常数为7.5、击穿强度为5.5MV/cm、电导率为10-13(Ωcm)-1。 相似文献
34.
35.
2,3,4- or 2,3,5-trisubstituted furans were highly regioselectively formed from the cycloisomerization reaction of the same starting cyclopropenes 1 via the subtle choice of the transition metal halides. Under the catalysis of 5 mol % PdCl2(CH3CN)2, 2,3,5-trisubstituted furans 2 were given in 50-88% yields with 95-99% regioselectivities, while 2,3,4-trisubstituted furans 3 were formed in 78-96% yields with 99% regioselectivities under the catalysis of 5 mol % CuI. 相似文献
36.
37.
38.
An extended analysis of ground impedance measurement using the fall-of-potential method will be presented. An interesting curve that represents the exact locations of the potential probe when the potential and current probes are in different directions is obtained for the first time. Curves representing measurement error are also presented for the case when the potential probe is placed in locations where the correct ground impedance cannot be measured. A similar analysis for ground impedance measurements in multilayer soils is also discussed. The study presented in this paper has extended the theory of the conventional fall-of-potential method and the results obtained can serve as a practical guide for ground impedance measurements made using this method. 相似文献
39.
40.
Lada E.K. Jye-Chyi Lu Wilson J.R. 《Semiconductor Manufacturing, IEEE Transactions on》2002,15(1):79-90
To detect faults in a time-dependent process, we apply a discrete wavelet transform (DWT) to several independently replicated data sets generated by that process. The DWT can capture irregular data patterns such as sharp "jumps" better than the Fourier transform and standard statistical procedures without adding much computational complexity. Our wavelet coefficient selection method effectively balances model parsimony against data reconstruction error. The few selected wavelet coefficients serve as the "reduced-size" data set to facilitate an efficient decision-making method in situations with potentially large-volume data sets. We develop a general procedure to detect process faults based on differences between the reduced-size data sets obtained from the nominal (in-control) process and from a new instance of the target process that must be tested for an out-of-control condition. The distribution of the test statistic is constructed first using normal distribution theory and then with a new resampling procedure called "reversed jackknifing" that does not require any restrictive distributional assumptions. A Monte Carlo study demonstrates the effectiveness of these procedures. Our methods successfully detect process faults for quadrupole mass spectrometry samples collected from a rapid thermal chemical vapor deposition process 相似文献