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Ronghui QUE 《中国光电子学前沿》2011,(2)
Large-scale, high-purity and uniform silver orthophosphate (Ag3PO4) nanowires had been synthesized by a facile hydrothermal method without employing any surfactants or templates for the first time. The nanowires were single-crystalline with lengths up to several micrometers. X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and high-resolution transmission electron microscopy were used to characterize the morphology and structure of the as-prepared products. The as-prepared Ag3PO4 nanowires exhibited linear current-voltage (Ⅰ-Ⅴ) characteristics and excellent photoresponse. As the light was switched on and off, the currents could be reversibly switched between high and low value at the voltage of 0.1 V, which will find wide application in optoelectronic nanodevices. 相似文献
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Yang Hui Chen Lianghui Zhang Shuming Chong Ming Zhu Jianjun Zhao Degang Ye Xiaojun Li Deyao Liu Zongshun Duan Lihong .. 《半导体学报》2005,26(2):414-417
Studies on first GaN-based blue-violet laser diodes(LDs) in China mainland are reported.High quality GaN materials as well as GaN-based quantum wells laser structures are grown by metal-organic chemical vapor deposition method.The X-ray double-crystal diffraction rocking curve measurements show the fullwidth half maximum of 180″ and 185″ for (0002) symmetric reflection and (10-12) skew reflection,respectively.A room temperature mobility of 850cm2/(V·s) is obtained for a 3μm thick GaN film.Gain guided and ridge geometry waveguide laser diodes are fabricated with cleaved facet mirrors at room temperature under pulse current injection.The lasing wavelength is 405.9nm.A threshold current density of 5kA/cm2 and an output light power over 100mW are obtained for ridge geometry waveguide laser diodes. 相似文献
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硝酸盐作为酸法地浸氧化剂的研究 总被引:3,自引:0,他引:3
硝酸盐作为酸法地浸采铀氧化剂的研究结果表明 ,硝酸根可有效地氧化地浸吸附尾液中的Fe2 ,但其动力学性能较 H2 O2 差 ;硝酸根能有效氧化浸出矿石中难溶的四价铀。硝酸盐作为浸出氧化剂 ,能满足地浸工艺的需要 相似文献
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Weitao Jiang Hongzhong Liu Yucheng Ding Yongsheng Shi Lei Yin Bingheng Lu 《Microelectronic Engineering》2009,86(12):2412-2416
In order to prepare large area micropatterns with certain profile (certain aspect ratio) on kinds of substrates, especially on flexible substrate, a novel roller-reversal imprint (RRI) process is proposed, which starts with pattern coating of an ink (mostly a liquefied electronics materials, such as a semiconductor polymer) on a mould roller and ends with transferring the ink already patterned on the roller to the substrate. One of the critical challenges in RRI process is ensuring ink pattern coating and full filling to the microcavities on mould roller, which is one of the preconditions to achieve the pattern transferred on substrate with precise profile. In this paper, an ink coating model is established to reveal the ink filling situations versus different profile of microcavities on mould roller. Simulations show that, in the coating process, as the contact angle of ink on mould increasing, three basic filling situations, i.e., full filling, partial filling, and non-filling, will occur. In order to demonstrate the requirement of full filling, critical contact angle for full filling is proposed to distinguish the full filling and partial filling, and it is deeply dependant on the cross-sectional parameters (such as linewidth and the aspect ratio) of microcavities on mould roller. The critical contact angle is the watershed between full filling and partial filling, so it can be used as a guideline to choose the appropriate match between the surface energy of ink and mould to achieve full filling in RRI process. Experiments prove that the ink filling model and its simulation results are basically right, the cross-sectional parameters of microcavities on mould play great important roles to the critical contact angle, and only when the actual contact angle is smaller than the corresponding critical value, full filling can be obtained. 相似文献
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This paper proposes a closed-form distributed passive source localisation method using time difference of arrival (TDOA) and gain ratios of arrival (GROA) measurements. After removing the unknown parameters in TDOA equations by using GROA measurements, the proposed method applies two-step weighted least-square (LS) minimisations. First, the TDOA and GROA equations are transformed into a set of pseudo-linear equations by introducing additional parameters, and a weighted LS estimation is used to obtain a rough estimate; secondl, this method exploits additional parameters to refine the estimate through another weighted LS estimation. The application of weighting matrix leads to an approximate maximum likelihood estimator and produces a substantial improvement in source localisation accuracy. Both the theoretical analysis and simulation results indicate that the proposed method can achieve the Cramer–Rao Lower Bound at a moderate noise level and outperform the existing methods in terms of localisation accuracy. 相似文献
30.
电荷耦合器件(CCD)多晶硅交叠区域绝缘介质对成品率和器件可靠性具有重要的影响。将氮化硅和二氧化硅作为CCD多晶硅层间复合绝缘介质,采用扫描电子显微镜(SEM)和电学测试系统研究了多晶硅层间氮化硅和二氧化硅复合绝缘介质对CCD多晶硅栅间距和多晶硅层间击穿电压的影响。研究结果表明,多晶硅层间复合绝缘介质中的氮化硅填充了多晶硅热氧化层的微小空隙,可以明显改善绝缘介质质量。多晶硅层间击穿电压随着氮化硅厚度的增加而增大,但太厚的氮化硅会导致CCD暗电流明显增大。由于复合绝缘介质质量好,可以减小CCD多晶硅的氧化厚度。 相似文献