Reliability and performance analysis of time – space – time switching networks with multiple separated space switches

Since electronic switching systems usually require very strict reliability requirements as well as good performance objectives, we need to jointly analyse the performance and reliability of switching systems. In this paper, we compare conventional time–space–time switches with single space switches with those with multiple separated space switches, from the viewpoints of reliability and performance. We consider time–space–time switching networks which consist of N incoming time switches, i.e. one NxN space switch, two (N/2)x(N/2) space switches, and four (N/4)x(N/4) space switches. We introduce a Markov reliability model to study the effect of failures and analyse the reliability and performance of three different types of switching networks in terms of average blocking probability and the mean time to unreliable operation, as we vary the offered traffic. As a result, T–S–T switching networks with multiple separated space switches exhibit better performance and reliability than those with single space switches.     

Self-aligned offset gated poly-Si TFTs with a floating sub-gate

We have fabricated a self-aligned offset-gated poly-Si thin film transistor (TFT) by employing a novel photoresist reflow process. The gate structure of the new device is consisted of two unique patterns: A main-gate and a sub-gate. The new fabrication method extends the gate-oxide over the offset region. With the assistance of the sub-gate and reflowed photoresist a self-aligned offset region is successfully obtained due to the offset oxide acting as an implantation mask. The poly-Si TFT with symmetrical offsets is easily fabricated and the new method does not require any additional offset mask step. Compared with the misaligned offset gated poly-Si TFTs, excellent symmetric electrical characteristics are obtained     

信集闭系统进路数学模型及进路连锁表生成判据的研究

本文对信集闻系统中的长进路，进路及进路间的敌对关系等重要概念作了精确定义，并提出了进路的数学模型以及进路连锁表的生成判据。     

CIMS装配和拆卸生产线的可靠性分析

本文对ＣＩＭＳ装配线和拆卸线的可靠性问题进行研究。文中分析了它们的运行状况，求出了两种生产线的稳态可用度，并用一个例子加以说明。     

非串行生产线的建模,分析及设计

本文利用等效工作站理论和工件流平衡原理，推导出非串行离散事件生产线可以等价于串联系统，并归结为装配和拆卸两条定理，解决了系统的建模、分析与设计问题。     

城市道路SMA面层配合比优化的影响因素及对策

以路用性能为控制指标，选择满足技术质量指标要求的原材料，对SMA改性沥青混合料的配合比设计进行优化，以期找到最佳路用性能和经济指标的SMA改性沥青混合料配合比的影响因素及对策。研究表明，对级配和体积指标等满足有关要求的特定原材料，其混合料最优路用性能只有在粗集料形成骨架嵌挤密实稳定，其空隙恰好被细集料等组成的胶结料所填充时，即VCADRC-VCAmix值趋向于0（＋）才充分体现出来；同时，在满足各项控制指标的前提下，可以通过适当增大2.36mm集料通过率来进一步提高混合料的抗车辙和稳定性能。     

热泵型一拖二变频空调器的开发

将国内外最新的变容量控制、电子膨胀阀控制、室内外机独立解耦控制和智能旁通除霜控制等控制方法与计算机仿真优化设计应用于热泵型变频一拖二空调系统的开发,给出了系统的原理、结构,并进行了实验研究。结果表明,系统运行稳定可靠,性能系数达到国内同类产品的领先水平,并超过了国家单元分体热泵空调器的节能标准。也为多元变容量空调系统奠定了理论与实验基础。     

落脚河水电站引水发电系统的调节保证计算分析

水轮发电机组在运行中遇到启动、正常停机、增减负荷、事故甩负荷等工况变化时，经常会引起引水发电系统的水力过渡过程，所以在设计中必须通过调节保证计算以选择合适的导叶调节规律及其调节时间，从而优化压力引水系统的运行工况，使水电站的水工建筑物布置既经济合理又安全可靠。     

深斜井永久式封隔器两种套铣方式风险分析与优化措施

在深斜井大修作业中,为了适应海上修井机作业能力的需要,需要处理井下永久式封隔器。采用磨铣方式处理难度大、周期长、费用高,因此通常采取套铣方式,仅将可钻式永久性封隔器卡瓦及密封套铣掉,再打捞回收或下推至人工井底,直至不妨碍下一步作业。从作业井实际情况出发,针对深斜井永久式封隔器,采用了两种不同动力驱动方式进行套铣处理:一种是地面转盘驱动,井下全部钻具都处于旋转状态,全程摩阻及扭矩大,可以施加较大钻压;另一种为井下马达驱动,即只有马达以下钻具旋转,而马达以上钻具不转,从而降低摩阻,但施加钻压较小,否则容易引起马达失速,所以对马达性能要求较高。通过套铣风险对比分析,分别对两种套铣钻具与参数进行了优化,提出了套铣成功与否的判断依据,为现场应用提供了借鉴。     

Network traffic prediction based on a new time series model

Fast and accurate methods for predicting traffic properties and trend are essential for dynamic network resource management and congestion control. With the aim of performing online and feasible prediction of network traffic, this paper proposes a novel time series model, named adaptive autoregressive (AAR). This model is built upon an adaptive memory‐shortening technique and an adaptive‐order selection method originally developed by this study. Compared to the conventional one‐step ahead prediction using traditional Box–Jenkins time series models (e.g. AR, MA, ARMA, ARIMA and ARFIMA), performance results obtained from actual Internet traffic traces have demonstrated that the proposed AAR model is able to support online prediction of dynamic network traffic with reasonable accuracy and relatively low computation complexity. Copyright © 2005 John Wiley & Sons, Ltd.