On structural and high temperature electrochemical properties of ZrO2 thin film coating on Zr metal produced by carbonate melt

Melt of NaCO₃ can favor oxidation of Zr to form ZrO₂ thin film on Zr surface, which is used to make Zr/ZrO₂ oxidation/reduction electrode of pH sensor for testing elevated temperature aqueous solutions. Using SEM, EPMA, XPS, EXAFS and HRTEM, we found that ZrO₂ film is tightness and solid with 20 μm thickness composed by nanometer-sized monoclinic crystals. Zr/ZrO₂ interface is characterized of zoning structure according to topography and chemical composition in five zones: oxygen-rich ZrO₂, ZrO₂, oxygen-rich Zr metal, oxygen-bearing Zr and Zr from outmost to center. Melt oxidation process of Zr involved oxidation time, air and temperature. The air is important effect on structural and electrochemical properties of ZrO₂ thin film for making elevate temperature electrochemical sensor. If oxygen air largely presented in carbonate melting process, ZrO₂ thin film is not tightness and not for oxidation/reduction electrode.     

Probing the thermal decomposition process of layered double hydroxides through in situ <Superscript>57</Superscript>Fe Mössbauer and in situ X-ray diffraction experiments

The thermal decomposition properties of Mg–Fe hydrotalcites were studied through in situ ⁵⁷Fe Mössbauer spectroscopy and in situ X-ray diffraction. Abrupt changes in the quadrupolar splitting measured in the Mössbauer spectra revealed a phase transition from the starting lamellar structure to a new crystalline arrangement. By analyzing the Mössbauer parameters we show that the material is highly disordered in the 300–400 °C temperature range. This hypothesis is confirmed by the X-ray results whose diffractograms indicated the collapse of the lamellar structure and the formation of a solid solution.     

Repulsive Flux Pinning Force in NbTi/Nb Superconductor/Superconductor Multilayers

Flux pinning characteristics have been investigated for the Nb _x Ti_100-x /Nb(x = 65, 50 and 28) and Nb ₂₈ Ti ₇₂/Nb ₆₅ Ti ₃₅ superconductor(S)/superconductor(S^′) multilayers. The maximum of the pinning force F _{p⊥ max} perpendicular to the layer plane as a function of the structure modulation length λ has a peak in the quasi-two-dimensional region (λ～20 nm). The maximum. values of the F _{p⊥ max} versus λ curve are proportional to the difference of the GL coherence length (ξ _GL ) between the superconductive sublayers S and S^′. The results suggest that the large F _{p⊥ max} in the S/S^′ multilayer is caused by the repulsive pinning force due to Nb layers with larger ξ _GL .