Study of phase equilibria in the Al - Pd - Re system

Scanning and transmission electron microscopy have been combined with x-ray diffraction to examine the phase equilibria in the Al - Pd - Re system at 1000°C for compositions from 50 to 100 at.% Al, and the corresponding isothermal section has been constructed. The binary monoclinic Al₃ Re phase has been observed for the first time. It is confirmed that there is a stable icosahedral phase in this system. The boundaries to its homogeneity region have been determined and the phase equilibria in which it participates.     

Biochemical oxidation of caprolactam-containing wastewater from the production of synthetic fibres

Conclusions The chemical mutagenesis method is recommended for use in local purification installations for cleaning up of caprolactam-containing wastewater.Use of this method permits one to carry out a biochemical clean-up of wastewater having a caprolactam content up to 600 mg/liter while increasing the oxidative power of the aeration tank by a factor of two.Translated from Khimicheskie Volokna, No. 6, p. 46, November–December, 1985.     

Convective transfer processes in chemically stable and reacting liquids with an internal structure

Dynamic processes are studied in media with softly and hardly internal destroyable configurations. A method is examined for the measurement of properties of media with spatial separation of the chemical transformation stages and thermal hydrodynamic measurements.Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 53, No. 5, pp. 781–789, November, 1987.     

Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology

This paper presents results of reliability investigation of 20 V N-Drift MOS transistor in 0.13 μm CMOS technology. Due to high performances required for CMOS applications, adding high voltage devices becomes a big challenge to guarantee the reliability criteria. In this context, new reliability approaches are needed. Safe Operating Area are defined for switch, V_ds limited and V_gs limited applications in order to improve circuit designs. For V_ds limited applications, deep doping dose effects in drift area are investigated in correlation to lifetime evaluations based on device parameter shifts under hot carrier stressing. To further determine the amount and locations of hot carriers injections, accurate 2D technological and electrical simulations are performed and permit to select the best compromise between performance and reliability for N-Drift MOS transistor.     

Fast numerically stable computation of orthogonal Fourier?Mellin moments

An efficient algorithm for the computation of the orthogonal Fourier-Mellin moments (OFMMs) is presented. The proposed method computes the fractional parts of the orthogonal polynomials, which consist of fractional terms, recursively, by eliminating the number of factorial calculations. The recursive computation of the fractional terms makes the overall computation of the OFMMs a very fast procedure in comparison with the conventional direct method. Actually, the computational complexity of the proposed method is linear O(p) in multiplications, with p being the moment order, while the corresponding complexity of the direct method is O(p²). Moreover, this recursive algorithm has better numerical behaviour, as it arrives at an overflow situation much later than the original one and does not introduce any finite precision errors. These are the two major advantages of the algorithm introduced in the current work, establishing the computation of the OFMMs to a very high order as a quite easy and achievable task. Appropriate simulations on images of different sizes justify the superiority of the proposed algorithm over the conventional algorithm currently used     

A direct estimate of JIc from the load versus load-line displacement record

The purpose of this study is to examine the current standard fracture toughness test procedure to determine if there could be an easier method to get a J_Ic value from the test record. The current method for determining J_Ic involves a detailed computational and construction procedure. The objective in this study is to simplify the analysis for the determination of J_Ic. The results of this study show that the load and displacement record for a fracture toughness test can be used to directly estimate a J_Q value, a provisional value for fracture toughness, J_Ic. The J value taken at the maximum load point can be used along with an adjustment factor to estimate a J_Q value. This J_Q estimate is close to the one obtained from the construction procedure of ASTM Standard E 1820. When a unit‐sized specimen is tested, that is, a specimen with a width of 50 mm and a thickness of 25 mm the maximum load point provides a direct estimate of J_Q. Other sizes require a size adjustment factor, which is simply a square root relationship between the width of the test specimen and a unit width. The proposed new method of estimating J_Q is simple in concept and requires a minimum number of calculations. It appears to produce values of J_Q which are comparable to those obtained from the ASTM E1820 construction procedure and may produce less scatter.     

A goal-striving life event and the onset of hypomanic and depressive episodes and symptoms: Perspective from the Behavioral Approach System (BAS) dysregulation theory.

On the basis of the behavioral approach system (BAS) dysregulation theory of bipolar disorder, this study examined the relation between occurrence of a BAS activation-relevant life event--goal striving--and onset of hypomanic and depressive episodes and symptoms. In particular, the authors examined the relation between preparing for and completing final exams (a goal-striving event) and onset of bipolar spectrum episodes and symptoms in college students with bipolar II disorder or cyclothymia (i.e., "soft" bipolar spectrum conditions). One hundred fifty-nine individuals with either a bipolar spectrum disorder (n=68) or no major affective psychopathology (controls; n=91) were further classified on the basis of whether they were college students (i.e., completed final exams). Consistent with the BAS dysregulation theory, preparing for and completing final exams was associated with an increase in hypomanic but not depressive episodes and symptoms in individuals with a soft bipolar spectrum diagnosis. Furthermore, self-reported BAS sensitivity moderated the presence of certain hypomanic symptoms during final exams. (PsycINFO Database Record (c) 2010 APA, all rights reserved)