储层应力敏感性影响因素研究

全面分析储层应力敏感性产生的机理认为，外部因素的改变会引起储层产生应力敏感性．而储层岩石物性等内部因素对应力敏感性的强弱起决定性作用。室内岩心应力敏感性评价时．仪器与设备的精度、加载与卸载方式、实验用流体类型以及各种人为因素等都会对评价结果产生影响，其中岩心密封套在高压、高温条件下的密闭性会对实验结果产生较大影响。所以储层应力敏感性不应该从孔隙度和渗透率的高低进行简单评价，中、高渗储层和低渗储层在生产过程也都可能表现出较强的应力敏感性现象。     

变频电子阻垢技术的工业应用

中国大唐发电有限责任公司徐塘分公司利用变频电磁阻垢技术在4号发电机组循环冷却水系统进行了成功应用.从理论上比较了物理法与化学法水处理技术的差异.工业应用结果表明,变频电磁技术不仅阻垢效果明显,而且具有安装维护简便,适应性广,运行费用低,对水体无污染等特点.可以替代化学阻垢法.     

基于FPGA的序列图像能量累加

低信噪比小目标检测是当前的研究热点,能量积累是其关键技术之一。介绍了两种常用的序列图像能量累加算法：一种是针对帧间运动速度较小的多帧累加；一种是针对帧间运动速度较大的形态膨胀累加。并给出了这两种算法的FPGA实现。实验结果表明,设计的电路运行速度快、占用资源少,具有很强的实用性,并在实际应用中取得了较好的效果。     

500kW／380V国产大功率变频器在钻机上的应用

针对国外变频器价格昂贵、调试周期和维修周期长等特点，我公司自主研发了可替代进口机的高性能钻机国产专用变频器。该变频器能够从零开始调速。当钻井卡钻时，能及时断开电动机，在低速提升时，能最大限度地发挥电动机的动力特性，提供220％的转矩输出。变频器具有易安装、调试、维护，性能稳定。应用中据实测数据显示，采用变频改造后，打1口井可节省柴油15t。     

基于CB的串行口和接口板端口程序应用

串行口及接口板端口是计算机通信的主要途径 ,也是目前计算机工程测控中通用的基本方法。C Builder (简称CB)编程语言以其功能完备、开发效率高的特点而成为目前流行的程序开发工具 ,介绍了利用CB语言编写串行口和端口通信的程序的方法 ,并对具体的各方法编写了相应的示例。     

基于矢量平均的信道估计算法

提出一种适用于DS-CDMA无线通信系统的低计算量而性能良好的信道估计算法。在DS-CDMA系统中，当接收信号经过解扩或多用户检测等时域预处理后，可以认为干扰大大减弱、期望信号在处理后的信号中占主要地位。这样，用预处理后信号相关阵的最大特征值对应的特征矢量可以很好地近似期望信号的信道矢量。但是，直接特征分解需要很大的计算量，特征跟踪计算量较低，但瞬态性能较差。本文提出一种基于相关矩阵列矢量平均的信道估计算法，该算法不需要特征分解或跟踪。仿真结果表明：新算法在降低计算量的情况下可以获得同直接特征分解方法几乎相同的性能。     

Whispering-gallery-like modes in square resonators

The mode frequencies and field distributions of whispering-gallery (WG)-like modes of square resonators are obtained analytically, which agree very well with the numerical results calculated by the FDTD technique and Pade approximation method. In the analysis, a perfect electric wall for the transverse magnetic mode or perfect magnetic wall for the transverse electric mode is assumed at the diagonals of the square resonators, which not only provides the transverse mode confinement, but also requires the longitudinal mode number to be an even integer. The WG-like modes of square resonators are nondegenerate modes with high-quality factors, which make them suitable for fabricating single-mode low-threshold semiconductor microcavity lasers.     

Effects of surface roughness of substrates on the c-axis preferred orientation of ZnO films deposited by r.f. magnetron sputtering

The c-axis preferred orientation of ZnO film is the most important factor for its successful application in piezoelectric devices. The effects of surface roughness of the substrate on the c-axis preferred orientation of ZnO thin films, deposited by radio frequency magnetron sputtering, were investigated. During sputtering, the oxygen content in the argon environment used was varied from 0 to 70% at a total sputtering pressure of 10 mTorr. Very smooth Si, smooth evaporated Au/Si, smooth evaporated-Al/Si, and rough sputtered-Al/Si were used as substrates. Their r.m.s. roughnesses, as measured by atomic force microscopy, were 1.27, 17.1, 21.1 and 65-118 Å, respectively. The crystalline structure and the angular spread of the (0 0* 2) plane normal to the ZnO films were determined using X-ray diffraction and X-ray rocking curves, respectively. The crystallinity and the preferred c-axis orientation of the ZnO films were strongly dependent on the surface roughness of the substrates rather than on the oxygen content of the working environment or on the chemical nature of the substrate.     

不同注F剂量与CMOS运放电路辐照损伤的相关性

在不同注F剂量条件下,对P沟和N沟两种不同差分对输入CMOS运放电路的电离辐照响应进行了研究.分析比较了注F和未注F运放电路电离辐照响应之间的差异.结果表明,在栅场介质注入适量的F,可有效抑制辐照感生的氧化物电荷尤其是界面态的增长,从而提高CMOS运放电路的抗辐照特性.