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11.
M. Jaime-Vasquez M. Martinka R. N. Jacobs M. Groenert 《Journal of Electronic Materials》2006,35(6):1455-1460
A detailed analysis of the As-exposed Si (112) and subsequent Te exposure was performed. X-ray photoelectron spectroscopy
shows that the Te- and As-exposed Si (112) surface had 70% As and 27% Te coverage, respectively. Direct surface coverage measurement
with ion scattering spectroscopy (ISS) shows that the Si (111) surface is completely covered by As, and that of the Si (112)
had about 78% and 20% coverage of As and Te, respectively. Finally, using ISS shadowing effects, it was found that the Te
atoms were positioned mainly on the step edges. 相似文献
12.
This article reviews the early days of an Australian public broadcaster's open studio Web project. It raises important issues for software developers and Web media makers about the need for software and collaborative structures that can facilitate community building in an open and responsive way. This project could be of interest to software developers working in Drupal. 相似文献
13.
R. N. Jacobs E. W. Robinson M. Jaime-Vasquez A. J. Stoltz J. Markunas L. A. Almeida P. R. Boyd J. H. Dinan L. Salamanca-Riba 《Journal of Electronic Materials》2006,35(6):1474-1480
A vacuum-compatible process for carrying out lithography on Hg1−xCdxTe and CdTe films was previously demonstrated. It was shown that hydrogenated amorphous silicon (a-Si:H) could be used as
a dry resist by projecting a pattern onto its surface using excimer laser irradiation and then developing that pattern by
hydrogen plasma etching. Pattern transfer to an underlying Hg1−xCdxTe film was then carried out via Ar/H2 plasma etching in an electron cyclotron resonance (ECR) reactor. Despite the successful demonstration of pattern transfer,
the possibility of inducing harmful effects in the Hg1−xCdxTe film due to this vacuum lithography procedure had not been explored. Here we present structural and surface compositional
analyses of Hg1−xCdxTe films at key stages of the a-Si:H vacuum lithography procedure. X-ray diffraction double crystal rocking curves taken before
and after a-Si:H deposition and after development etching were identical, indicating that bulk structural changes in the Hg1−xCdxTe film are not induced by these processes. Cross-section transmission electron microscopy studies show that laser-induced
heating in the 350 nm thick a-Si:H overlayer is not sufficient to cause structural damage in the underlying Hg1−xCdxTe surface. In vacuo surface analysis via Auger electron spectroscopy and ion scattering spectroscopy suggest that the hydrogen
plasma development process produces Hg-deficient surfaces but does not introduce C contamination. However, after ECR plasma
etching into the Hg1−xCdxTe film, the measured x value is much closer to that of the bulk. 相似文献
14.
Mark A. Lantz Bernd Gotsmann Papot Jaroenapibal Tevis D. B. Jacobs Sean D. O'Connor Kumar Sridharan Robert W. Carpick 《Advanced functional materials》2012,22(8):1639-1645
The search for hard materials to extend the working life of sharp tools is an age‐old problem. In recent history, sharp tools must also often withstand high temperatures and harsh chemical environments. Nanotechnology extends this quest to tools such as scanning probe tips that must be sharp on the nanoscale, but still very physically robust. Unfortunately, this combination is inherently contradictory, as mechanically strong, chemically inert materials tend to be difficult to fabricate with nanoscale fidelity. Here a novel process is described, whereby the surfaces of pre‐existing, nanoscale Si tips are exposed to carbon ions and then annealed, to form a strong silicon carbide (SiC) layer. The nanoscale sharpness is largely preserved and the tips exhibit a wear resistance that is orders of magnitude greater than that of conventional silicon tips and at least 100‐fold higher than that of monolithic, SiO‐doped diamond‐like‐carbon (DLC) tips. The wear is well‐described by an atom‐by‐atom wear model, from which kinetic parameters are extracted that enable the prediction of the long‐time scale reliability of the tips. 相似文献
15.
Jacobs C. Bollig C. Jones T. Kriel S. Esser D. 《Quantum Electronics, IEEE Journal of》2009,45(10):1221-1231
We present a macroscopic laser rate-equation model based on measurable laser parameters, allowing easy system identification. A numerical simulation based on the model is used in the design and testing of electronic laser feedback systems for intensity noise suppression and Q-switched pulse stabilization. A novel pulse energy control scheme is also presented, including experimental results. 相似文献
16.
17.
M. Jaime-Vasquez M. Martinka A.J. Stoltz R.N. Jacobs J.D. Benson L.A. Almeida J.K. Markunas 《Journal of Electronic Materials》2008,37(9):1247-1254
Plasma etching of (112)B InSb to prepare this semiconductor for the heteroepitaxy deposition of CdTe and initial studies of
CdTe epilayers grown by molecular beam epitaxy (MBE) on InSb (112)B substrates cleaned with various plasma treatments are
presented. X-ray diffraction rocking curve maps of the MBE CdTe epilayers on 3-inch InSb (112)B substrates have full-width
at half-maxima (FWHM) values in the range of 20 arcsec to 30 arcsec. An etch pit density analysis of the 3-inch CdTe epilayers
reveals a defect density of 1.0 × 107 cm−2 and 7.7 × 105 cm−2 at the center and edge of the wafer, respectively. Evaluation of a standard HgCdTe annealing process suggests that the removal
of the InSb substrate is likely to be needed prior to any postgrowth annealing in Hg overpressure. Finally, we present a low-energy
helium plasma exposure of wet-etched InSb (112)B substrates that provides a uniform epi-ready surface that is nearly stoichiometric,
and free of oxide and residual contaminants. 相似文献
18.
R.N. Jacobs L.A. Almeida J. Markunas J. Pellegrino M. Groenert M. Jaime-Vasquez N. Mahadik C. Andrews S.B. Qadri T. Lee M. Kim 《Journal of Electronic Materials》2008,37(9):1480-1487
It is well known that the large lattice mismatch (>14%) associated with CdTe/Si, CdTe/Ge, and CdTe/GaAs composite substrates,
is a great contributor to large dislocation densities and other defects that limit the performance of HgCdTe-based infrared
detectors. Though thermal expansion mismatch is another possible contributor to material defects, little work has been done
towards documenting and understanding its effects in these systems. Here, we perform studies to determine the relative contributions
of lattice and thermal mismatch to CdTe film characteristics, including dislocation density and residual stress. Unannealed
and thermally cycled films are characterized using x-ray diffraction, defect decoration, and Nomarski and transmission electron
microscopy. For CdTe/Si, the residual stress is consistently observed to be tensile, while for CdTe/Ge and CdTe/GaAs, a compressive
residual film stress is measured. We show based on theoretically predicted stress levels that the experimental measurements
imply the dominance of thermal mismatch in the residual stress characteristics. 相似文献
19.
J.D. Benson R.N. Jacobs J.K. Markunas M. Jaime-Vasquez P.J. Smith L.A. Almeida M. Martinka M.F. Vilela U. Lee 《Journal of Electronic Materials》2008,37(9):1231-1236
X-ray diffraction full-width at half-maximum (XRD FWHM), reflection high-energy electron diffraction (RHEED), and atomic force
microscopy (AFM) indicate a mosaic structure for molecular-beam epitaxy (MBE) (211)B CdTe/Si. AFM measurements indicate long,
thin, small-angle-disoriented grains for CdTe/Si epilayers. These disoriented grains are ~1 μm in the [] direction and are ~40 nm in the [] direction. The RHEED pattern in the [] direction depicts nearly ideal single-crystal periodicity. The RHEED pattern in the [] direction is indicative of small-angle-disoriented crystalline grains. Scanning electron microscopy (SEM), AFM, and XRD
measurements all indicate an approximate factor of 10 increase in the Everson etch pit density (EPD) over standard Nomarski
microscopy Everson EPD determination. 相似文献
20.
M. Jaime-Vasquez R.N. Jacobs C. Nozaki J.D. Benson L.A. Almeida J. Arias J. Pellegrino 《Journal of Electronic Materials》2012,41(10):2975-2980
We present the results of a detailed study of the changes that occur on CdTe buffer layer surfaces grown on ZnTe/Si(211) and GaAs(211)B during the routine thermal cyclic annealing (TCA) process. Observations indicate that CdTe buffer layer surfaces are Te saturated when the TCA is performed under Te overpressure. In the absence of Te flux during the TCA step, the CdTe surface loses CdTe congruently and the typical CdTe nanowires show the presence of nodules on their surfaces. The observed changes in reflection high-energy electron diffraction patterns during TCA are explained in terms of surface chemistry and topography observations. Overall, the Te overpressure is necessary to maintain a smoother and pristine surface to continue the molecular beam epitaxy (MBE) growth. 相似文献