Refractive index profiling-state of the art

Problems associated with different calibration techniques and some instrumental effects that can determine instrumental accuracy are discussed. It is shown how transmission effects can be observed and used to generate a correction curve for refracted near-field instruments. High-quality fiber slices needed for axial interferometry were used to obtain refractive index differences on suitable fibers to ±1% with the measurements traceable to national standards. Interferometry was used to calibrate a multiple-step fiber which is available in 10-m lengths with a certificate of calibration. The limitations of the technique are discussed, and preliminary results of a study on the effects of residual stress and stress relief on measurements are given. Comparisons are made between measurements made by axial interferometry and refracted near field on a range of fibers. It is shown that commercial profilers can produce reliable measurements of refractive index difference, absolute refractive index, profile shape, and numerical aperture that agree well with measurements by other techniques     

A Multicriteria Approach to Data Summarization Using Concept Ontologies

This paper describes a conceptual and theoretical framework to allow better user control over data summarization for knowledge discovery. Basic to the approach is a measure of quality of summarization of data using categories provided by the hierarchical structure of concept ontology. This involves the modeling, using a fuzzy sets approach, of the four criteria implicit in a summarization imperative: minimum coverage, minimum relevance, succinctness, and usefulness. With these criteria modeled, a multicriteria approach is presented, using a decision function aggregating these criteria that provides an overall quality measure to guide the summarization of the data. The development of the theory is first presented for the simple case of a single attribute to clearly delineate the basic issues and approach and then extended to multiple attributes. Finally, approaches to provide a more user-oriented presentation of the summarized data are considered     

Influence of Al and Ni concentration on the Martensitic transformation in Cu-Al-Ni shape-memory alloys

The martensitic transformation temperatures and the types of martensitic phases have been determined in a wide concentration range of technological interest for Cu-Al-Ni shape-memory alloys (SMAs) A stability diagram of martensitic phases as a function of alloy concentration has been determined. It is found that when the aluminum content increases, the transformation changes from β ₃ ⇒ β′₃ to β ₃ ⇒ γ′₃, with an intermediate concentration range where both martensites coexist due to a β ₃ ⇒ γ′₃+β′₃ transformation. On the other hand, an increase of nickel content stabilizes the martensite β′₃, changing from a mixed β ₃ ⇒ γ′₃ + β′₃ to a single β ₃ ⇒ β′₃ transformation. Furthermore, linear relationships between M _s and Al and Ni concentrations have been obtained for all types of martensitic phases.     

Characterization of GaAs layers grown on polycrystalline GaAs by LPE and current controlled LPE

It is the purpose of this paper to investigate the suitability and effectiveness of growth of thin GaAs layers on polycrystalline GaAs substrates by liquid phase epitaxy (LPE) and current controlled LPE (CCLPE). During each growth run LPE and CCLPE were used to grow thin GaAs layers on two large-grain polycrystalline GaAs substrates cut from the same wafer and simultaneously placed in the same growth system. The grain boundary was exposed by cleaving the samples perpendicular to the grain boundary. Notnarski contrast, SEM, C-V and Hall measurements were performed in order to determine the surface morphology, discontinuity of epilayer at the grain boundary, epilayer thickness unform-ity, resistivity (in directions parallel and perpendicular to the grain boundary), and dopant concentration. The CCLPE system was carefully designed so that growth would take place only by electrotransport in the absence of convection or Peltier cooling. The results indicate that CCLPE yields layers with improved surface morphology and thickness uniformity as compared to those grown by LPE. In some samples the epilayer was discontinuous at certain grain boundaries. Results are presented on CCLPE growth rate dependence upon grain orientation, current density, and continuity of the epilayer at the grain boundary.     

Measuring errors of amplitude and phase for vibratory accelerations when testing objects

Measurement Techniques -