Impact of temperature cycle profile on fatigue life of solder joints

In this paper the influence of the temperature cycle time history profile on the fatigue life of ball grid array (BGA) solder joints is studied. Temperature time history in a Pentium processor laptop computer was measured for a three-month period by means of thermocouples placed inside the computer. In addition, Pentium BGA packages were subjected to industry standard temperature cycles and also to in-situ measured temperature cycle profiles. Inelastic strain accumulation in each solder joint during thermal cycling was measured by high sensitivity Moire interferometry technique. Results indicate that fatigue life of the solder joint is not independent of the temperature cycle profile used. Industry standard temperature cycle profile leads to conservative fatigue life observations by underestimating the actual number of cycles to failure.     

Subnanometer-scale chemistry and structure of α-iron/molybdenum nitride heterophase interfaces

The local chemistry and structure of α-iron/molybdenum nitride heterophase interfaces is studied on a subnanometer scale by atom-probe field-ion microscopy (APFIM), three-dimensional atom-probe microscopy (3DAPM) and both conventional transmission electron microscopy (CTEM) and highresolution electron microscopy (HREM). Molybdenum nitride precipitates are generated by annealing Fe-2 at. pct Mo-X, where X=0.4 at. pct Sb or 0.5 at. pct Sn, at 550 °C or 600 °C, in an ammonia/hydrogen mixture. Internal nitridation at 550 °C produces thin, coherent platelet-shaped molybdenum nitride precipitates. Nitridation at 600 °C generates a much coarser structure with semicoherent thick plate-shaped and spheroidal precipitates in addition to the thin-platelet structure. The APFIM and 3DAPM analyses of the heterophase interfaces show substantial segregation of the solute species Sn and Sb only at the coarse precipitates, with Gibbsian interfacial excesses of up to 7±3 nm⁻², whereas the broad faces of the thin platelets have no detectable segregation. The TEM and HREM analyses show that the coarse precipitates are semicoherent, whereas the thin platelets are either coherent or have much fewer misfit dislocations than geometrically necessary. This demonstrates that Sn and Sb segregation is related to the presence of misfit dislocations at the interfaces of the coarse precipitates. This article is based on a presentation made at the symposium entitled “The Mechanisms of the Massive Transformation,” a part of the Fall 2000 TMS Meeting held October 16–19, 2000, in St. Louis, Missouri, under the auspices of the ASM Phase Transformations Committee.     

Microsomal and photochemical oxidation of aflatoxin B1

The UV irradiation (lambda = 362 nm) of aflatoxin B1 (AfB1) dissolved in water resulted in the formation of an oxidized product. The process was not inhibited by ionol, a routine inhibitor of the radical processes. The oxidized product was not found in the system where AfB1 was metabolized by the 3-methylcholanthrene-activated rat liver microsomes. It is suggested that the product is identical with 2,3-dihydrodiol of AfB1.     

Optimization in periodic Markovian decision processes

We consider a Markovian decision process with a nonhomogeneous transition function satisfying a periodicity condition. An optimization method is proposed which computes the optimal periodic strategy for an unbounded time interval.Translated from Kibernetika, No. 2, pp. 91–94, 99, March–April, 1991.     

Study of inaccuracy in semi-analytical sensitivity analysis — a model problem

The semi-analytical method of sensitivity analysis (Zienkiewicz and Campbell 1973; Esping 1983; Cheng and Liu 1987) of finite element discretized structures is attractive due to the balance between computational cost and ease of implementation (Cheng and Liu 1987; Haftka and Adelman 1989), but unfortunately the method may exhibit serious inaccuracies when applied in shape optimization of structures modelled by beam, plate, shell and Hermite elements (Cheng and Liu 1987; Haftka and Adelman 1989; Barthelemyet al. 1988; Barthelemy and Haftka 1988; Choi and Twu 1991, Pedersenet al. 1989; Chenget al. 1989).In the present paper, we perform an exact analysis of the error of sensitivity for a simple model problem which has earlier been considered by Barthelemyet al. (1988), Barthelemy and Haftka (1988), Pedersenet al. (1989). The analysis gives a deep insight into the nature of the general inaccuracy problem and enables us to devise methods by which the severe error of the sensitivity can be substantially reduced or removed for the model problem. The results of the paper are illustrated via an example.A method of error elimination for an extended class of semianalytical analysis problems is developed and presented in a companion paper (Olhoff and Rasmussen 1991).