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101.
This paper proposes two stochastic testing methods for the security analysis of a secure communication scheme based on continuous‐time chaotic systems. First, we define an instantaneous EFA (error function attack) function that does not include the average operation. Second, we propose a statistical testing for cryptanalysis, which calculates a standard deviation of the EFA function obtained by random trial keys. As another stochastic testing, moreover, we propose a stochastic evolutional attack to find a secret key. Finally, simulation results for the proposed security testing are presented. © 2011 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.  相似文献   
102.
The spinal ejaculation generator (SEG) is located in the central gray (lamina X) of the rat lumbar spinal cord and plays a pivotal role in the ejaculatory reflex. We recently reported that SEG neurons express the oxytocin receptor and are activated by oxytocin projections from the paraventricular nucleus of hypothalamus (PVH). However, it is unknown whether the SEG responds to oxytocin in vivo. In this study, we analyzed the characteristics of the brain–spinal cord neural circuit that controls male sexual function using a newly developed in vivo electrophysiological technique. Optogenetic stimulation of the PVH of rats expressing channel rhodopsin under the oxytocin receptor promoter increased the spontaneous firing of most lamina X SEG neurons. This is the first demonstration of the in vivo electrical response from the deeper (lamina X) neurons in the spinal cord. Furthermore, we succeeded in the in vivo whole-cell recordings of lamina X neurons. In vivo whole-cell recordings may reveal the features of lamina X SEG neurons, including differences in neurotransmitters and response to stimulation. Taken together, these results suggest that in vivo electrophysiological stimulation can elucidate the neurophysiological response of a variety of spinal neurons during male sexual behavior.  相似文献   
103.
Spectroscopic characterization of AgI-ion-mediated C-AgI-A and C-AgI-T base pairs found in primer extension reactions catalyzed by DNA polymerases was conducted. UV melting experiments revealed that C-A and C-T mismatched base pairs in oligodeoxynucleotide duplexes are specifically stabilized by AgI ions in 1:1 stoichiometry in the same manner as a C-C mismatched base pair. Although the stability of the mismatched base pairs in the absence of AgI ions is in the order C-A≈C-T>C-C, the stabilizing effect of AgI ions follows the order C-C>C-A≈C-T. However, the comparative susceptibility of dNTPs to AgI-mediated enzymatic incorporation into the site opposite templating C is dATP>dTTP≫dCTP, as reported. The net charge, as well as the size and/or shape complementarity of the metal-mediated base pairs, or the stabilities of mismatched base pairs in the absence of metal ions, would be more important than the stability of the metallo-base pairs in the replicating reaction catalyzed by DNA polymerases.  相似文献   
104.

A high-speed wireline interfaces, e.g. LVDS (Low Voltage Differential Signaling), are widely used in the aerospace field for powerful computing in artificial satellites and aircraft [19]. This paper describes Bit Error Rate (BER) prediction methodology for wireline data transmission under irradiation environment at the design stage of data transmitter, which is useful in proactively determining if the design circuit meets the BER criteria of the target system. Using a custom-designed LVDS transmitter (TX) to enhance latch-up immunity [42], the relationship between transistor size and BER has been analyzed with focusing on Single Event Effect (SEE) as a cause of the bit error. The measurement was executed under 84Kr17+ exposure of 322.0 MeV at various flux condition from 1?×?103 to 5?×?105 count/cm2/sec using cyclotron facility. For the analysis of the bit error, circuit simulation by SPICE was utilized with expressing the irradiation environment by a current source model. The current source model represents a single event strike into the circuit at drain and substrate junctions in bulk MOSFETs. For the construction of the current source model, a charge collection was simulated at the single particle strike with the creation of 3D Technology CAD (TCAD) models for the MOS devices of bulk transistor process technology. The simulation result of the charge correction was converted to a simple time-domain equation, and the single-event current source model was produced using the equation. The single-event current source was applied to SPICE simulation at bias current related circuits in the LVDS transmitter, then simulation results are carefully verified whether the output data is disturbed enough to cause bit errors on wireline data transmission. By the simulation, sensitive MOSFETs have been specified and a sum of the gate area for these MOSFETs has 29% better correlation than the normal evaluation index (sum of the drain area) by comparison to the actual BER measurement. Through the precise revelation of the sensitive area by SPICE simulation using the current model, it became possible to estimate BER under irradiation environment at the pre-fabrication design stage.

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105.
106.
We use low-temperature heat capacity, low-frequency Raman scattering, and THz time domain spectroscopy in order to scale the vibrational density of states and the Boson peak in SiO2-Al2O3-B2O3 Yb-laser host glasses. When substituting B2O3 for SiO2 at constant Al2O3 dopant level, we find an optimal value for the ratio of B/Al in terms of mixture stability, at which the excess in the electron donor capability of Al2O3 (relative to the SiO2 backbone) is compensated by the more acidic B2O3. At this composition, Al2O3 plays a mediating role in the structure of aluminoborosilicate glasses, facilitating dissolution of Yb2O3 and admixture of B2O3 into the SiO2 network.  相似文献   
107.
A new tool has been developed to evaluate the reliability of assembly shop operation. It is a subsystem of AREM (Assembly Reliability Evaluation Method) [1] that can evaluate assembly fault occurrence rates by using product design information. This new tool uses approximately forty questions to assess quantitatively the influence of assembly shop operation reliability on assembly fault occurrence. This method is being used both to improve shop operation reliability and to select preferable shop, and is proven to be effective. The entire AREM system supports efficiently systematic improvement in assembly quality by examining both product design and assembly shop.  相似文献   
108.
This paper researches the typical assembly operation of flexible objects, and considers inserting a flexible wire into a hole with a magnetically actuated micromanipulator. Conditions for successful insertion are first analyzed. A person’s motion of inserting a flexible beam into a hole is analyzed, and an insertion approach that mimics human motion is proposed. Experiments for the wire-in-hole operation verify the proposed approach. Here, the experiment platform is first introduced, and then an experiment involving the insertion a wire into a micromachined slot is reported. Experiment results prove the feasibility and efficiency of the proposed approach .  相似文献   
109.
Metallurgical and Materials Transactions B - An in situ observation technique of the TiO2 interfacial behavior in molten LiCl-KCl electrolysis was developed. The variation of the thin TiO2...  相似文献   
110.
Conductive films that are highly transparent and flexible are extremely attractive for emerging optoelectronic applications. Currently, indium‐doped tin oxide films are the most widely used transparent conductive films and much research effort is devoted to developing alternative transparent conductive materials to overcome their drawbacks. In this work, a novel and facile approach for fabricating transparent conductive Au nanosheets from Au nanoparticles (AuNPs) is proposed. Irradiating an AuNP monolayer at the air–water interface with UV light results in a nanosheet with ≈3.5 nm thickness and ≈80% transparency in the UV–visible region. Further, the so‐fabricated nanosheets are highly flexible and can maintain their electrical conductivity even when they are bent to a radius of curvature of 0.6 mm. Fourier‐transform infrared and X‐ray photoelectron spectroscopy characterizations reveal that the transformation of the monolayer of AuNPs into the nanosheet is induced by the photodecomposition and/or photodetachment of the dodecanethiol ligands capping the AuNPs. Further, the UV‐irradiation of a hybrid monolayer consisting of AuNPs and silica particles affords the patterning of Au nanosheets with periodic hole arrays.  相似文献   
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