Micro-prober for wafer-level low-noise measurements in MOS devices

Low-frequency noise measurements represent an interesting investigation technique for the characterization of the quality and reliability of microelectronic materials and devices. Performing meaningful noise measurements at low and very low (f<1 Hz) frequencies, however, may be quite challenging, particularly because of the many sources of interference that superimpose on the noise signal. For this reason, packaged samples are preferred because they allow accurate shielding from the external environment, and because keeping the sample in close proximity to the low-noise biasing system and amplifier reduces microphonic and electromagnetic disturbances. Notwithstanding this, the possibility of performing low-frequency noise measurements at wafer level would be quite interesting, both because of the ease of obtaining wafer-level samples from industries with respect to packaged samples, and because this would avoid possible packaging-process induced device degradation. The purpose of this work is to demonstrate that it is, in fact, possible to design and build a dedicated probe system for performing high-sensitivity, low-frequency noise measurements on metal-oxide-semiconductor devices at wafer level.     

Effect of film thickness on hydrogen content in a-Si : H

The hydrogen content, its depth distribution, and its bonding configuration have been studied in hydrogenated amorphous silicon prepared by plasma-enhanced chemical vapor deposition with hydrogen-diluted silane. Nuclear reaction analysis and infrared spectroscopy were used to determine the total amount of hydrogen and its bonded component, respectively. It has been established that the total concentration of hydrogen does not depend on the film thickness, and has a uniform depth profile. The concentration of bonded hydrogen changes with the film thickness within the measurement accuracy. The data obtained suggest the presence of molecular (non-bonded) hydrogen, uniformly distributed in concentration across the film thickness.     

Lateral ion implant straggle and mask proximity effect

Lateral scattering of retrograde well implants is shown to have an effect on the threshold voltage of nearby devices. The threshold voltage of both NMOSFETs and PMOSFETs increases in magnitude for conventional retrograde wells, but for triple-well isolated NMOSFETs the threshold voltage decreases for narrow devices near the edge of the well. Electrical data, SIMS, and SUPREM4 simulations are shown that elucidate the phenomenon.     

长距离输油管道水力瞬变特性分析

针对长输管道输送过程中由于各种原因而引发的水力瞬变现象,提出了管道瞬变流动的数学物理模型及有限差分求解方法,研究了在长距离管道输送过程中常见的几种边界条件。结合具体算例,对水力瞬变物性进行了分析,为提高长输管道的设计和管理水平、深入掌握管道输油的水力瞬变规律提供了依据。     

石蜡基原油对环烷基原油润滑油馏分低温性能的敏感性分析

为了便于开采和集输环烷基原油,需要在其中混入一定量的石蜡基原油。加工环烷基原油的轻质和中质润滑油产品低温性能对石蜡基原油的混入非常敏感。为了保持产品的低温性能,对按不同比例混入石蜡原油的环烷基原油的影响程度进行了实验,对不同比例的混合油进行实沸点蒸馏得到的轻质和中质馏分的物理性质进行了测试分析,确定了混入量对环烷基原油产品的影响程度。     

拖拉器在水平井中的生产测井工艺及应用

随着水平井技术在油田开发中的广泛应用,水平井生产测试作为重要的监测手段日益受到重视.水平井拖拉器是完成水平井测试的一种下井输送工具,为成功进行水平井的电缆测试提供了技术手段.对拖拉器（Mule）与其他生产测井仪配接所录取的资料进行解释分析,可以为油井生产提供可靠的井况资料.     

纤维在沥青混合料中的应用研究

选用工程中常用的几种纤维,结合工程应用要求,试验分析了纤维的吸湿性、耐热性,并通过网篮析漏试验、动态剪切试验和沉锥试验,讨论了纤维对沥青的稳定和吸附作用,以及纤维对沥青混合料“加筋”效果和作用机理。研究表明有的纤维“吸附、稳定”性能好,而有的纤维“加筋、桥接”效果好,在应用纤维时,应根据纤维的主要特点以及沥青混合料的使用要求来选用。     

Opening-up Status of China＇s Oil ＆ Gas Market

Since the founding of P.R.China,Particularly after the lauch of reform and opening up in 1978,China＇s oil and gas industry has undergone a series of significant reforms and restructuring.it has set up a complete oil and gas industry system.