On assertion-based encapsulation for object invariants and simulations

In object-oriented programming, reentrant method invocations and shared references make it difficult to achieve adequate encapsulation for sound modular reasoning. This tutorial paper surveys recent progress using auxiliary state (ghost fields) to describe and achieve encapsulation. It also compares this technique with encapsulation in the forms provided by separation logic. Encapsulation is assessed in terms of modular reasoning about invariants and simulations.     

Algorithms for multiprocessor scheduling with two job lengths and allocation restrictions

A variant of the High Multiplicity Multiprocessor Scheduling Problem with C job lengths is considered, in which jobs can be processed only by machines not greater than a given index. When C=2, polynomial algorithms are proposed, for the feasibility version of the problem and for maximizing the number of scheduled jobs.     

Refactoring and converting a TTCN-2 test suite

When deploying TTCN-3 at Nokia, we converted two TTCN-2 test systems to TTCN-3. We explain to which extend we have been able to do the conversion automatically. The conversion tool used provided a syntactically and semantically correct conversion of the TTCN-2 code. We define some improvements made on the tool to increase readability and maintainability of the resulting code. We cover aspects of converting also the non-TTCN-2 parts and describe the experiences we made as a set of lessons learnt.     

Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators

This paper presents the concept of a process signature for the use of online signature analysis and defect detection in the layered manufacturing (LM) of ceramic sensors and actuators. To achieve the high quality of parts built by the fused deposition of ceramics (FDC), an online process-monitoring system is implemented to detect the processing defects. Using a process signature extracted from the image of a layer captured by the monitoring system, an ideal image is created that is then compared to the original image to detect and identify the defects. Some results of signature analysis and defect detection for single-material and multi-material parts are also presented.Received: 22 July 1999, Accepted: 21 October 2001, Published online: 29 October 2003 Correspondence to: Mohsen A. JafariThis work was supported by the Office of Naval Research under grant # N-0014-96-1-1175. Ref. US Patent # S-5738817, April 14, 1998.