Double-step generation of ellipses

The principle of double-step incremental generation of nonparametric curves on a discrete plane is used to develop a double-step algorithm for scan converting ellipses in sixteen separate segments. The algorithm iterates only half as many times as current algorithms, while each iteration demands the same number of operations or slightly fewer operations than M. Pitteway's (1967, 1985) algorithm (previously the fastest one). This marked gain in the speed of scan conversion is due to the fact that the middle pixel in a two-step increment is obtained without computation     

TEM study of PLZT ceramics

The microscopic structures of PLZT(7.9/70/30 and x/65/35, x = 7 or 8) ceramics were studied by means of transmission electron microscopy. The presence of micro-regions in PLZTs was first verfied.     

On-line learning delivery decision support system for highlyproduct mixed semiconductor foundry

A production learning system (PLS) based on the tool model was constructed as a decision support and real-time information update system to forecast the cycle time. A tool model includes a waiting model and a processing model. Each of the waiting and processing models uses a backpropagation neural network to establish the relationship between the input and output (time) of the model. Hence, cycle time estimation, tool group move and confirm line item performance (CLIP) value can be obtained based on the memory stored in the neural network. The result shows that the forecasting ability of the PLS has an error rate below 8% on average     

Efficient design/simulation algorithms for simultaneous switching noise in leadframe packages

 Two new modeling and simulation approaches for Simultaneous Switching Noise (SSN) are described and compared to “brute force” simulation by SPICE. Both simulation accuracy and simulation run-time are considered. The two new approaches are: 1) the “effective inductance” method, in which an approximate, very efficient method of extracting an SSN L _eff  is utilized; and 2) the “macromodel” method, in which the complex inductance network responsible for SSN is represented by only a few dominant poles in the frequency domain and the time domain response is obtained by an efficient convolution algorithm. Both approaches are shown to be accurate and fast, but only the effective inductance algorithm is robust in numerical convergence. Received: 19 March 1997 / Accepted: 25 March 1997     

The dominance of the K I-field for a crack under stress wave loading

The extent of the dominant singular field is investigated for a finite crack under stress wave loading. Using a boundary integral equation method the complete solution as well as the near field solution is determined. A comparison of the two fields indicates that the singular field dominates within a small domain at the crack tip. The size of the dominance region in the dynamic case may be very different from that in the static case.     

Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET

An analytical expression for both band-to-band and band-trap-band indirect tunnelings is used to study the gate-induced drain leakage (GIDL) current of MOSFETs measured before and after hot-carrier stress. The voltage and temperature dependence of GIDL are characterized. Both results show that interface traps situated near the midgap participate in the conduction of GIDL, and band-trap-band indirect tunneling could be the major mechanism. This is further supported by the fact that the percentage increase in GIDL induced by hot-carrier stress is about the same as the corresponding increase in interface-trap density. On the other hand, under low-field conditions, trap-assisted Poole–Frenkle emission dominates over tunneling for temperatures even well below room temperature.     

Effects of thymectomy and glucocorticoid therapy on peripheral lymphocytes in myasthenia gravis

Clinical manifestations and peripheral blood lymphocyte subset changes were studied in patients with myasthenia gravis (MG) to elucidate the mechanism of clinical improvement following treatment, with thymectomy (Tx) or glucocorticoid (GC) therapy. The changes found were: 1. There was a significant increase in percentages of CD3+, CD29+ CD4+ cells and CD4/CD8 ratio and a significant decrease in percentages of CD8+ and CD16,56+ cells in patients who had never been treated with any immune therapy. 2. After Tx or GC therapy, CD3+ and CD4+, CD29+ cells were decreased, but the number CD19+ and CD16, CD56 cells did not change. 3. Tx had a special effect on CD8+ cells. In most of the patients who showed clinical improvement after Tx, CD8+ cells were increased and CD4/CD8 ratio wad decreased. 4. Anti-acetylcholine receptor (AChRAb) titers were markedly decreased after GC therapy. These results indicate that there were obvious abnormalities in cell-mediated immunity in addition to those in humoral immunity in myasthenia gravis. These abnormalities tended to be normalized after Tx or GC therapy.     

A numerical investigation on the geometry dependence of the crack growth resistance in CT specimens

The influence of the specimen thickness B and the ligament length b on the J _R -curves is numerically investigated for CT specimens. The thickness effect is taken into account with 2-D analyses by dividing a plain sided specimen into a plane stress part and a plane strain part. The fracture process is controlled by experimentally determined critical values of the crack tip opening displacement for crack growth initiation (CTOD_i) and the crack tip opening angle for stable crack growth (CTOA_C). It is shown that for the global behaviour of a plain sided specimen, the B/b ratio is essential. The difference between the geometry dependence of the initiation value of the J-integral and the geometry dependence of the slope of the J _R -curves is also shown.     

Effects of hot carrier induced interface state generation insubmicron LDD MOSFET's

A two-dimensional numerical simulation including a new interface state generation model has been developed to study the performance variation of a LDD MOSFET after a dc voltage stress. The spatial distribution of hot carrier induced interface states is calculated with a breaking silicon-hydrogen bond model. Mobility degradation and reduction of conduction charge due to interface traps are considered. A 0.6 μm LDD MOSFET was fabricated. The drain current degradation and the substrate current variation after a stress were characterized to compare the simulation. A reduction of the substrate current at V_g ≃0.5 V_d in a stressed device was observed from both the measurement and the simulation. Our study reveals that the reduction is attributed to a distance between a maximum channel electric field and generated interface states