Pull-out and fragmentation in model fibre composites

An experimental study has been carried out of debonding and fibre rupture in model composites. A single glass rod or fibre was embedded in the centre of a long transparent silicone rubber block. Strains in the rubber in close proximity to the rod or fibre were measured as the specimen was slowly stretched. Pull-out forces, strain distributions, and debonded lengths are compared with the predictions of a simple theory based on a fracture energy criterion for debonding, and taking into account friction at the debonded interface. Experiments were carried out with rods of different diameter, rubber blocks of varied cross-section, and with two levels of adhesion. By extrapolating the debonded length to zero, values of the debonding force in the absence of friction were obtained. They were in accord with fracture energies of about 50 J/m² for weak bonding and about 200 J/m² for strong bonding. Fibre fragmentation lengths were measured also. They were in reasonable agreement with the inferred fracture energies and the measured frictional properties of silicone rubber sliding on glass. In a separate study, it was found that the frictional stress between cast silicone rubber and glass was approximately constant, about 0.1 MPa, rather than proportional to pressure, for pressures exceeding about 0.02 MPa. This feature is attributed to a particularly smooth interface between the two materials.     

L-Expressnet: The Communication Subnetwork for the C-NET Project

L-Expressnet is the communication suxbnetwork for the CNET local area network project of the CNR, Italy. Based on a single bus topology, it utilizes a simple and efficient virtual-token access protocol which provides ordered and collision-free transmission. The paper discusses the needs which led to L-Expressnet, describes the protocol, proves its correct operation, and compares its throughput-delay performance with those of other typical bus Protocols. A major advantage of L-Expressnet is that its implementation may be based on Ethernet standard transceivers and network interfaces.     

Application of Romero García method to the degradation process of DGEBA/ETDA filled with ultra fine metallic copper

Summary The thermal properties of an epoxy resin (diglycidyl ether Bisphenol A, DGEBA) cured with a primary amine (ethylenediamine, ETDA) and filled with 10, 20 and 30 wt. % of ultra fine copper particles were analyzed. The thermal results were evaluated by means of the Romero-Garcia method, which allowed to obtain the resin degradation kinetic parameters, as well as the possible decomposition mechanism. From the obtained results is possible to infer that higger copper content strongly affects the degradation process of the epoxy resin, which causes a drop off on the composites thermal stability. This behavior could be attributed to water presence, being this effect less pronounced for the resin with 10 wt. % copper and unfilled resin. Regarding to decomposition mechanism, three way transport showed the best correlation for all samples.     

A family of highly symmetric codes

We define a class of codes admitting a large automorphism group. This family contains the binary extended Hamming code, the hexacode, the Golay codes, the Pless symmetry codes, as well as the [16,4,12]/sub 8/-codes constructed by Marcugini et al. A computer search resulted in the construction of codes with new parameters [28,7,18]/sub 8/,[32,8,20]/sub 8/, and [39,13,17]/sub 4/ belonging to this family.     

Determination of siphon operating regimes

Necessary and sufficient conditions are found for continuous and periodic liquid motion in systems containing siphons.Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 52, No. 6, pp. 916–920, June, 1987.     

Electroluminescence spectroscopy for reliability investigations of 1.55 μm bulk semiconductor optical amplifier

This paper demonstrates the complementary relation between functional parameters and electroluminescence spectroscopy for reliability investigations of 1550 nm Semiconductor Optical Amplifiers of 700 μm length active region. Ageing tests have been set to 270 mA-100 °C-1500 h and realized on two different wafers showing more impact on wafer 1 than on wafer 2. Our investigations are particularly focused on interpretation of electroluminescence spectra, from reference and aged SOAs of wafer 1, leading to an improvement of degradation mechanisms understanding. The shift rate to lower energies of the recombination energy peak at 1550 nm, as reported by electroluminescence spectra between reference and aged SOAs in relation with the decrease of optical power measured at 200 mA for the degraded SOA and completed by I(V) characterizations, suggest occurrence of non radiative deep centers near the buried ridge structure in relation with the cleaning process uniformity of interfaces before epitaxial overgrowth. These defects mainly trap majority injected carriers instead of minority carriers reducing the luminescence in the active zone. By monitoring the most sensitive failure indicator (pseudo-threshold current), lifetime distributions are also calculated to determine failure rate, between 150 and 200 FITs over 15 years for operating conditions (25 °C-200 mA) using experimental degradation laws and statistic computations, demonstrating the overall robustness of this technology.     

A Narrowband Pulse-Echo Technique for In Vivo Ultrasonic Attenuation Estimation

The principles of a narrowband technique for pulse echo attenuation measurements are presented. Experiments are described which compare the attenuation in tissue-mimicking phantoms, measured by known methods, to the attenuation measured by the present technique. The effects of various experimental parameters on the results are investigated. The attenuation in spleens of canine models and in livers of human volunteers is presented.