High-rate sulphidogenic fluidised-bed treatment of metal-containing wastewater at high temperature.

The applicability of fluidised-bed reactor (FBR) based sulphate reducing bioprocess was investigated for the treatment of iron containing (40-90 mg/L) acidic wastewater at 65 degrees C. The FBR was inoculated with sulphate-reducing bacteria (SRB) originally enriched from a hot mining environment. Ethanol or acetate was supplemented as carbon and electron source for the SRB. A rapid startup with 99.9, 46 and 29% ethanol, sulphate and acetate removals, in respective order, was observed even after 6 days. Iron was almost completely removed with a rate of 90 mg/L.d. The feed pH was decreased gradually from its initial value of 6 to around 3.7 during 100 days of operation. The wastewater pH of 4.3-4.4 was neutralised by the alkalinity produced in acetate oxidation and the average effluent pH was 7.8 +/- 0.8. Although ethanol removal was complete, acetate accumulated. Later the FBR was fed with acetate only. Although acetate was present in the reactor for 295 days, its oxidation rates did not improve, which may be due to low growth rate and poor attachment ability of acetate oxidising SRB. Hence, the oxidation of acetate is the rate limiting step in the sulphidogenic ethanol oxidation by the thermophilic SRB.     

A note on the use of conductimetry in brewery microbiological control

The growth in beer of 15 brewery strains of Lactobacillus was detected using the automatic conductance measuring technique afforded by the Malthus 8 Growth Analyser. 0·15% ammonium chloride was added to the beer as an electrolyte and sodium acetate was used to raise the pH from ca 4·0 to 4·2 or above. No measurable responses were obtained using unmodified beer. The value of the method for development in routine brewery microbiological control is briefly discussed.     

Maximization of Good Chips Per Wafer by Optimization of Memory Redundancy

In the optimization of the number of good chips per wafer, yield is obviously one key factor. It plays the major role in the manufacturing phase, as at this time circuit design and chip area cannot be modified. In the design phase, however, chip area as the second factor defining good chips per wafer can still be influenced. If there are no strong relationships between yield and chip area, both can be optimized independently. In some cases, however, there are such strong relationships, and an optimum of yield gain versus area growth has to be found. Maybe the most important example where strong relationships between area and yield have to be considered is the estimation of optimum memory redundancy. In this paper, we will review and discuss relationships between yield and area and present methods for optimization of good chips per wafer, with special focus on the optimization of memory redundancy     

Microprocessor testability

As the level of microprocessor complexity increases to several hundred thousand transistors for a single-chip machine, it is becoming very difficult to test commercially available designs to the level of fault coverage desired by some customers. In order to achieve near 100-percent coverage of single stuck-at faults, future microprocessors must be designed with special testing features (designed for testability). The authors describe the testing problem for microprocessors, including the various methods of generating test sets and their application by the user. A survey of the testability features of some of today's commercially available microprocessors is presented. Suggestions for testability features for future-generation microprocessors are also discussed     

Voltage transfer function synthesis using current conveyors

A synthesis procedure for generating current conveyor active filters is presented, and a novel network which realises the general 2nd-order voltage transfer function is given.<>