Implementing Employee Empowerment

The road to employee empowerment runs between true commitment on the one side and enforced compliance and chaos on the other. By following this column's guidelines, IS managers can steer their organizations to success and help free employees to be more creative in terms of both quality and productivity.     

Pulmonary Wegener''s disease mimicking tuberculosis]

We report a case of early Wegener's disease mimicking tuberculosis in a 36 year old man. Lungs are solely affected for 6 months. Unusual appearance of radiographic features with large apical excavations explain the delai for the diagnosis. We discuss morphological features in the lungs and kidney.     

Structural properties and electrical behaviour of thin silicon oxynitride layers

Thin SiO₂ and SiO_xN_y layers were grown on silicon using Rapid Thermal Processing (RTP) in either O₂ or N₂O ambient. Subsequent annealing or nitridation was performed in order to improve the electrical stability. The composition of the films, in particular the incorporation of nitrogen and hydrogen, has been studied. We obtained the distribution of states at the Si/insulator interface through the evaluation of CV measurements and investigated the charge trapping in the layers analysing the voltage–time behaviour during Fowler–Nordheim constant current injection. Furthermore, assuming a trap assisted tunneling mechanism, the influence of near interface trap states on the current voltage characteristic was used to derive an effective insulator state distribution.     

The effect of surface roughness on the radiative properties ofpatterned silicon wafers

The radiative properties of patterned silicon wafers have a major impact on the two critical issues in rapid thermal processing (RTP), namely wafer temperature uniformity and wafer temperature measurement. The surface topography variation of the die area caused by patterning and the roughness of the wafer backside can have a significant effect on the radiative properties, but these effects are not well characterized. We report measurements of room temperature reflectance of a memory die, logic die, and various multilayered wafer backsides. The surface roughness of the die areas and wafer backsides is characterized using atomic force microscopy (AFM). These data are subsequently used to assess the effectiveness of thin film optics in providing approximations for the radiative properties of patterned wafers for RTP applications     

Probing the early stages of polymerization of ethylene on a model chromium/silica catalyst by Fourier transform infrared spectroscopy

The nature of the interaction of monomer, and the early stages of growth of oligomers of ethylene on a rather more uniform surface of Cr/SiO₂ catalyst than hitherto studied has been investigated by differenceFTIR spectroscopy using C₂D₄ and C₂H₄ as reactants both with and without subsequent treatment of the catalyst with CO andTHF. The active catalyst was prepared by reaction of vapour phase CrO₂Cl₂ with the vicinal hydroxyls of the silica surface. Three distinct kinds of methylene groups were detected. Arguments are given for assigning the peaks at 2935 and 2860 cm^–1 to CH₂ groups directly bound to the active site and those at 2920 and 2850 to CH₂s in the growing chain well removed from the Cr. The peaks at 2160 and 2165 cm^–1 are attributed to CD₂ groups hydrogen bonded to surface hydroxyls.     

Middle cerebral artery main stem thrombosis in two siblings with familial thrombotic thrombocytopenic purpura

Idiopathic thrombotic thrombocytopenic purpura (TTP) is frequently complicated by microinfarcts in cerebral cortex and subcortical white matter. We describe two sisters who suffered massive hemispheric infarction due to thrombosis of the middle cerebral artery main stem during exacerbations of TTP. Acute TTP may be associated with intraluminal thrombosis of large-diameter arteries in addition to arterioles and capillaries.     

The use of force modulation microscopy to investigate block copolymer morphology

Force modulation microscopy (FMM) is used to characterize the external surface and internal fracture surface morphologies of three different block copolymer samples. A roll-cast poly(styrene-butadiene-styrene) triblock copolymer film, spin-coated poly(styrene-b-methyl methacrylate) thin films, and an ultrathin poly(styrene-b-hexyl isocyanate) rod-coil block copolymer film were investigated. For each sample, height and elasticity images were obtained for the same areas allowing direct comparison. The elasticity images obtained using force modulation microscopy were independent of surface roughness and found to exhibit better contrast and spatial resolution of the respective block copolymer domains than the height images. The lateral resolution of the elasticity images was sufficient to show microphase separated domains having length scales as small as about 10 nm. The poly(styrene-b-methyl methacrylate) samples demonstrate that FMM can even be successfully used to study block copolymers in which both blocks are glassy under the conditions of measurement.