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981.
Matthias Pätzold Bjørn Olav Hogstad Dongwoo Kim 《Wireless Personal Communications》2007,40(3):267-279
In this paper, we introduce a new technique for the design of high-performance Rayleigh fading channel simulators. The proposed
design method uses set partitioning – a technique, which plays a key role in the design of trellis-coded modulation schemes.
We show how set partitioning can be used to design multiple uncorrelated fading waveforms enabling the simulation of Rayleigh
fading channels. For the important case of isotropic scattering, we show that the sample average of the generated waveforms
results in a deterministic process, the autocorrelation function (ACF) of which tends to the zeroth-order Bessel function
of the first kind as the number of sample functions increases. The proposed procedure is completely deterministic. The comparison
with a stochastic procedure using Monte Carlo techniques will be made. A study of the performance shows clearly that the new
technique using set partitioning outperforms by far existing Monte Carlo methods. 相似文献
982.
Yu Genjian Zheng Baoyu Xu Li 《电子科学学刊(英文版)》2007,24(4):550-556
Aiming at the significance of the energy controls of wireless sensor networks, an economical energy consumption algorithm for wireless communicating in Wireless Sensor Networks (WSN) is presented. Based on the algorithm, the maximal system throughput of WSN is analyzed, and the upper bound of throughput of WSN is proposed and proved. Some numerical simulations are conducted and analyzed. The conclusions include that the transmitting radius of sensor node and the parameters of the energy cost function have significant influence upon the throughput, but the monitoring region radius has little influence. For the same transmitting distance, the more the hopping of information trans- mitting, the better the throughput of WSN. On the other hand, for the energy optimization of the whole WSN, the trade-off problem between the throughput capacity and the relay nodes is proposed, and the specific expression of relay hops that minimized the energy consumptions and the maximal throughput of WSN under the specific situation is derived. 相似文献
983.
Yuting Cao Zhigang Zeng Tingwen Huang Shiping Wen 《Circuits, Systems, and Signal Processing》2016,35(8):2810-2831
This paper investigates new criteria of the robust \(H_\infty \) stability for a class of uncertain stochastic fuzzy mixed-delay systems with nonlinear noise disturbances by employing an improved free-weighting matrix approach. The fuzzy system is based on the Takagi–Sugeno model that is often used to represent the complex nonlinear systems in terms of fuzzy sets and fuzzy reasoning. To reflect more realistic dynamical behaviors of the system, both the parameter uncertainties and stochastic disturbances are considered, the stochastic disturbances are given in the form of a Brownian motion. The mixed delays comprise both discrete and distributed time-varying delays. In terms of a stochastic fuzzy Lyapunov functional, a sufficient criterion is proposed to investigate dynamical behaviors of the system in the mean-square sense with an \(H_\infty \) performance index. 相似文献
984.
Chaolong Zhang Yigang He Lifen Yuan Wei He Sheng Xiang Zhigang Li 《Journal of Electronic Testing》2016,32(5):531-540
This paper presents a novel analog circuit fault diagnosis approach using generalized multiple kernel learning-support vector machine (GMKL-SVM) method and particle swarm optimization (PSO) algorithm. First, the wavelet coefficients’ energies of impulse responses are generated as features. Then, a diagnosis model is constructed by using GMKL-SVM method based on features. Meanwhile, the PSO algorithm yields parameters for the GMKL-SVM method. Sallen-Key bandpass filter and two-stage four-op-amp biquad lowpass filter fault diagnosis simulations are given to demonstrate the proposed diagnose procedure, and the comparison simulations reveal that the proposed approach has higher diagnosis precision than the referenced methods. 相似文献
985.
Wetting interaction between Sn-Zn-Ag solders and Cu 总被引:4,自引:0,他引:4
The wetting interaction of Sn-(7.1–9)Zn-(0–3)Ag solders with Cu was investigated from 230°C to 300°C. The wetting time, wetting
forces, and activation energy of the wetting reaction were studied. The wetting time decreases with increasing temperature
and increases with Ag content. The wetting force exhibits a disproportional correlation to temperature rise, while no trend
was observed with respect to Ag content. The wetting behavior was ascribed to the interaction between Cu and Zn. The AgZn3 compound was formed at the interface when the solder contains 0.3% Ag and above, while it was formed within the bulk solder
at 2% Ag and above. 相似文献
986.
N. Y. Garces Lijun Wang N. C. Giles L. E. Halliburton D. C. Look D. C. Reynolds 《Journal of Electronic Materials》2003,32(7):766-771
Electron paramagnetic resonance (EPR) has been used to monitor the diffusion of lithium ions into single crystals of ZnO.
The in-diffusion occurs when a crystal is embedded in LiF powder and then held in air at temperatures near 750°C for periods
of time ranging up to 22 h. These added lithium ions occupy zinc sites and become singly ionized acceptors (because the material
is initially n type). A corresponding reduction in the number of neutral shallow donors is observed with EPR. To monitor the
lithium acceptors, we temporarily convert them to the EPR-active neutral acceptor state by exposure to laser light (325 nm
or 442 nm) at low temperatures. Also, after each diffusion treatment, we monitor the EPR signal of singly ionized copper acceptors
and the photo-induced EPR signal of neutral nitrogen acceptors. These nitrogen and copper impurities are initially present
in the crystal, at trace levels, and are made observable by the thermal anneals. Infrared-absorption measurements at room
temperature in the 2–10 μm region show that the concentration of free carriers decreases as lithium is added to the crystal.
After 22 h at 750°C in the LiF powder, the free-carrier absorption is no longer present, and the crystal is semi-insulating. 相似文献
987.
Low-energy electron-enhanced etching of HgCdTe 总被引:3,自引:0,他引:3
Jaehwa Kim T. S. Koga H. P. Gillis Mark S. Goorsky Gerald A. Garwood John B. Varesi David R. Rhiger Scott M. Johnson 《Journal of Electronic Materials》2003,32(7):677-685
Low-energy electron-enhanced etching (LE4) is applied to HgCdTe to eliminate ion-induced surface damage. First, LE4 results
for patterned samples are illustrated. The LE4 mechanism is understood from a mechanistic study in terms of three etch variables:
direct current (DC) bias, gas composition, and sample temperature. For this paper, the effects of DC bias (electron energy)
and gas composition (CH4 concentration) are summarized qualitatively, followed by quantitative evidence. Etch rate, the amount of polymer, surface
stoichiometry, and surface roughness have specific relations with each etch variable under competition between pure LE4 and
polymer deposition. 相似文献
988.
Alexander Usenko 《Journal of Electronic Materials》2003,32(8):872-876
We observe hydrogen platelet buildup in single-crystalline silicon caused by hydrogen-plasma processing. The platelets are
aligned along a layer of lattice defects formed in silicon before the plasma processing. The buried-defect layer is formed
by either silicon-into-silicon or argon-into-silicon implantation. We discuss the platelet nucleation, growth, and merge phenomena
and discuss applicability of the plasma hydrogenation to silicon-on-insulator (SOI) wafer fabrication by layer transfer. 相似文献
989.
Effect of silver content on thermal fatigue life of Sn-xAg-0.5Cu flip-chip interconnects 总被引:5,自引:0,他引:5
Shinichi Terashima Yoshiharu Kariya Takuya Hosoi Masamoto Tanaka 《Journal of Electronic Materials》2003,32(12):1527-1533
The thermal fatigue properties of Sn-xAg-0.5Cu (x=1, 2, 3, and 4 in mass%) flip-chip interconnects were investigated to study
the effect of silver content on thermal fatigue endurance. The solder joints with lower silver context (x=1 and 2) had a greater
failure rate compared to those with higher silver content (x=3 and 4) in thermal fatigue testing. Cracks developed in the
solders near the solder/chip interface for all joints tested. This crack propagation may be mainly governed by the nature
of the solders themselves because the strain-concentrated area was similar for tested alloys independent of the silver content.
From the microstructural observation, the fracture was a mixed mode, transgranular and intergranular, independent of the silver
content. Higher silver content alloys (x=3 and 4) had finer Sn grains before thermal cycling according to the dispersion of
the Ag3Sn intermetallic compound, and even after the cycling, they suppressed microstructural coarsening, which degrades the fatigue
resistance. The fatigue endurance of the solder joints was strongly correlated to the silver content, and solder joints with
higher silver content had better fatigue resistance. 相似文献
990.
The microstructure of the flip-chip solder joints fabricated using stud bumps and Pb-free solder was characterized. The Au
or Cu stud bumps formed on Al pads on Si die were aligned to corresponding metal pads in the substrate, which was printed
with Sn-3.5Ag paste. Joints were fabricated by reflowing the solder paste. In the solder joints fabricated using Au stud bumps,
Au-Sn intermetallics spread over the whole joints, and the solder remained randomly island-shaped. The δ-AuSn, ε-AuSn2, and η-AuSn4 intermetallic compounds formed sequentially from the Au stud bump. The microstructure of the solder joints did not change
significantly even after multiple reflows. The AuSn4 was the main phase after reflow because of the fast dissolution of Au. In the solder joints fabricated using Cu stud bumps,
the scallop-type Cu6Sn5 intermetallic was formed only at the Cu interface, and the solder was the main phase. The difference in the microstructure
of the solder joints with Au and Cu stud bumps resulted from the dissolution-rate difference of Au and Cu into the solder. 相似文献