Modelling of chromatic contrast for retrieval of wallpaper images

Colour remains one of the key factors in presenting an object and, consequently, has been widely applied in retrieval of images based on their visual contents. However, a colour appearance changes with the change of viewing surroundings, the phenomenon that has not been paid attention yet while performing colour‐based image retrieval. To comprehend this effect, in this article, a chromatic contrast model, CAMcc, is developed for the application of retrieval of colour intensive images, cementing the gap that most of existing colour models lack to fill by taking simultaneous colour contrast into account. Subsequently, the model is applied to the retrieval task on a collection of museum wallpapers of colour‐rich images. In comparison with current popular colour models including CIECAM02, HSI and RGB, with respect to both foreground and background colours, CAMcc appears to outperform the others with retrieved results being closer to query images. In addition, CAMcc focuses more on foreground colours, especially by maintaining the balance between both foreground and background colours, while the rest of existing models take on dominant colours that are perceived the most, usually background tones. Significantly, the contribution of the investigation lies in not only the improvement of the accuracy of colour‐based image retrieval but also the development of colour contrast model that warrants an important place in colour and computer vision theory, leading to deciphering the insight of this age‐old topic of chromatic contrast in colour science. © 2014 Wiley Periodicals, Inc. Col Res Appl, 40, 361–373, 2015     

An automated system based on cryogenic probe station for integrated studies of semiconductor light-emitting structures and wafers in the range of 15 to 475 K

An automated system for integrated electrophysical and optical studies of semiconductor nanoheterostructures, which operates in a wide temperature range from 15 to 475 K, is designed. The setup is intended to measure the temperature and frequency admittance and electroluminescence spectra of light-emitting diode and laser chips formed on substrates of diameter up to 50.2 mm, and the distribution of parameters over the wafer. The setup includes the closed-cycle helium cryogenic station, LCR meter, and temperature controller. The characterization results of nanoheterostructures with InGaN/GaN multiple quantum wells, which are used for creating highly efficient white and blue light-emitting diodes, are presented.