A generalized Bezoutian matrix with respect to a polynomial sequence of interpolatory type

In this note, a generalized Bezoutian matrix with respect to a polynomial sequence of interpolatory type is introduced. The operator representation relative to a pair of dual bases and the generalized Barnett-type factorization formula are derived. An intertwining relation and a Bezoutian reduction to a block diagonal form by congruence via a generalized Vandermonde matrix are presented. Fujiwara-Hermite and Routh-Hurwitz criteria in terms of this generalized Bezout matrix are obtained.     

中兴宽带线路测试技术及功能介绍

宽带线路测试是中兴通讯ZXDSL综合宽带运维系统的核心功能，在DSL业务提供过程中主要应用在开通前的预测试、线路测试、开通后的例测试以及故障时的在线测试。对其测试技术和功能作了介绍。     

东方N-18250-2型凝汽器胶球清洗系统改造

对湘潭电厂存在已久的胶球清洗装置收球率低的问题进行了深入探讨，结合电厂对胶球清洗系统的改造、试验过程，分析并提出了影响胶球清洗装置清洗效果及收球率的诸多原因及其解决方法。     

油库油料计量操作中存在的问题及其解决办法

介绍了油库油料计量中，在油品高度、油品温度和油品密度测量中存在的问题及应遵循的操作规范和注意事项。     

A Pervasive Computing Curriculum for Engineering and Science Students

Today, there's an urgent need for well-trained pervasive computing engineers and scientists. Pervasive computing has evolved into a critical field, influencing a broad range of industries from healthcare to manufacturing to defense. However, most computer engineering and computer science programs pay marginal attention, at best, to the field. In this issue, the authors of the Rochester Institute of Technology describes a set of courses on pervasive computing topics and a supporting laboratory designed for both computer engineering and computer science students     

非电量微机采集系统

实现水电厂电量快速微机巡回检测，温度采集较其它信号更为困难，本文着重讨论温度信号转换及与微机系统的连接。且介绍某水电厂微机控系统中非电量检测装置的硬件结构和软件编制。     

Modeling electromigration lifetime under bidirectional currentstress

Electromigration reliability of interconnect under bidirectional current stress has been studied in a wide frequency range (mHz to 200 MHz). Experimental results show that the AC lifetime rises with the stress current frequency. The current density exponent and the activation energy of AC lifetime are found to be twice that of DC lifetime. Pure AC current stress failure at extremely high current density is believed to result from thermal migration of metal at hot/cold transition points