Repulsive Flux Pinning Force in NbTi/Nb Superconductor/Superconductor Multilayers

Flux pinning characteristics have been investigated for the Nb _x Ti_100-x /Nb(x = 65, 50 and 28) and Nb ₂₈ Ti ₇₂/Nb ₆₅ Ti ₃₅ superconductor(S)/superconductor(S^′) multilayers. The maximum of the pinning force F _{p⊥ max} perpendicular to the layer plane as a function of the structure modulation length λ has a peak in the quasi-two-dimensional region (λ～20 nm). The maximum. values of the F _{p⊥ max} versus λ curve are proportional to the difference of the GL coherence length (ξ _GL ) between the superconductive sublayers S and S^′. The results suggest that the large F _{p⊥ max} in the S/S^′ multilayer is caused by the repulsive pinning force due to Nb layers with larger ξ _GL .     

Magnetic properties and thermal stability of CoFeNi-based amorphous films

CoNiFe-based amorphous films were magnetron-sputtered to investigate their structural and magnetic properties, including annealing-induced effects and interfacial influence from additional layers of Ta and Cu. The amorphous structure was confirmed by diffraction experiments. The magnetic measurements showed a well-defined uniaxial anisotropy in plane, arising possibly from atom oblique incidence effects competing with the stray field of the magnetron. The anisotropy could be influenced by using a Ta buffer layer, though the interfacial reaction gives rise to a dead layer. A coercive force H _c of 1–2 Oe and a magnetization of 680 emu/cm³ were measured at room temperature; properties which show promise for application in magnetotunneling junction devices. Thermal analyses showed a two-stage crystallization behavior, which started at 400°C and ended at about 600°C. The Curie temperature of the amorphous phase was estimated to be about 440°C.