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111.
A mature cloud system needs a complete resource allocation policy which includes internal and external allocation. They not only enable users to have better experiences, but also allows the cloud provider to cut costs. In the other words, internal and external allocation are indispensable since a combination of them is only a total solution for whole cloud system. In this paper, we clearly explain the difference between internal allocation (IA) and external allocation (EA) as well as defining the explicit IA and EA problem for the follow up research. Although many researchers have proposed resource allocation methods, they are just based on subjective observations which lead to an imbalance of the overall cloud architecture, and cloud computing resources to operate se-quentially. In order to avoid an imbalanced situation, in previous work, we proposed Data Envelopment Analysis (DEA) to solve this problem; it considers all of a user’s demands to evaluate the overall cloud parameters. However, although DEA can provide a higher quality solution, it requires more time. So we use the Q-learning and Data Envelopment Analysis (DEA) to solve the imbalance problem and reduce computing time. As our simulation results show, the proposed DEA+Qlearning will provide almost best quality but too much calculating time.  相似文献   
112.
虚拟机是云计算和虚拟化环境中的一个关键基础元素.从规模应用中的运营管理出发,分析了虚拟机标识的现状和存在的问题,并给出了一种通用虚拟机统一标识的解决方案VMID.  相似文献   
113.
In this paper, we present a robust image alignment algorithm based on matching of relative gradient maps. This algorithm consists of two stages; namely, a learning-based approximate pattern search and an iterative energy-minimization procedure for matching relative image gradient. The first stage finds some candidate poses of the pattern from the image through a fast nearest-neighbor search of the best match of the relative gradient features computed from training database of feature vectors, which are obtained from the synthesis of the geometrically transformed template image with the transformation parameters uniformly sampled from a given transformation parameter space. Subsequently, the candidate poses are further verified and refined by matching the relative gradient images through an iterative energy- minimization procedure. This approach based on the matching of relative gradients is robust against nonuniform illumination variations. Experimental results on both simulated and real images are shown to demonstrate superior efficiency and robustness of the proposed algorithm over the conventional normalized correlation method.  相似文献   
114.
最近几年,薄膜晶体管液晶显示器(TFT-LCD)技术取得了快速而显著的进步,其性能超过了PDP、CRT以及投影显示。毫无疑问,TFT-LCD已经成为高清电视应用的最佳实现方案。本文将介绍进一步增强大尺寸LCD电视的彩色和图像性能的技术。  相似文献   
115.
采用0.18μmCMOS工艺设计并制造了一款新型的应用于无线局域网的双频段低噪声放大器。设计中,通过切换输入电感和负载电感,来使电路分别工作在2.4GHz和5.2GHz频段。在1.8V的电源电压下,在2.4GHz和5.2GHz两个频段上,其增益分别达到了11.5dB和10.2dB,噪声系数分别是3dB和5.1dB。芯片总面积是0.9mm×0.65mm。  相似文献   
116.
高TCR氧化钒薄膜研究进展   总被引:1,自引:1,他引:1  
氧化钒薄膜的高电阻温度系数(TCR)是制作高灵敏度非制冷红外探测器的一个极其重要的参量.探测器的响应率与TCR紧密相关.高TCR将提升红外探测器的探测性能.鉴于氧化钒薄膜TCR的重要性,综述了近几年国内外研究中制备高TCR氧化钒薄膜的新技术并分类归纳:包括离子束增强沉积(IBED)法,反应脉冲激光沉积技术等.由于氧化钒薄膜具有VO2、VO5等多种价态结构,不同的制备条件和方法所生成的氧化钒薄膜TCR大小也不同,因此,分析了相关技术方法的优缺点,并对高TCR进行了一定的理论解释.  相似文献   
117.
Manganese oxide (MnO2) nanosplotches (NSs) are deposited on N‐ and S‐doped ordered mesoporous carbon (N,S‐CMK‐3) essentially blocking microporosity. The obtained N,S‐CMK‐3/MnO2 composite materials are assembled into ionic liquid (IL)‐based symmetric supercapacitors, which exhibit a high specific capacitance of 200 F g?1 (0–3.5 V) at a scan rate of 2 mV s?1, and good rate stability with 55.5% capacitance retention at a scan rate of 100 mV s?1. The device can operate in a wide temperature range (?20 to 60 °C), and high cycling stability of N,S‐CMK‐3/MnO2 composite electrode is demonstrated. Lower energy of ?3.56 eV can be achieved for the adsorption of 1‐ethyl‐3‐methylimidazolium+ (EMIM+) cation on the edge between MnO2 NSs and N,S‐CMK‐3 than on the plane of MnO2 NS (?3.04 eV), both being more preferred than the surface of pristine N,S‐CMK‐3 (?1.52 eV). This strengthening of the ion adsorption at the three‐phase boundary between N,S‐CMK‐3, MnO2, and IL leads to enhancement of the specific capacity as compared to nondoped or MnO2‐free reference materials. Supercapacitors based on such composite electrodes show significantly enhanced areal capacity pointing to energy storage in the mesopores rather than in the electrochemical surface layer, demonstrating a new energy storage mechanism in ILs.  相似文献   
118.
This letter presents a novel design for a small-size coplanar waveguide frequency tripler. In this study, a new BPF has been replaced the conventional stub lines in the output termination of the multiplier. Not only enhance the performance of the tripler, but also reduce the whole circuit size. to 2.125/spl times/2.275 cm/sup 2/ in the frequency 0.8/2.4 GHz, The spurious suppressions are 37.48, 33.38, and 32.08 dBc for the 1st, 2nd, and 4th harmonics, respectively. It reveals the best output power of -1.92 dBm for a 0 dBm input signal and maximum conversion gain of -1.92 dB. It is very useful for applications in the wireless communication and radar systems.  相似文献   
119.
Printers usually generate a limited number of colors and lack the ability of producing continuous-tone color images. Traditional error-diffusion algorithms are used to solve this problem. Compared with other approaches, the approaches of using error-diffusion in general can generate halftoned images of better quality. However, smeared edges and textures may occur in these halftoned images. To produce halftoned images of higher quality, these artifacts due to unstable images, dot-overlap, and error-diffusion must be eliminated or reduced. In this paper, we show that unstable images can be eliminated or reduced through using a proper color difference formula to select the reproduction colors even vector error-diffusion is performed in the RGB domain. We also present a method of using different filters to halftone different components of a color. This approach may have clearer and sharper edges for halftoned color images. Unexpected colors may be generated due to dot-overlap in the printing process. We have presented a method to eliminate this color distortion in the process of error-diffusion. Halftoning a color image by our proposed error-diffusion algorithm with edge enhancement has the following characteristics: the unstable images do not exist; the color-error caused by dot-overlap is corrected; and the smeared edges are sharpened.  相似文献   
120.
The micro-ball grid array (/spl mu/BGA), a form of chip scale package (CSP), was developed as one of the most advanced surface mount devices, which may be assembled by ordinary surface mount technology. In the latest /spl mu/BGA type, eutectic tin-lead solder ball bumps are used instead of plated nickel and gold (Ni/Au) bumps. Assembly and reliability of the /spl mu/BGA's PCB, which is soldered by conventional surface mount technology, has been studied in this paper. The bending cycle test (1000 /spl mu//spl epsi/ to -1000 /spl mu//spl epsi/), is used to investigate the fatigue failure of solder joints of /spl mu/BGA, PBGA, and CBGA packages reflowed with different heating factors (Q/sub /spl eta//), defined as the integral of the measured temperature over the dwell time above liquidus (183/spl deg/C). The fatigue lifetime of the /spl mu/BGA assemblies firstly increases and then decreases with increasing heating factor. The greatest lifetime happens while Q/sub /spl eta// is near 500 second-degree. The optimal Q/sub n/ range is between 300 and 750 s/spl deg/C. In this range, the lifetime of the /spl mu/BGA assembly is greater than 4500 cycles if the assemblies are reflowed in nitrogen ambient. SEM micrographs reveal that both /spl mu/ & P-BGA assemblies fail in the solder joint at all heating factors. All fractures are near and parallel to the PCB pad. In the /spl mu/BGA assemblies cracks always initiate at the point of the acute angle where the solder joint joins the PCB pad, and then propagate in the section between the Ni/sub 3/Sn/sub 4/ intermetallic compound (IMC) layer and the bulk solder. In the CBGA assembly reliability test, the failures are in the form of delamination, at the interface between the ceramic base and metallization pad.  相似文献   
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